Secondary Ion Emission from Perfluorinated Polyethers Using Megaelectronvolt and Kiloelectronvolt Ion Bombardment Export

@article{citeulike:1538317, abstract = {Time-of-flight secondary ion mass spectrometry (TOF-SIMS) and plasma desorption mass spectrometry (PDMS) were used to investigate the secondary ion emission from perfluorinated polyethers (PFPE; trade name Krytox) havingaverage molecular weights between 3800 and 10 800. The primary focus of the investigation was on comparison of peak patterns, molecular secondary ion yields, and stabilities of secondary ions formed by kiloelectronvolt (SIMS) and megaelectronvolt (PDMS) ion bombardment. Although both techniques produce the same secondary ion species from multilayer samples, secondary ion emission from monolayer PFPE films deposited on silver is observed only for SIMS; oligomer ions cationized with silver are seen up to m/z = 12 000. Metastable ions are observed both in PDMS and SIMS; the parent ions decay into charged and neutral fragments. The yields and half-lives of secondary ions emitted from multilayer samples are always larger in PDMS than in SIMS. However, the fragmentation processes observed are the same. Half-lives are independent of mass in the mass range studied. The yield ratio for ions in PDMS and SIMS is an apparent function of mass because of ion half-lives. When half-lives are considered, the yield ratio of PDMS/SIMS is nearly constant at -10.}, author = {Feld, Herbert and Leute, Angelika and Rading, Derk and Benninghoven, Alfred and Chiarelli, Paul M. and David}, citeulike-article-id = {1538317}, citeulike-linkout-0 = {http://pubs3.acs.org/acs/journals/doilookup?in_doi=10.1021/ac00063a005}, journal = {Annalytical Chemistry}, keywords = {pdms, polymer, sims, tof}, number = {15}, pages = {1947--1953}, posted-at = {2007-08-06 16:16:44}, priority = {2}, title = {Secondary Ion Emission from Perfluorinated Polyethers Using Megaelectronvolt and Kiloelectronvolt Ion Bombardment}, url = {http://pubs3.acs.org/acs/journals/doilookup?in_doi=10.1021/ac00063a005}, volume = {65}, year = {1993} }

TY - JOUR ID - citeulike:1538317 L3 - citeulike-article-id:1538317 N2 - Time-of-flight secondary ion mass spectrometry (TOF-SIMS) and plasma desorption mass spectrometry (PDMS) were used to investigate the secondary ion emission from perfluorinated polyethers (PFPE; trade name Krytox) havingaverage molecular weights between 3800 and 10 800. The primary focus of the investigation was on comparison of peak patterns, molecular secondary ion yields, and stabilities of secondary ions formed by kiloelectronvolt (SIMS) and megaelectronvolt (PDMS) ion bombardment. Although both techniques produce the same secondary ion species from multilayer samples, secondary ion emission from monolayer PFPE films deposited on silver is observed only for SIMS; oligomer ions cationized with silver are seen up to m/z = 12 000. Metastable ions are observed both in PDMS and SIMS; the parent ions decay into charged and neutral fragments. The yields and half-lives of secondary ions emitted from multilayer samples are always larger in PDMS than in SIMS. However, the fragmentation processes observed are the same. Half-lives are independent of mass in the mass range studied. The yield ratio for ions in PDMS and SIMS is an apparent function of mass because of ion half-lives. When half-lives are considered, the yield ratio of PDMS/SIMS is nearly constant at -10. IS - 15 JF - Annalytical Chemistry EP - 1953 TI - Secondary Ion Emission from Perfluorinated Polyethers Using Megaelectronvolt and Kiloelectronvolt Ion Bombardment VL - 65 SP - 1947 KW - pdms KW - polymer KW - sims KW - tof AU - Feld, Herbert AU - Leute, Angelika AU - Rading, Derk AU - Benninghoven, Alfred AU - Chiarelli, Paul AU - David PY - 1993/// UR - http://pubs3.acs.org/acs/journals/doilookup?in_doi=10.1021/ac00063a005 ER -