Optical characterization of CuIn[sub 1 - x]Ga[sub x]Se[sub 2] alloy thin films by spectroscopic ellipsometry Export

@article{citeulike:3963908, author = {Paulson, P. D. and Birkmire, R. W. and Shafarman, W. N.}, citeulike-article-id = {3963908}, citeulike-linkout-0 = {http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=JAPIAU000094000002000879000001&idtype=cvips&gifs=yes}, citeulike-linkout-1 = {http://link.aip.org/link/?JAP/94/879}, journal = {Journal of Applied Physics}, keywords = {cigs, ellipsometry, optical\_constants}, number = {2}, pages = {879--888}, posted-at = {2009-01-27 15:56:16}, priority = {2}, publisher = {AIP}, title = {Optical characterization of CuIn[sub 1 - x]Ga[sub x]Se[sub 2] alloy thin films by spectroscopic ellipsometry}, url = {http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=JAPIAU000094000002000879000001&idtype=cvips&gifs=yes}, volume = {94}, year = {2003} }

TY - JOUR ID - citeulike:3963908 L3 - citeulike-article-id:3963908 IS - 2 JF - Journal of Applied Physics EP - 888 TI - Optical characterization of CuIn[sub 1 - x]Ga[sub x]Se[sub 2] alloy thin films by spectroscopic ellipsometry PB - AIP VL - 94 SP - 879 KW - cigs KW - ellipsometry KW - optical_constants AU - Paulson, PD AU - Birkmire, RW AU - Shafarman, WN PY - 2003/// UR - http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=JAPIAU000094000002000879000001&idtype=cvips&gifs=yes ER -