Structure and Growth of Chromophore-Functionalized (3-Aminopropyl)triethoxysilane Self-Assembled on Silicon Export

@article{citeulike:1207885, abstract = {Abstract: We have used X-ray reflectivity, ellipsometry, and X-ray photoelectron spectroscopy to characterize self-assembled films of (3-aminopropyl)triethoxysilane (APS) functionalized with a photosensitive chromophore. Using the evolution of film thickness with time devoted to initial APS adsorption on the surface, we obtain a model for the structure and growth dynamics of the film.}, address = {Code 6900, Naval Research Laboratory, Washington, D.C. 20375}, author = {Heiney, P. A. and Gruneberg, K. and Fang, J. and Dulcey, C. and Shashidhar, R.}, citeulike-article-id = {1207885}, citeulike-linkout-0 = {http://dx.doi.org/10.1021/la990557w}, citeulike-linkout-1 = {http://pubs.acs.org/doi/abs/10.1021/la990557w}, comment = {5\% water stuff}, day = {21}, doi = {10.1021/la990557w}, journal = {Langmuir}, keywords = {aptes, ca, ellipsometry, si, xps}, month = {March}, number = {6}, pages = {2651--2657}, posted-at = {2007-04-05 08:59:37}, priority = {2}, title = {Structure and Growth of Chromophore-Functionalized (3-Aminopropyl)triethoxysilane Self-Assembled on Silicon}, url = {http://dx.doi.org/10.1021/la990557w}, volume = {16}, year = {2000} }

TY - JOUR ID - citeulike:1207885 L3 - citeulike-article-id:1207885 N2 - Abstract: We have used X-ray reflectivity, ellipsometry, and X-ray photoelectron spectroscopy to characterize self-assembled films of (3-aminopropyl)triethoxysilane (APS) functionalized with a photosensitive chromophore. Using the evolution of film thickness with time devoted to initial APS adsorption on the surface, we obtain a model for the structure and growth dynamics of the film. IS - 6 JF - Langmuir AD - Code 6900, Naval Research Laboratory, Washington, D.C. 20375 EP - 2657 TI - Structure and Growth of Chromophore-Functionalized (3-Aminopropyl)triethoxysilane Self-Assembled on Silicon VL - 16 SP - 2651 KW - aptes KW - ca KW - ellipsometry KW - si KW - xps N1 - 5% water stuff AU - Heiney, PA AU - Gruneberg, K AU - Fang, J AU - Dulcey, C AU - Shashidhar, R PY - 2000/03/21/ UR - http://dx.doi.org/10.1021/la990557w ER -