Sat, 05 Jul 2008 05:37:04 BST CiteULike: dcastro's library [1879 articles] http://www.citeulike.org/user/dcastro/article/2782026 CiteULike.org en-gb Copyright © 2004-2008 citeulike.org http://www.citeulike.org/user/dcastro/article/2782026 <i>Microwave Theory and Techniques, IEEE Transactions on, Vol. 45, No. 5. (1997), pp. 580-586.</i><br /><br />A new method, using the noise matrix approach, has been developed for determining the optimum reactive terminations for a transistor employed as a low-noise negative-resistance element in a reflection-mode amplifier. This new method corroborates the less efficient graphical method the authors reported earlier. It is established theoretically and demonstrated numerically that the optimum noise measure of a transistor used in a reflection-mode amplifier is independent of the choice of active terminal and is identical to the optimum noise measure of the same transistor when used in a conventional transmission-mode amplifier Optimum noise measure configurations for transistor negative resistance amplifiers P Gardner DK Paul doi:10.1109/22.575572 Microwave Theory and Techniques, IEEE Transactions on, Vol. 45, No. 5. (1997), pp. 580-586. 2008-05-09T23:50:36-00:00 1997 Microwave Theory and Techniques, IEEE Transactions on 45 5 580 586 amplifier measurement noise