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Ultramicroscopy

Articles from the last few issues of Ultramicroscopy © Elsevier
  • Dynamical simulations of zone axis electron channelling patterns of cubic silicon carbide
    Ultramicroscopy, Vol. 98, No. 1. (December 2003), pp. 1-7.
  • CBED and LACBED: characterization of antiphase boundaries
    Ultramicroscopy, Vol. 98, No. 1. (December 2003), pp. 9-26.
  • Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?
    Ultramicroscopy, Vol. 98, No. 1. (December 2003), pp. 27-42.
  • Rattling modes and the intrinsic vibrational spectrum of beetle-type scanning tunneling microscopes
    Ultramicroscopy, Vol. 98, No. 1. (December 2003), pp. 43-49.
    by JA Miwa, JM Macleod, A Moffat, AB Mclean
  • Optimized preparation of cross-sectional TEM specimens of organic thin films
    Ultramicroscopy, Vol. 98, No. 1. (December 2003), pp. 51-55.
    by AC Durr, F Schreiber, M Kelsch, H Dosch
  • Compensation of charging in X-PEEM: a successful test on mineral inclusions in 4.4Ga old zircon
    Ultramicroscopy, Vol. 98, No. 1. (December 2003), pp. 57-62.
    by G De Stasio, BH Frazer, B Gilbert, KL Richter, JW Valley
  • Lattice measurement and alloy compositions in metal and bimetallic nanoparticles
    Ultramicroscopy, Vol. 98, No. 1. (December 2003), pp. 63-72.
    by SCY Tsen, PA Crozier, J Liu
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