The interface structure of thin liquid hexane films

@article{citeulike:1088992, abstract = {A series of thin liquid hexane films adsorbed on a rough silicon wafer was studied with specular and off-specular X-ray scattering. Assuming an interfacial profile at the liquid-solid interface which does not depend on film thickness and modeling the density tail at the liquid-vapor interface by an error-function, we find an interfacial profile which explains the reflectivity data of all the measured 13 hexane films of thicknesses 25-350 A. The interfacial region near the substrate extends to 40 A from the solid-liquid interface and is in good agreement with calculated density profiles of Lennard-Jones fluids near a hard wall. For films thicker than 50 A the rms-roughness found for the liquid surface accounts well to predictions based on standard continuum capillary-wave theory. The surface roughness of thinner films is drastically reduced. Above 200 A a power law of the form q[eta]-2r describes the diffusely scattered intensity.}, author = {Doerr, A. K. and Tolan, M. and Seydel, T. and Press, W. }, citeulike-article-id = {1088992}, doi = {http://dx.doi.org/10.1016/S0921-4526(98)00245-2}, journal = {Physica B: Condensed Matter}, keywords = {layering, molecular, nanofluids}, month = {June}, number = {1-4}, pages = {263--268}, posted-at = {2007-02-05 18:05:44}, priority = {3}, title = {The interface structure of thin liquid hexane films}, url = {http://dx.doi.org/10.1016/S0921-4526(98)00245-2}, volume = {248}, year = {1998} }

TY - JOUR ID - citeulike:1088992 L3 - citeulike-article-id:1088992 TI - The interface structure of thin liquid hexane films JF - Physica B: Condensed Matter VL - 248 IS - 1-4 SP - 263 EP - 268 N2 - A series of thin liquid hexane films adsorbed on a rough silicon wafer was studied with specular and off-specular X-ray scattering. Assuming an interfacial profile at the liquid-solid interface which does not depend on film thickness and modeling the density tail at the liquid-vapor interface by an error-function, we find an interfacial profile which explains the reflectivity data of all the measured 13 hexane films of thicknesses 25-350 A. The interfacial region near the substrate extends to 40 A from the solid-liquid interface and is in good agreement with calculated density profiles of Lennard-Jones fluids near a hard wall. For films thicker than 50 A the rms-roughness found for the liquid surface accounts well to predictions based on standard continuum capillary-wave theory. The surface roughness of thinner films is drastically reduced. Above 200 A a power law of the form q[eta]-2r describes the diffusely scattered intensity. KW - layering KW - molecular KW - nanofluids AU - Doerr, AK AU - Tolan, M AU - Seydel, T AU - Press, W PY - 1998/06/15/ UR - http://dx.doi.org/10.1016/S0921-4526(98)00245-2 ER -