Thu, 21 Aug 2008 16:09:06 BST CiteULike: Author Basaran http://www.citeulike.org/author/Basaran CiteULike.org en-gb Copyright © 2004-2008 citeulike.org http://www.citeulike.org/user/michaelbussmann/article/2948360 <i>Optical Engineering, Vol. 42, No. 9. (2003), pp. 2646-2652.</i><br /><br />A method to accurately determine the relative phase between images acquired using phase-shifted moiré interferometry is presented. Phase shifting, combined with the accurate determination of the relative phase shift, provides an improvement of the sensitivity of moiré interferometry from 0.417 µm/fringe to 27.8 nm/fringe. Specifically, a 1-D continuous wavelet transform technique was developed to effectively reduce the transient environmentally induced noise and the static background noise that complicate phase determination. Using this technique, accurate relative phase shifts of the interferogram frames were determined with an error of [approximate]2%. As a result, very smooth and accurate phase-map reconstruction of the initially noisy interferogram was accomplished. Sensitivity improvement in phase-shifted moir[e-acute] interferometry using 1-D continuous wavelet transform image processing Heng Liu Alexander Cartwright Cemal Basaran doi:10.1117/1.1592803 Optical Engineering, Vol. 42, No. 9. (2003), pp. 2646-2652. 2008-07-01T13:40:17-00:00 2003 Optical Engineering 42 9 2646 2652 SPIE 1d algorithm continuous interferogram phase-shift transform wavelet