The application of atomic force microscopy force measurements to the characterisation of microbial surfaces Export

@article{C.J.Wright.Rev.2006, abstract = {The interaction of microbes and subsequent development of biofilms at surfaces has far-reaching consequences in bioprocess engineering, agriculture, medicine and dentistry. Thus, the microbial surface has been the focus of wide scientific investigation. However, only recently has technology permitted quantitative study of the molecular interactions that govern the interactions of microbes. One such technology is atomic force microscopy (AFM) that not only permits the high resolution imaging of microbial surfaces but also the direct measurement of molecular forces and physical properties found at the microbial surface. This review highlights the current development of AFM force measurements and how these may be applied to microbial cell surfaces. The refinement of the AFM force measurement technique for characterising microbial surfaces will be discussed with reference to selected studies from the author's laboratory and key results from other research teams. The review will demonstrate how the application of the AFM techniques of single-molecule force spectroscopy, functionalised tips, cell probes and lateral force measurement to microbial surfaces has provided exciting and unique insights into the microbial surface and its interactions. Copyright {\copyright} 2006 John Wiley \& Sons, Ltd.}, address = {Multidisciplinary Nanotechnology Centre, University of Wales Swansea, Singleton Park, Swansea, UK}, author = {Wright, Chris J. and Armstrong, Ian}, citeulike-article-id = {1092752}, citeulike-linkout-0 = {http://dx.doi.org/10.1002/sia.2506}, citeulike-linkout-1 = {http://www3.interscience.wiley.com/cgi-bin/abstract/113399540/ABSTRACT}, doi = {10.1002/sia.2506}, issn = {1096-9918}, journal = {Surface and Interface Analysis}, keywords = {adhesion, afm, aggregation, atomic, cell, force, interactions, measurements, microbiology, microscopy, molecular, nanomechanics, surface}, number = {11}, pages = {1419--1428}, posted-at = {2009-11-06 14:25:23}, priority = {2}, title = {The application of atomic force microscopy force measurements to the characterisation of microbial surfaces}, url = {http://dx.doi.org/10.1002/sia.2506}, volume = {38}, year = {2006} }

TY - JOUR ID - C.J.Wright.Rev.2006 L3 - citeulike-article-id:1092752 N2 - The interaction of microbes and subsequent development of biofilms at surfaces has far-reaching consequences in bioprocess engineering, agriculture, medicine and dentistry. Thus, the microbial surface has been the focus of wide scientific investigation. However, only recently has technology permitted quantitative study of the molecular interactions that govern the interactions of microbes. One such technology is atomic force microscopy (AFM) that not only permits the high resolution imaging of microbial surfaces but also the direct measurement of molecular forces and physical properties found at the microbial surface. This review highlights the current development of AFM force measurements and how these may be applied to microbial cell surfaces. The refinement of the AFM force measurement technique for characterising microbial surfaces will be discussed with reference to selected studies from the author's laboratory and key results from other research teams. The review will demonstrate how the application of the AFM techniques of single-molecule force spectroscopy, functionalised tips, cell probes and lateral force measurement to microbial surfaces has provided exciting and unique insights into the microbial surface and its interactions. Copyright © 2006 John Wiley & Sons, Ltd. IS - 11 JF - Surface and Interface Analysis SN - 1096-9918 AD - Multidisciplinary Nanotechnology Centre, University of Wales Swansea, Singleton Park, Swansea, UK EP - 1428 TI - The application of atomic force microscopy force measurements to the characterisation of microbial surfaces VL - 38 SP - 1419 KW - adhesion KW - afm KW - aggregation KW - atomic KW - cell KW - force KW - interactions KW - measurements KW - microbiology KW - microscopy KW - molecular KW - nanomechanics KW - surface AU - Wright, Chris AU - Armstrong, Ian PY - 2006/// UR - http://dx.doi.org/10.1002/sia.2506 ER -