4D ULTRAFAST ELECTRON DIFFRACTION, CRYSTALLOGRAPHY, AND MICROSCOPY Export

@article{AnnRevPhysChem2006AHZewail, abstract = {In this review, we highlight the progress made in the development of 4D ultrafast electron diffraction (UED), crystallography (UEC), and microscopy (UEM) with a focus on concepts, methodologies, and prototypical applications. The joint atomic-scale resolutions in space and time, and sensitivity reached, make it possible to determine complex transient structures and assemblies in different phases. These applications include studies of isolated chemical reactions (molecular beams), interfaces, surfaces and nanocrystals, self-assembly, and 2D crystalline fatty-acid bilayers. In 4D UEM, we are now able, using timed, single-electron packets, to image nano-to-micro scale structures of materials and biological cells. Future applications of these methods are foreseen across areas of physics, chemistry, and biology.}, author = {Zewail, Ahmed H.}, citeulike-article-id = {3391353}, citeulike-linkout-0 = {http://arjournals.annualreviews.org/doi/abs/10.1146/annurev.physchem.57.032905.104748?prevSearch=%5Bauthor%3A+Zewail%2C+Ahmed+H.%5D}, journal = {Annual Review of Physical Chemistry}, keywords = {diffraction, electron, electron-diffraction, microscopy, uec, ued, uem}, month = {May}, number = {1}, pages = {65--103}, posted-at = {2008-10-09 20:10:22}, priority = {0}, title = {4D ULTRAFAST ELECTRON DIFFRACTION, CRYSTALLOGRAPHY, AND MICROSCOPY}, url = {http://arjournals.annualreviews.org/doi/abs/10.1146/annurev.physchem.57.032905.104748?prevSearch=%5Bauthor%3A+Zewail%2C+Ahmed+H.%5D}, volume = {57}, year = {2006} }

TY - JOUR ID - AnnRevPhysChem2006AHZewail L3 - citeulike-article-id:3391353 N2 - In this review, we highlight the progress made in the development of 4D ultrafast electron diffraction (UED), crystallography (UEC), and microscopy (UEM) with a focus on concepts, methodologies, and prototypical applications. The joint atomic-scale resolutions in space and time, and sensitivity reached, make it possible to determine complex transient structures and assemblies in different phases. These applications include studies of isolated chemical reactions (molecular beams), interfaces, surfaces and nanocrystals, self-assembly, and 2D crystalline fatty-acid bilayers. In 4D UEM, we are now able, using timed, single-electron packets, to image nano-to-micro scale structures of materials and biological cells. Future applications of these methods are foreseen across areas of physics, chemistry, and biology. IS - 1 JF - Annual Review of Physical Chemistry EP - 103 TI - 4D ULTRAFAST ELECTRON DIFFRACTION, CRYSTALLOGRAPHY, AND MICROSCOPY VL - 57 SP - 65 KW - diffraction KW - electron KW - electron-diffraction KW - microscopy KW - uec KW - ued KW - uem AU - Zewail, Ahmed PY - 2006/05// UR - http://arjournals.annualreviews.org/doi/abs/10.1146/annurev.physchem.57.032905.104748?prevSearch=%5Bauthor%3A+Zewail%2C+Ahmed+H.%5D ER -