Fault-tolerant typed assembly language Export

@inproceedings{citeulike:2683544, abstract = {A transient hardware fault occurs when an energetic particle strikes a transistor, causing it to change state. Although transient faults do not permanently damage the hardware, they may corrupt computations by altering stored values and signal transfers. In this paper, we propose a new scheme for provably safe and reliable computing in the presence of transient hardware faults. In our scheme, software computations are replicated to provide redundancy while special instructions compare the independently computed results to detect errors before writing critical data. In stark contrast to any previous efforts in this area, we have analyzed our fault tolerance scheme from a formal, theoretical perspective. To be specific, first, we provide an operational semantics for our assembly language, which includes a precise formal definition of our fault model. Second, we develop an assembly-level type system designed to detect reliability problems in compiled code. Third, we provide a formal specification for program fault tolerance under the given fault model and prove that all well-typed programs are indeed fault tolerant. In addition to the formal analysis, we evaluate our detection scheme and show that it only takes 34\% longer to execute than the unreliable version.}, address = {New York, NY, USA}, author = {Perry, Frances and Mackey, Lester and Reis, George A. and Ligatti, Jay and August, David I. and Walker, David}, booktitle = {PLDI '07: Proceedings of the 2007 ACM SIGPLAN conference on Programming language design and implementation}, citeulike-article-id = {2683544}, citeulike-linkout-0 = {http://portal.acm.org/citation.cfm?id=1250734.1250741}, citeulike-linkout-1 = {http://dx.doi.org/10.1145/1250734.1250741}, doi = {10.1145/1250734.1250741}, isbn = {978-1-59593-633-2}, keywords = {certified, compilation}, location = {San Diego, California, USA}, pages = {42--53}, posted-at = {2008-04-17 22:21:52}, priority = {4}, publisher = {ACM}, title = {Fault-tolerant typed assembly language}, url = {http://dx.doi.org/10.1145/1250734.1250741}, year = {2007} }

TY - CONF ID - citeulike:2683544 L3 - citeulike-article-id:2683544 N2 - A transient hardware fault occurs when an energetic particle strikes a transistor, causing it to change state. Although transient faults do not permanently damage the hardware, they may corrupt computations by altering stored values and signal transfers. In this paper, we propose a new scheme for provably safe and reliable computing in the presence of transient hardware faults. In our scheme, software computations are replicated to provide redundancy while special instructions compare the independently computed results to detect errors before writing critical data. In stark contrast to any previous efforts in this area, we have analyzed our fault tolerance scheme from a formal, theoretical perspective. To be specific, first, we provide an operational semantics for our assembly language, which includes a precise formal definition of our fault model. Second, we develop an assembly-level type system designed to detect reliability problems in compiled code. Third, we provide a formal specification for program fault tolerance under the given fault model and prove that all well-typed programs are indeed fault tolerant. In addition to the formal analysis, we evaluate our detection scheme and show that it only takes 34% longer to execute than the unreliable version. CY - San Diego, California, USA SN - 978-1-59593-633-2 AD - New York, NY, USA EP - 53 TI - Fault-tolerant typed assembly language PB - ACM T2 - PLDI '07: Proceedings of the 2007 ACM SIGPLAN conference on Programming language design and implementation SP - 42 KW - certified KW - compilation AU - Perry, Frances AU - Mackey, Lester AU - Reis, George AU - Ligatti, Jay AU - August, David AU - Walker, David PY - 2007/// UR - http://dx.doi.org/10.1145/1250734.1250741 ER -