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<pubDate>Sat, 19 Jul 2008 03:10:59 BST</pubDate>


	<title>CiteULike: dcastro's parameter</title>
	<description>CiteULike: dcastro's parameter</description>


	<link>http://www.citeulike.org/user/dcastro/tag/parameter</link>
	<dc:publisher>CiteULike.org</dc:publisher>
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        <rdf:li rdf:resource="http://www.citeulike.org/user/dcastro/article/2782935"/>
        <rdf:li rdf:resource="http://www.citeulike.org/user/dcastro/article/2782066"/>
        <rdf:li rdf:resource="http://www.citeulike.org/user/dcastro/article/2002800"/>

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<item rdf:about="http://www.citeulike.org/user/dcastro/article/2782935">
    <title>Distributed channel model for HEMT signal and noise parameters</title>
    <link>http://www.citeulike.org/user/dcastro/article/2782935</link>
    <description>&lt;i&gt;Electronics Letters, Vol. 28, No. 22. (1992), pp. 2063-2064.&lt;/i&gt;&lt;br /&gt;&lt;br /&gt;A new simple model for the signal and noise properties of a microwave FET or HEMT avoids the need for any explicit correlation between gate and drain noise sources by distributing the drain-to-gate capacitance and the drain noise source along the conducting channel. The new model applied to a commercial HEMT chip demonstrates a very good fit to measured scattering and noise parameter data</description>
    <dc:title>Distributed channel model for HEMT signal and noise parameters</dc:title>

    <dc:creator>P Gardner</dc:creator>
    <dc:creator>DK Paul</dc:creator>
    <dc:source>Electronics Letters, Vol. 28, No. 22. (1992), pp. 2063-2064.</dc:source>
    <dc:date>2008-05-10T14:14:37-00:00</dc:date>
    <prism:publicationYear>1992</prism:publicationYear>
    <prism:publicationName>Electronics Letters</prism:publicationName>
    <prism:volume>28</prism:volume>
    <prism:number>22</prism:number>
    <prism:startingPage>2063</prism:startingPage>
    <prism:endingPage>2064</prism:endingPage>
    <prism:category>amplifier</prism:category>
    <prism:category>channel</prism:category>
    <prism:category>distributed</prism:category>
    <prism:category>microwave</prism:category>
    <prism:category>model</prism:category>
    <prism:category>noise</prism:category>
    <prism:category>parameter</prism:category>
    <prism:category>signal</prism:category>
</item>



<item rdf:about="http://www.citeulike.org/user/dcastro/article/2782066">
    <title>HEMT models for S-parameter and noise parameter extrapolation</title>
    <link>http://www.citeulike.org/user/dcastro/article/2782066</link>
    <description>&lt;i&gt;Microwave Symposium Digest, 1992., IEEE MTT-S International (1992), pp. 277-280 vol.1.&lt;/i&gt;&lt;br /&gt;&lt;br /&gt;Four models have been developed and assessed for fitting the measured noise parameters up to 26 GHz and S-parameters up to 400 GHz for a commercial HEMT (high electron mobility transistor) chip. The first treats the intrinsic noise sources as uncorrelated thermal sources. The second is an extension of this, allowing a better fit to be achieved by including the distributed nature of the gate and drain electrodes using a semidistributed, sliced model. The third model neglects the distributed effect but takes into account the partial correlation of the gate and drain noise sources. This causes a larger improvement in the quality of fit, allowing the model to fit the measured data within reasonable measurement limits. The addition of the distributed effect to the correlated model gives the fourth model, which allows a further marginal improvement, but the conditioning of the problem and the accuracy of the data appear to be insufficient to allow accurate extraction of the additional parameters needed</description>
    <dc:title>HEMT models for S-parameter and noise parameter extrapolation</dc:title>

    <dc:creator>MT Hickson</dc:creator>
    <dc:creator>P Gardner</dc:creator>
    <dc:creator>DK Paul</dc:creator>
    <dc:identifier>doi:10.1109/MWSYM.1992.187966</dc:identifier>
    <dc:source>Microwave Symposium Digest, 1992., IEEE MTT-S International (1992), pp. 277-280 vol.1.</dc:source>
    <dc:date>2008-05-10T00:03:25-00:00</dc:date>
    <prism:publicationYear>1992</prism:publicationYear>
    <prism:publicationName>Microwave Symposium Digest, 1992., IEEE MTT-S International</prism:publicationName>
    <prism:startingPage>277</prism:startingPage>
    <prism:endingPage>280 vol.1</prism:endingPage>
    <prism:category>model</prism:category>
    <prism:category>noise</prism:category>
    <prism:category>parameter</prism:category>
</item>



<item rdf:about="http://www.citeulike.org/user/dcastro/article/2002800">
    <title>Channel parameter estimation in mobile radio environments using the SAGE algorithm</title>
    <link>http://www.citeulike.org/user/dcastro/article/2002800</link>
    <description>&lt;i&gt;Selected Areas in Communications, IEEE Journal on, Vol. 17, No. 3. (1999), pp. 434-450.&lt;/i&gt;&lt;br /&gt;&lt;br /&gt;This study investigates the application potential of the SAGE (space-alternating generalized expectation-maximization) algorithm to jointly estimate the relative delay, incidence azimuth, Doppler frequency, and complex amplitude of impinging waves in mobile radio environments. The performance, i.e., high-resolution ability, accuracy, and convergence rate of the scheme, is assessed in synthetic and real macro- and pico-cellular channels. The results indicate that the scheme overcomes the resolution limitation inherent to classical techniques like the Fourier or beam-forming methods. In particular, it is shown that waves which exhibit an arbitrarily small difference in azimuth can be easily separated as long as their delays or Doppler frequencies differ by a fraction of the intrinsic resolution of the measurement equipment. Two waves are claimed to be separated when the mean-squared estimation errors (MSEEs) of the estimates of their parameters are close to the corresponding Cramer-Rao lower bounds (CRLBs) derived in a scenario where only a single wave is impinging. The adverb easily means that the MSEEs rapidly approach the CLRBs, i.e., within less than 20 iteration cycles. Convergence of the log-likelihood sequence is achieved after approximately ten iteration cycles when the scheme is applied in real channels. In this use, the estimated dominant waves can be related to a scatterer/reflector in the propagation environment. The investigations demonstrate that the SAGE algorithm is a powerful high-resolution tool that can be successfully applied for parameter extraction from extensive channel measurement data, especially for the purpose of channel modeling</description>
    <dc:title>Channel parameter estimation in mobile radio environments using the SAGE algorithm</dc:title>

    <dc:creator>BH Fleury</dc:creator>
    <dc:creator>M Tschudin</dc:creator>
    <dc:creator>R Heddergott</dc:creator>
    <dc:creator>D Dahlhaus</dc:creator>
    <dc:creator>Ingeman</dc:creator>
    <dc:source>Selected Areas in Communications, IEEE Journal on, Vol. 17, No. 3. (1999), pp. 434-450.</dc:source>
    <dc:date>2007-11-28T10:32:38-00:00</dc:date>
    <prism:publicationYear>1999</prism:publicationYear>
    <prism:publicationName>Selected Areas in Communications, IEEE Journal on</prism:publicationName>
    <prism:volume>17</prism:volume>
    <prism:number>3</prism:number>
    <prism:startingPage>434</prism:startingPage>
    <prism:endingPage>450</prism:endingPage>
    <prism:category>algorithm</prism:category>
    <prism:category>channel</prism:category>
    <prism:category>environment</prism:category>
    <prism:category>estimation</prism:category>
    <prism:category>mobile</prism:category>
    <prism:category>multipath</prism:category>
    <prism:category>parameter</prism:category>
    <prism:category>radio</prism:category>
    <prism:category>sage</prism:category>
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