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Characterization of Ultrathin Poly(ethylene glycol) Monolayers on Silicon Substrates Export

Langmuir, Vol. 17, No. 5. (1 March 2001), pp. 1457-1460.

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afm monolayer peg silane silicon spectroscopy surface toluene x-ray

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Low molecular weight poly(ethylene glycol) silanes (PEG silanes) have been grafted onto the surface of silicon wafers in a one-step procedure yielding ultrathin and stable PEG monolayers. Structural investigation by means of X-ray reflectivity provided data on the thickness of the PEG monolayers. The layer thickness varied between 10 and 17 Å depending on the PEG silane concentration applied. These results have been confirmed by X-ray photoelectron spectroscopy measurements. Atomic force microscopy data indicate very smooth and homogeneous coverages with roughnesses of less than 3 Å. The PEG layers are hydrophilic as determined with advancing water contact angles between 36 and 39°.


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