Precision and sensitivity in electron microprobe analysis Export

@article{citeulike:1837721, abstract = {Sources of variation in microprobe data, other than the obvious fluctuations in x-ray photon emission, are delineated. It is shown that the precision obtained in composition determinations is not generally the same as the precision of x-ray measurements. A convenient method for estimating precision before actually performing an analysis is presented.}, author = {Laitinen, Herbert A.}, citeulike-article-id = {1837721}, citeulike-linkout-0 = {http://dx.doi.org/10.1021/ac60252a028}, citeulike-linkout-1 = {http://dx.doi.org/10.1021/ac60252a028}, citeulike-linkout-2 = {http://pubs.acs.org/doi/abs/10.1021/ac60252a028}, doi = {10.1021/ac60252a028}, journal = {Analytical Chemistry}, keywords = {characterization, eds, sem}, month = {July}, number = {8}, pages = {858--860}, posted-at = {2007-10-29 22:27:25}, priority = {2}, title = {Precision and sensitivity in electron microprobe analysis}, url = {http://dx.doi.org/10.1021/ac60252a028}, volume = {39}, year = {1967} }

TY - JOUR ID - citeulike:1837721 L3 - citeulike-article-id:1837721 N2 - Sources of variation in microprobe data, other than the obvious fluctuations in x-ray photon emission, are delineated. It is shown that the precision obtained in composition determinations is not generally the same as the precision of x-ray measurements. A convenient method for estimating precision before actually performing an analysis is presented. IS - 8 JF - Analytical Chemistry EP - 860 TI - Precision and sensitivity in electron microprobe analysis VL - 39 SP - 858 KW - characterization KW - eds KW - sem AU - Laitinen, Herbert PY - 1967/07// UR - http://dx.doi.org/10.1021/ac60252a028 ER -