Direct measurement of the Josephson plasma resonance frequency from I-V Characteristics Export

@article{citeulike:4164647, abstract = {The speed of Josephson circuits such as those required for rapid single flux quantum logic is limited by the Josephson plasma frequency, \ω_p, which (with few exceptions) increases monotonically with increasing critical current density, J_c. Here we describe a new technique for directly measuring \ω_p, using the current-voltage characteristics of a simple structure based on externally-shunted, series-connected tunnel junctions. We present both experimental and theoretical demonstrations of the technique and describe its application to the determination of the junction capacitance, a property poorly characterized for high-J_c junctions.}, author = {Kleinsasser, A. W. and Johnson, M. W. and Delin, K. A.}, booktitle = {Applied Superconductivity, IEEE Transactions on}, citeulike-article-id = {4164647}, citeulike-linkout-0 = {http://dx.doi.org/10.1109/TASC.2005.849700}, citeulike-linkout-1 = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=1439582}, doi = {10.1109/TASC.2005.849700}, journal = {Applied Superconductivity, IEEE Transactions on}, keywords = {capacitance, josephson, junction, resonance}, number = {2}, pages = {86--89}, posted-at = {2009-03-11 06:33:48}, priority = {2}, title = {Direct measurement of the Josephson plasma resonance frequency from I-V Characteristics}, url = {http://dx.doi.org/10.1109/TASC.2005.849700}, volume = {15}, year = {2005} }

TY - JOUR ID - citeulike:4164647 L3 - citeulike-article-id:4164647 N2 - The speed of Josephson circuits such as those required for rapid single flux quantum logic is limited by the Josephson plasma frequency, ω_p, which (with few exceptions) increases monotonically with increasing critical current density, J_c. Here we describe a new technique for directly measuring ω_p, using the current-voltage characteristics of a simple structure based on externally-shunted, series-connected tunnel junctions. We present both experimental and theoretical demonstrations of the technique and describe its application to the determination of the junction capacitance, a property poorly characterized for high-J_c junctions. IS - 2 JF - Applied Superconductivity, IEEE Transactions on EP - 89 TI - Direct measurement of the Josephson plasma resonance frequency from I-V Characteristics VL - 15 T2 - Applied Superconductivity, IEEE Transactions on SP - 86 KW - capacitance KW - josephson KW - junction KW - resonance AU - Kleinsasser, AW AU - Johnson, MW AU - Delin, KA PY - 2005/// UR - http://dx.doi.org/10.1109/TASC.2005.849700 ER -