chiey1102's Benninghoven:A [10 articles] Export

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	Empirical formula for the calculation of secondary ion yields from oxidized metal surfaces and metal oxides [My Copy] Surface Science, Vol. 67, No. 2. (2 October 1977), pp. 565-580. by C. Plog, L. Wiedmann, A. Benninghoven posted to no-tag by chiey1102 on 2008-03-25 18:11:50 as
	Quasisimultaneous SIMS-AES-XPS investigation of the oxidation of Ti in the monolayer range [My Copy] Applied Physics Letters, Vol. 31, No. 5. (1977), pp. 341-343. by A. Benninghoven, H. Bispinck, O. Ganschow, L. Wiedmann posted to oxygen sims tof by chiey1102 on 2007-08-06 17:24:10 as
	SIMS and flash desorption studies of nickel oxygen interaction [My Copy] Applied Physics A: Materials Science & Processing, Vol. 16, No. 4. (1978), pp. 367-373. by A. Benninghoven, K. Müller, M. Schemmer, P. Beckmann posted to oxygen sims tof by chiey1102 on 2007-08-06 17:21:39 as
	Secondary-ion emission of amino acids [My Copy] Applied Physics A: Materials Science & Processing, Vol. 11, No. 1. (1976), pp. 35-39. by A. Benninghoven, D. Jaspers, W. Sichtermann posted to acid amino polymer sims tof by chiey1102 on 2007-08-06 17:19:21 as
	Chemical Analysis of Inorganic and Organic Surfaces and Thin Films by Static Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) [My Copy] Angewandte Chemie International Edition in English, Vol. 33, No. 10. (1994), pp. 1023-1043. by Alfred Benninghoven posted to reviews sims tof by chiey1102 on 2007-08-06 17:07:14 as
	Surface MS:Probing Real-World Samples [My Copy] Annalytical Chemistry, Vol. 65 (1993), pp. 630A-640A. by Alfred Benninghoven, Birgit Hagenhoff, Ewald Niehuis posted to imaging sims tof by chiey1102 on 2007-08-06 17:04:29 as
	Resonance and Nonresonant Laser Ionization of Sputtered Uranium Atoms from Thin Films and Single Microparticles: Evaluation of a Combined System for Particle Trace Analysis [My Copy] Anal. Chem., Vol. 75, No. 13. (1 July 2003), pp. 3175-3181. by N. Erdmann, M. Betti, F. Kollmer, et al.A. Benninghoven, C. Gruning, V. Philipsen, P. Lievens, R. E. Silverans, E. Vandeweert posted to laser sims snms tof by chiey1102 on 2007-08-06 16:23:17 as
	Secondary Ion Emission from Perfluorinated Polyethers Using Megaelectronvolt and Kiloelectronvolt Ion Bombardment [My Copy] Annalytical Chemistry, Vol. 65, No. 15. (1993), pp. 1947-1953. by Herbert Feld, Angelika Leute, Derk Rading, Alfred Benninghoven, Paul M. Chiarelli, David posted to pdms polymer sims tof by chiey1102 on 2007-08-06 16:16:44 as
	Time-of-Flight Secondary Ion Mass Spectrometry of Poly(alky1 methacrylates) [My Copy] Annalytical Chemistry, Vol. 65, No. 8. (1993), pp. 983-991. by Paul A. Zimmerman, David M. Hercules, Alfred Benninghoven posted to pamas polymer sims tof by chiey1102 on 2007-08-06 16:12:59 as
	Detection and Quantification of Metals in Organic Materials by Laser-SNMS with Nonresonant Multiphoton Ionization [My Copy] Anal. Chem., Vol. 72, No. 18. (15 September 2000), pp. 4289-4295. by A. Schnieders, A. Benninghoven posted to laser metal quantification sims snms by chiey1102 on 2007-08-06 15:15:06 as

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hydrogen	34
permeation	24
steel	24
fe	23
electrochemical	14
sims	13
tof	12
acidic	5
diffusion	5
solution	5
c60	4
pd	4
vanadium	4
expansion	3
film	3
lattice	3
layer	3
microstructure	3
polymer	3
stress	3
thin	3
xrd	3
boundary	2
laser	2
metal	2
multi	2
oxygen	2
palladium	2
snms	2
zinc	2
zn	2
acid	1
amino	1
baths	1
cementite	1
clack	1
compounds	1
corrosion	1
deformation	1
degradation	1
deuterium	1
dislocation	1
electroplating	1
fine	1
grain	1
imaging	1
indentation	1
nanostructure	1
nb	1
niobium	1
organic	1
oxide	1
pamas	1
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pdms	1
plastic	1
propertiy	1
quantification	1
reviews	1
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tds	1
tensile	1
theory	1
transport	1
trap	1

chiey1102's Benninghoven:A [10 articles] Export

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