Tag metrology [78 articles] Export

Recent papers classified by the tag metrology.

	Quantum-Enhanced Measurements: Beating the Standard Quantum Limit [My Copy] Science, Vol. 306, No. 5700. (19 November 2004), pp. 1330-1336. by Vittorio Giovannetti, Seth Lloyd, Lorenzo Maccone posted to spin-squeezing metrology by spreeuw to the group Qugatopia on 2009-11-23 11:17:38 as along with 5 people and 2 groups holx Kricki akhuettel FlorianMarquardt A_Olympia Philosophy_of_Information Blog_and_Wiki_Research
	Squeezed atomic states and projection noise in spectroscopy [My Copy] Physical Review A, Vol. 50, No. 1. (Jul 1994), pp. 67-88. by D. J. Wineland, J. J. Bollinger, W. M. Itano, D. J. Heinzen posted to spin-squeezing metrology by spreeuw to the group Qugatopia on 2009-11-23 11:06:41 as
	Ultra cold atoms and Bose-Einstein condensation for quantum metrology [My Copy] The European Physical Journal - Special Topics, Vol. 172, No. 1. (1 June 2009), pp. 37-55. by H. Perrin posted to metrology laser-cooling bec by spreeuw to the group Qugatopia on 2009-10-01 09:18:40 as along with 2 people szirmai convulted
	Nanoparticle metrology standards based on the time-resolved fluorescence anisotropy of silica colloids [My Copy] Measurement Science and Technology, Vol. 20, No. 2. (2009), 025310. by Kathleen Apperson, Jan Karolin, Robert W. Martin, David J. S. Birch posted to nanoparticles metrology fluorescence_lifetime fluorescence anisotropy by alexknight on 2009-08-12 09:42:05 as
	Calibration of a white light interferometer for the measurement of micro-scale dimensions [My Copy] The International Journal of Advanced Manufacturing Technology by Carlo Ferri, Julian Faraway, Emmanuel Brousseau posted to calibration io metrology mixed-effects my_papers r regression swli white-light-interferometer wli by crlfr on 2009-07-20 18:05:24 as
	Universal Constants, Standard Models and Fundamental Metrology [My Copy] (7 May 2009) by G. Cohen-Tannoudji posted to constants fundamental-principles invariances mathematical-constants metamathematics metaphysics metrology philosophy-of-science physical-constants scientific-frameworks symmetries by Scis0000002 on 2009-07-06 22:37:15 as along with 2 people Michael_Sherbon tahsin
	Quantum-limited metrology and Bose-Einstein condensates [My Copy] (17 Aug 2009) by Sergio Boixo, Animesh Datta, Matthew J. Davis, Anil Shaji, Alexandre B. Tacla, Carlton M. Caves posted to metrology by Scis0000002 on 2009-06-26 09:09:33 as along with 4 people holx yinzhangqi negretti sflammia
	An ontology on property for physical, chemical, and biological systems. [My Copy] APMIS Suppl, No. 117. (2004), pp. 1-210. by R. Dybkaer posted to biological-structures biological-systems biology chemical-structures chemical-systems chemistry linguistic-frameworks logical-frameworks metrology ontologies physical-structures physical-systems physics scientific-frameworks terminologies units vocabularies by Scis0000002 on 2009-06-25 19:00:20 as along with 1 person onca
	Towards a natural system of units for physics and metrology [My Copy] The European Physical Journal - Special Topics, Vol. 163, No. 1. (1 October 2008), pp. 141-157. by S. G. Karshenboim posted to metrology units by Scis0000002 on 2009-06-25 18:49:22 as
	Bundle Adjustment -- A Modern Synthesis [My Copy] Lecture Notes in Computer Science, Vol. 1883 (January 2000), 298. by Bill Triggs, Philip F. Mclauchlan, Richard I. Hartley, Andrew W. Fitzgibbon posted to bundle bundle_adjustment igps laser_tracker metrology by crlfr on 2009-04-27 16:26:49 as along with 5 people and 4 groups acollet etidey davfof gossman snsinha Computer_Vision AI uiuc-cs Le2i-3D-vision
	Uncertainty estimation for coordinate metrology with effects of calibration and form deviation in strategy of measurement [My Copy] Measurement Science and Technology, Vol. 19, No. 8. (2008), 084001. by K. Takamasu, S. Takahashi, M. Abbe, R. Furutani posted to circle cmm coordinate-measuring-machines gum metrology triangulation trilateration uncertainty by crlfr on 2009-04-24 18:43:19 as
	Triangulation [My Copy] Computer Vision and Image Understanding, Vol. 68, No. 2. (November 1997), pp. 146-157. by Richard Hartley, Peter Sturm posted to bundle bundle_adjustment igps large_volume laser_tracker metrology triangulation by crlfr on 2009-04-22 13:23:39 as along with 2 people motchy cw
	Camera Self--Calibration: Theory and Experiments [My Copy] pp. 321-334. by Faugeras, S. J. Maybank posted to calibration camera metrology photogrammetry self-calibration by crlfr on 2009-04-15 20:39:39 as along with 2 people sebihoefle Dmitriy4
	A simple technique for self-calibration [My Copy] (1999) by P. Mendonca, R. Cipolla posted to calibration camera metrology photogrammetry self-calibration by crlfr on 2009-04-15 20:38:40 as along with 1 person sebihoefle
	Triangulation [My Copy] (1994) by R. Hartley, P. Sturm posted to bundle bundle_adjustment calculations igps laser_tracker metrology by crlfr on 2009-04-15 20:34:05 as along with 1 person sebihoefle
	The fundamental matrix: Theory, algorithms, and stability analysis [My Copy] International Journal of Computer Vision, Vol. 17 (1996), pp. 43-75. by -T posted to adjustment bundle bundle_adjustment calculations computational_geometrical_modelling geometrical_modelling metrology photogrammetry by crlfr on 2009-04-15 20:30:53 as along with 1 person sebihoefle
	3D Euclidean Versus 2D Non-Euclidean: Two Approaches to 3D Recovery from Images [My Copy] IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol. 11, No. 3. (1989), pp. 329-332. by K. I. Kanatani posted to adjustment best_fitting bundle bundle_adjustment calculations computational_geometrical_modelling metrology photogrammetry by crlfr on 2009-04-15 20:28:52 as along with 1 person sebihoefle
	Projective Reconstruction from Multiple Views with Minimization of 2D Reprojection Error [My Copy] International Journal of Computer Vision, Vol. 66, No. 3. (27 March 2006), pp. 305-317. by Y. Hung, W. Tang posted to bundle bundle_adjustment metrology photogrammetry projective_reconstruction reprojection_error by crlfr on 2009-04-15 20:04:45 as
	SBA: A software package for generic sparse bundle adjustment [My Copy] ACM Trans. Math. Softw., Vol. 36, No. 1. (2009), pp. 1-30. by Manolis I. A. Lourakis, Antonis A. Argyros posted to bundle bundle_adjustment calculations computational_geometrical_modelling computational_geometry geometrical_modelling geometrical_tolerancing least_squares metrology model statistical-software by crlfr on 2009-04-09 16:40:58 as along with 1 person lulyon
	Hertz-Level Measurement of the Optical Clock Frequency in a Single 88Sr+ Ion [My Copy] Science, Vol. 306, No. 5700. (19 November 2004), pp. 1355-1358. by H. S. Margolis, G. P. Barwood, G. Huang, et al.H. A. Klein, S. N. Lea, K. Szymaniec, P. Gill posted to metrology by magalb on 2009-04-05 17:48:42 as
	Observation of the [sup 1]S[sub 0] -->[sup 3]P[sub 0] Clock Transition in [sup 27]Al[sup +] [My Copy] Physical Review Letters, Vol. 98, No. 22. (2007), 220801. by T. Rosenband, P. O. Schmidt, D. B. Hume, et al.W. M. Itano, T. M. Fortier, J. E. Stalnaker, K. Kim, S. A. Diddams, J. C. J. Koelemeij, J. C. Bergquist, D. J. Wineland posted to metrology by magalb on 2009-04-05 17:39:58 as
	An Optical Clock Based on a Single Trapped 199Hg+ Ion [My Copy] Science, Vol. 293, No. 5531. (3 August 2001), pp. 825-828. by S. A. Diddams, Th Udem, J. C. Bergquist, et al.E. A. Curtis, R. E. Drullinger, L. Hollberg, W. M. Itano, W. D. Lee, C. W. Oates, K. R. Vogel, D. J. Wineland posted to metrology by magalb on 2009-04-05 17:36:39 as along with 1 person tapnews
	Frequency Ratio of Al+ and Hg+ Single-Ion Optical Clocks; Metrology at the 17th Decimal Place [My Copy] Science, Vol. 319, No. 5871. (28 March 2008), pp. 1808-1812. by T. Rosenband, D. B. Hume, P. O. Schmidt, et al.C. W. Chou, A. Brusch, L. Lorini, W. H. Oskay, R. E. Drullinger, T. M. Fortier, J. E. Stalnaker, S. A. Diddams, W. C. Swann, N. R. Newbury, W. M. Itano, D. J. Wineland, J. C. Bergquist posted to metrology by magalb on 2009-04-05 17:31:27 as along with 2 people and 1 group Michael_Sherbon spreeuw Qugatopia
	Fusion of micro-metrology techniques for the flexible inspection of MEMS/MOEMS assembly [My Copy] Optical Micro- and Nanometrology in Microsystems Technology II, Vol. 6995, No. 1. (2008) by R. Schmitt, A. Pavim edited by Christophe Gorecki, Anand K. Asundi, Wolfgang Osten posted to fusion mems metrology micro-metrology moems non-destructive optical sensor testing by axpavim on 2009-02-17 08:28:14 as
	Production metrology [My Copy] (2002) by Tilo Pfeifer posted to metrology production by axpavim on 2009-02-17 07:37:37 as
	Quality control and process observation for the micro assembly process [My Copy] Measurement, Vol. 30, No. 1. (July 2001), pp. 1-18. by T. Pfeifer posted to metrology microsystems optical by axpavim on 2009-02-17 07:32:02 as
	Optical metrology aimed for process quality-control-loops (QCL) in production-modules for micro-technology [My Copy] Systems, Man and Cybernetics, 2004 IEEE International Conference on In Systems, Man and Cybernetics, 2004 IEEE International Conference on, Vol. 6 (2004), pp. 5417-5422 vol.6. by A. Ubaldo, P. Tilo posted to metrology micro-technology optical by axpavim on 2009-02-13 12:54:03 as
	Decoherence-enhanced measurements [My Copy] (7 Feb 2009) by Daniel Braun, John Martin posted to metrology by sflammia on 2009-02-10 03:10:55 as along with 1 person jaeseung
	INFRARED ABSORPTION SPECTROSCOPY [My Copy] by Koji Nakanishi posted to matsci metrology list work2 by Erannadur on 2009-02-02 19:56:35 as
	Scanning Probe Microscopy: The Lab on a Tip [My Copy] (10 October 2003) by Ernst Meyer, Hans J. Hug, Roland Bennewitz posted to matsci metrology list work2 by Erannadur on 2009-02-02 19:55:16 as along with 1 person devinli
	Bayesian estimation in homodyne interferometry [My Copy] (16 Feb 2009) by Stefano Olivares, Matteo G. A. Paris posted to metrology by sflammia on 2009-01-20 23:00:54 as along with 1 person wkotl
	Optimal quantum multi-parameter estimation as applied to dipole- and exchange-coupled qubits [My Copy] (26 Dec 2008) by Kevin C. Young, Mohan Sarovar, Robert Kosut, Birgitta K. Whaley posted to metrology by sflammia on 2008-12-31 01:51:10 as
	Quantum Metrology: Dynamics versus Entanglement [My Copy] Physical Review Letters, Vol. 101, No. 4. (2008) by Sergio Boixo, Animesh Datta, Matthew J. Davis, Steven T. Flammia, Anil Shaji, Carlton M. Caves posted to bec bose-einstein condensation dynamics entanglement metrology quantum by michaelbussmann on 2008-07-28 10:32:46 as
	Attosecond real-time observation of electron tunnelling in atoms [My Copy] Nature, Vol. 446, No. 7136., pp. 627-632. by M. Uiberacker, Th, M. Schultze, et al.A. J. Verhoef, V. Yakovlev, M. F. Kling, J. Rauschenberger, N. M. Kabachnik, H. Schröder, M. Lezius, K. L. Kompa, H. G. Muller, M. J. J. Vrakking, S. Hendel, U. Kleineberg, U. Heinzmann, M. Drescher, F. Krausz posted to atom attosecond auger electron laser metrology pulse short tunneling by michaelbussmann on 2008-07-16 13:57:19 as along with 3 people and 1 group Scis0000002 feist nogi Wissen hält nicht länger als Fisch
	Attosecond Metrology Comes of Age [My Copy] Physica Scripta, Vol. T110 (2004), pp. 32-38. by Reinhard Kienberger, Ferenc Krausz posted to attosecond auger dynamics electron laser metrology overview pulse short streaking by michaelbussmann on 2008-07-16 13:49:30 as
	Attosecond metrology [My Copy] Nature, Vol. 414, No. 6863. (29 November 2001), pp. 509-513. by M. Hentschel, R. Kienberger, Ch Spielmann, et al.G. A. Reider, N. Milosevic, T. Brabec, P. Corkum, U. Heinzmann, M. Drescher, F. Krausz posted to attosecond dynamics electronic metrology x-ray by michaelbussmann on 2008-07-16 13:36:43 as along with 5 people and 1 group tomarobinson kaltenbaeck pazi emilpersson steinbeck Wissen hält nicht länger als Fisch
	Techniques for available bandwidth measurement in IP networks: a performance comparison [My Copy] Comput. Networks, Vol. 50, No. 3. (2006), pp. 332-349. by Leopoldo Angrisani, Salvatore D'Antonio, Marcello Esposito, Michele Vadursi posted to _2005 abw availablebandwidth _bib_tesi comparison experimental igi measurement metrology networking pathchirp pathload _tesi by JoeVinegar on 2008-05-26 18:37:37 as along with 3 people sabel pierz LittleWood
	Measuring wireless links capacity [My Copy] Wireless Pervasive Computing, 2006 1st International Symposium on In Wireless Pervasive Computing, 2006 1st International Symposium on (2006), 5 pp.. by L. Angrisani, A. Botta, A. Pescape, M. Vadursi posted to _2006 bandwidth _bib_tesi capacity capprobe clink comparison experimental hardware measurement metrology pathrate pchar _tesi wireless by JoeVinegar on 2008-05-14 11:13:24 as
	Nonlinear quantum metrology using coupled nanomechanical resonators [My Copy] (29 Apr 2008) by M. J. Woolley, G. J. Milburn, Carlton M. Caves posted to metrology by sflammia on 2008-04-30 03:06:59 as
	Single View Metrology [My Copy] International Journal of Computer Vision, Vol. V40, No. 2. (1 November 2000), pp. 123-148. by A. Criminisi, I. Reid, A. Zisserman posted to metrology photogrammetry reconstruction by jorgevictorino on 2008-04-10 23:27:18 as along with 1 person and 1 group thsant video_retrieval
	Quantum State Engineering and Precision Metrology using State-Insensitive Light Traps [My Copy] (1 Apr 2008) by Jun Ye, H. J. Kimble, Hidetoshi Katori posted to metrology by sflammia on 2008-04-03 15:42:12 as
	Beating the standard quantum limit: Phase super-sensitivity of N-photon interferometers [My Copy] (1 Apr 2008) by Ryo Okamoto, Holger F. Hofmann, Tomohisa Nagata, Jeremy L. O'brien, Keiji Sasaki, Shigeki Takeuchi posted to metrology by sflammia on 2008-04-02 02:22:03 as
	Should the classical variance be used as a basic measure in standards metrology? [My Copy] IEEE Transactions on Instrumentation Measurement, Vol. 36 (June 1987), pp. 646-654. by D. W. Allan posted to metrology standards by dietlein to the group CU Microwave Active Antenna group on 2008-02-21 04:39:22 as
	Noise in measurements obtained by sampling [My Copy] Measurement Science and Technology, Vol. 3, No. 1. (1992), pp. 1-16. by D. R. White, J. F. Clare posted to measurement metrology noise sampling by dietlein to the group CU Microwave Active Antenna group on 2008-02-21 04:38:31 as
	90-km optical link with a resolution of 2.10-18 for RF frequency transfer [My Copy] (6 Nov 2007) by Olivier Lopez, Anne Amy-Klein, Christophe Daussy, et al.Christian Chardonnet, François Narbonneau, Michel Lours, Georgio Santarelli posted to fiber_optics metrology rf by AChiummo on 2007-11-07 09:02:34 as
	Critical dimension metrology for sub-150-nm lithographic films using real-time scatterometry [My Copy] Metrology, Inspection, and Process Control for Microlithography XVII, Vol. 5038, No. 1. (2003), pp. 585-596. by Michael J. Anderson edited by Daniel J. Herr posted to metrology scatterometry by eyliu on 2007-03-04 03:02:06 as
	Accuracy limitations in specular-mode optical topography extraction [My Copy] Metrology, Inspection, and Process Control for Microlithography XVII, Vol. 5038, No. 1. (2003), pp. 547-558. by Jr edited by Daniel J. Herr posted to metrology scatterometry by eyliu on 2007-03-02 00:25:31 as
	CD metrology for the 45-nm and 32-nm nodes [My Copy] Metrology, Inspection, and Process Control for Microlithography XVIII, Vol. 5375, No. 1. (2004), pp. 183-190. by Bryan J. Rice, Heidi B. Cao, Ovijut Chaudhuri, et al.Michael G. Grumski, Bruce D. Harteneck, Alex Liddle, Deidre Olynick, Jeanette M. Roberts edited by Richard M. Silver posted to metrology by eyliu on 2007-03-02 00:24:06 as
	Specular spectroscopic scatterometry in DUV lithography [My Copy] Metrology, Inspection, and Process Control for Microlithography XIII, Vol. 3677, No. 1. (1999), pp. 159-168. by Xinhui Niu, Nickhil H. Jakatdar, Junwei Bao, Costas J. Spanos, Sanjay K. Yedur edited by Bhanwar Singh posted to metrology scatterometry by eyliu on 2006-11-04 23:45:18 as along with 1 person kewms
	‘Designer atoms’ for quantum metrology [My Copy] Nature, Vol. 443, No. 7109., pp. 316-319. by C. F. Roos, M. Chwalla, K. Kim, M. Riebe, R. Blatt posted to entanglement ion metrology trapped by jaeseung on 2006-09-29 14:20:22 as

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scatterometry	15
bundle_adjustment	11
bundle	9
photogrammetry	8
computational_geometrical_modelling	6
measurement	6
attosecond	5
calculations	5
lithography	5
adjustment	4
computational_geometry	4
igps	4
bec	3
calibration	3
camera	3
critical	3
dimension	3
dynamics	3
geometrical_modelling	3
gratings	3
laser_tracker	3
material_properties	3
optical	3
overlay	3
txrf	3
_bib_tesi	2
_tesi	2
afm	2
applications	2
auger	2
characterization	2
cmm	2
comparison	2
electrical_characterization	2
electron	2
entanglement	2
epitaxial_graphene	2
experiment	2
experimental	2
large_volume	2
laser	2
list	2
matsci	2
model	2
molecular_electronics	2
nanoscale	2
ontologies	2
pulse	2
pulses	2
qhe	2
quantum	2
scientific-frameworks	2
self-calibration	2
short	2
sic	2
spin-squeezing	2
spin_squeezing	2
standards	2
triangulation	2
uncertainty	2
units	2
work2	2
3d	1
_2005	1
_2006	1
anisotropy	1
atomic_force_microscopy	1
biology	1
cim	1
demis	1
diffraction	1
fiber_optics	1
gum	1
immersion	1
io	1
large_volume_metrology	1
least_squares	1
lvma	1
math	1
mathematical-constants	1
measurements	1
metaphysics	1
moems	1
nist	1
noise	1
optical_measurement	1
pathload	1
physical-structures	1
point-clouds	1
production	1
properties	1
r	1
reconstruction	1
resistance	1
scattering	1
semiconductor_materials	1
statistical-software	1
step	1
test_structure	1
testing	1

Tag metrology [78 articles] Export

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