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In Computer Vision (ICCV), 2011 IEEE International Conference on (November 2011), pp. 89-96, doi:10.1109/iccv.2011.6126229 Key: citeulike:11135083
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This paper proposes a conceptually simple but surprisingly powerful method which combines the effectiveness of a discriminative object detector with the explicit correspondence offered by a nearest-neighbor approach. The method is based on training a separate linear SVM classifier for every exemplar in the training set. Each of these Exemplar-SVMs is thus defined by a single positive instance and millions of negatives. While each detector is quite specific to its exemplar, we empirically observe that an ensemble of such Exemplar-SVMs offers surprisingly good generalization. Our performance on the PASCAL VOC detection task is on par with the much more complex latent part-based model of Felzenszwalb et al., at only a modest computational cost increase. But the central benefit of our approach is that it creates an explicit association between each detection and a single training exemplar. Because most detections show good alignment to their associated exemplar, it is possible to transfer any available exemplar meta-data (segmentation, geometric structure, 3D model, etc.) directly onto the detections, which can then be used as part of overall scene understanding.
The paper introduces the ensemble of examplar SVM classifiers, which are classification functions trained on only one positive example and millions of negative ones. The model is very well motivated and supports the idea of representing the negative examples in a parametric way, while preserving a more detailed representation for positive examples. The approach performs relatively well on the Pascal VOC data set, and enjoys the interesting property of allowing to transfer metadata from the examplar to the detected object (segmentations, bounding boxes, 3D models, etc.). The model is indeed very interesting, and suggests very interesting new paths for research. Can we organize examplars in tree-like structure to run more efficiently during testing time? Can we detect kind of redundant examplars in a large scale setting?
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