Secondary-ion emission of amino acids Export

@article{citeulike:1538454, abstract = {Abstract\ \ Secondary-ion mass spectroscopy (SIMS) is a hydrogen, isotope and compound sensitive analytical technique of extremely high absolute sensitivity. Continuing earlier measurements for carboxylic acids, adsorbed alcohols etc., we have carried out a systematical investigation of secondary-ion emission from metal-supported amino acids, containing various functional groups (e.g., alanine, phenylalanine, cysteine, arginine). In order to avoid damage effects we applied extremely small primary-ion current densities in the 10−9 Acm−2 range. The main results of our investigations can be summarized as follows: –\  - All investigated amino acids produce high-intensity secondary-ion parent peaks (M+1)+ and (M−1)−. –\  - In addition positive as well as negative fragment ions representative for the different functional groups are emitted with high yields. –\  - For 2.5 keV Ar+-ions the absolute yields for the parent ions and the most important fragment ions are in the range of 0.1; the damage cross section is \>10−14 cm2 for all investigated acids. The resulting absolute sensitivities are below 10−6 of one monomolecular layer or \<10−12 g. We infer from these results that static SIMS is an excellent tool for trace detection, structural investigation and surface reaction studies of amino acids.}, author = {Benninghoven, A. and Jaspers, D. and Sichtermann, W.}, citeulike-article-id = {1538454}, citeulike-linkout-0 = {http://dx.doi.org/10.1007/BF00895013}, day = {30}, doi = {10.1007/BF00895013}, journal = {Applied Physics A: Materials Science \& Processing}, keywords = {acid, amino, polymer, sims, tof}, number = {1}, pages = {35--39}, posted-at = {2007-08-06 17:19:21}, priority = {2}, title = {Secondary-ion emission of amino acids}, url = {http://dx.doi.org/10.1007/BF00895013}, volume = {11}, year = {1976} }

TY - JOUR ID - citeulike:1538454 L3 - citeulike-article-id:1538454 N2 - Abstract  Secondary-ion mass spectroscopy (SIMS) is a hydrogen, isotope and compound sensitive analytical technique of extremely high absolute sensitivity. Continuing earlier measurements for carboxylic acids, adsorbed alcohols etc., we have carried out a systematical investigation of secondary-ion emission from metal-supported amino acids, containing various functional groups (e.g., alanine, phenylalanine, cysteine, arginine). In order to avoid damage effects we applied extremely small primary-ion current densities in the 10−9 Acm−2 range. The main results of our investigations can be summarized as follows: –  - All investigated amino acids produce high-intensity secondary-ion parent peaks (M+1)+ and (M−1)−. –  - In addition positive as well as negative fragment ions representative for the different functional groups are emitted with high yields. –  - For 2.5 keV Ar+-ions the absolute yields for the parent ions and the most important fragment ions are in the range of 0.1; the damage cross section is >10−14 cm2 for all investigated acids. The resulting absolute sensitivities are below 10−6 of one monomolecular layer or <10−12 g. We infer from these results that static SIMS is an excellent tool for trace detection, structural investigation and surface reaction studies of amino acids. IS - 1 JF - Applied Physics A: Materials Science & Processing EP - 39 TI - Secondary-ion emission of amino acids VL - 11 SP - 35 KW - acid KW - amino KW - polymer KW - sims KW - tof AU - Benninghoven, A AU - Jaspers, D AU - Sichtermann, W PY - 1976//30/ UR - http://dx.doi.org/10.1007/BF00895013 ER -