CiteULike is a free online bibliography manager. Register and you can start organising your references online.
Tags

# Scanning tunneling microscopy of defect states in the semiconductor $\mathrmBi_2\mathrmSe_3$

Physical Review B, Vol. 66 (Oct 2002), 161306, doi:10.1103/physrevb.66.161306  Key: citeulike:11930670

## Likes (beta)

This copy of the article hasn't been liked by anyone yet.

### Abstract

Scanning tunneling spectroscopy images of Bi2Se3 doped with excess Bi reveal electronic defect states with a striking shape resembling clover leaves. With a simple tight-binding model, we show that the geometry of the defect states in Bi2Se3 can be directly related to the position of the originating impurities. Only the Bi defects at the Se sites five atomic layers below the surface are experimentally observed. We show that this effect can be explained by the interplay of defect and surface electronic structure.