denisamparo's Tolpygo:SK [11 articles] Export Sort

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	Tunneling properties of barriers in Nb/Al/AlO<sub>x</sub>/Nb junctions [My Copy] Applied Superconductivity, IEEE Transactions on, Vol. 13, No. 2. (15 July 2003), pp. 99-102. by S. K. Tolpygo, E. Cimpoiasu, X. Liu, et al.N. Simonian, Yu Polyakov, J. E. Lukens, K. K. Likharev posted to no-tag by denisamparo on 2009-11-03 19:29:40 as
	Tunable transformer for qubits based on flux states [My Copy] Applied Superconductivity, IEEE Transactions on, Vol. 13, No. 2. (15 July 2003), pp. 1005-1008. by T. V. Filippov, S. K. Tolpygo, J. Mannik, J. E. Lukens posted to no-tag by denisamparo on 2009-10-09 03:52:31 as
	Quantum superposition of distinct macroscopic states [My Copy] Nature, Vol. 406, No. 6791. (06 July 2000), pp. 43-46. by Jonathan R. Friedman, Vijay Patel, W. Chen, S. K. Tolpygo, J. E. Lukens posted to no-tag by denisamparo on 2009-10-09 02:19:31 as
	Effect of Electrical Stress on Josephson Tunneling Characteristics of <formula formulatype="inline"><tex Notation="TeX">$rm Nb/Al/AlO_x/rm Nb$</tex></formula> Junctions [My Copy] Applied Superconductivity, IEEE Transactions on, Vol. 19, No. 3. (30 June 2009), pp. 154-158. by D. Amparo, S. K. Tolpygo posted to no-tag by denisamparo on 2009-09-14 22:53:53 as
	Process-Induced Variability of <formula formulatype="inline"> <tex Notation="TeX">$rm Nb/Al/rm AlO_rm x/rm Nb$</tex></formula> Junctions in Superconductor Integrated <newline/>Circuits and Protection Against It [My Copy] Applied Superconductivity, IEEE Transactions on, Vol. 19, No. 3. (30 June 2009), pp. 135-139. by S. K. Tolpygo, D. Amparo, D. T. Yohannes, M. Meckbach, A. F. Kirichenko posted to no-tag by denisamparo on 2009-09-14 20:51:46 as
	Characterization of HYPRES' 4.5 kA/cm<sup>2</sup> & 8 kA/cm<sup>2</sup> Nb/AlO<sub>x</sub>/Nb fabrication processes [My Copy] Applied Superconductivity, IEEE Transactions on In Applied Superconductivity, IEEE Transactions on, Vol. 15, No. 2. (2005), pp. 90-93. by D. Yohannes, S. Sarwana, S. K. Tolpygo, A. Sahu, Y. A. Polyakov, V. K. Semenov posted to no-tag by denisamparo on 2008-11-03 05:06:03 as
	Parametric Testing of HYPRES Superconducting Integrated Circuit Fabrication Processes [My Copy] Applied Superconductivity, IEEE Transactions on In Applied Superconductivity, IEEE Transactions on, Vol. 17, No. 2. (2007), pp. 181-186. by Yohannes, Kirichenko, Sarwana, S. K. Tolpygo posted to no-tag by denisamparo on 2008-11-03 05:03:30 as
	Electrical stress effect on Josephson tunneling through ultrathin AlOx barrier in Nb/Al/AlOx/Nb junctions [My Copy] Journal of Applied Physics, Vol. 104 (September 2008), 063904. by Sergey K. Tolpygo, Denis Amparo posted to breakdown electricalstress josephson junction nbaloxnb by denisamparo on 2008-09-19 18:54:32 as
	Fabrication process development for superconducting VLSI circuits: minimizing plasma charging damage [My Copy] Journal of Physics: Conference Series, Vol. 97, No. 1. (2008), 012227. by S. K. Tolpygo, D. Amparo posted to no-tag by denisamparo on 2008-04-15 16:18:40 as
	Plasma process-induced damage to Josephson tunnel junctions in superconducting integrated circuits [My Copy] Superconductor Science and Technology, Vol. 20, No. 11. (2007), pp. S341-S349. by Sergey K. Tolpygo, Denis Amparo, Alex Kirichenko, Daniel Yohannes posted to damage josephson junction plasma by denisamparo on 2007-10-30 14:55:53 as
	20 kA/cm^2 Process Development for Superconducting Integrated Circuits With 80 GHz Clock Frequency [My Copy] Applied Superconductivity, IEEE Transactions on In Applied Superconductivity, IEEE Transactions on, Vol. 17, No. 2. (2007), pp. 946-951. by S. K. Tolpygo, D. Yohannes, R. T. Hunt, et al.J. A. Vivalda, D. Donnelly, D. Amparo, A. F. Kirichenko posted to fabrication highjc nbaloxnb by denisamparo on 2007-10-15 17:46:49 as

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