Frequency-resolved spectroscopy and its application to the analysis of recombination in semiconductors Export

@article{citeulike:3860059, abstract = {The study of recombination lifetimes and kinetics is an essential part of the analysis of recombination mechanisms in semiconductors. In recent years, time-resolved spectroscopy (TRS) has become the standard method of obtaining such experimental data, using a pulsed excitation source and gated detection. In this paper is discussed an alternative experimental approach which overcomes some of the limitations inherent in the TRS method by working in the frequency domain. The application of this method, which we call frequency-resolved spectroscopy (FRS), is sescribed and illustrated with several examples from both crystalline and amorphous semiconductor spectroscopy.}, author = {Depinna, S. P. and Dunstan, D. J.}, citeulike-article-id = {3860059}, citeulike-linkout-0 = {http://cat.inist.fr/?aModele=afficheN&cpsidt=9179474}, citeulike-linkout-1 = {http://www.informaworld.com/index/757472522.pdf}, journal = {Philosophical magazine. B. Physics of condensed matter. Electronic, optical and magnetic properties}, keywords = {lock\_in\_augustinas}, number = {5}, posted-at = {2009-01-08 13:33:19}, priority = {2}, title = {Frequency-resolved spectroscopy and its application to the analysis of recombination in semiconductors}, url = {http://cat.inist.fr/?aModele=afficheN&cpsidt=9179474}, volume = {50} }

TY - JOUR ID - citeulike:3860059 L3 - citeulike-article-id:3860059 N2 - The study of recombination lifetimes and kinetics is an essential part of the analysis of recombination mechanisms in semiconductors. In recent years, time-resolved spectroscopy (TRS) has become the standard method of obtaining such experimental data, using a pulsed excitation source and gated detection. In this paper is discussed an alternative experimental approach which overcomes some of the limitations inherent in the TRS method by working in the frequency domain. The application of this method, which we call frequency-resolved spectroscopy (FRS), is sescribed and illustrated with several examples from both crystalline and amorphous semiconductor spectroscopy. IS - 5 JF - Philosophical magazine. B. Physics of condensed matter. Electronic, optical and magnetic properties TI - Frequency-resolved spectroscopy and its application to the analysis of recombination in semiconductors VL - 50 KW - lock_in_augustinas AU - Depinna, SP AU - Dunstan, DJ UR - http://cat.inist.fr/?aModele=afficheN&cpsidt=9179474 ER -