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Measurement of liquid film profiles by Moiré topography Export

Chemical Engineering Science, Vol. 38, No. 4. (1983), pp. 525-534.

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Area-wide surface topography is continuously monitored with the moiré technique, i.e. measurement of patterns formed by superposition of the warped image of a line grating on a similar reference grating. A simple method for reconstructing liquid film profiles from moir fringe patterns is developed. The method is tested with a known specimen, a convex lens. Leveling of an uneven liquid film by gravity and capillary force is followed and film profiles are measured at intervals of time. Waves flowing down an inclined plate and disturbances in a liquid curtain are viewed, as are small disturbances caused by the impingement of tiny surface-active particles. Possible application to control of coating operations is pointed out.


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