Robust system design with built-in soft-error resilience Export

@article{mitra05robust, abstract = {Transient errors caused by terrestrial radiation pose a major barrier to robust system design. A system's susceptibility to such errors increases in advanced technologies, making the incorporation of effective protection mechanisms into chip designs essential. A new design paradigm reuses design-for-testability and debug resources to eliminate such errors.}, author = {Mitra, S. and Seifert, N. and Zhang, M. and Shi, Q. and Kim, K. S.}, booktitle = {Computer}, citeulike-article-id = {4071665}, citeulike-linkout-0 = {http://dx.doi.org/10.1109/MC.2005.70}, citeulike-linkout-1 = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=1401773}, doi = {10.1109/MC.2005.70}, journal = {Computer}, keywords = {fault-tolerance, robustness, seu}, number = {2}, pages = {43--52}, posted-at = {2009-02-19 17:12:35}, priority = {2}, title = {Robust system design with built-in soft-error resilience}, url = {http://dx.doi.org/10.1109/MC.2005.70}, volume = {38}, year = {2005} }

TY - JOUR ID - mitra05robust L3 - citeulike-article-id:4071665 N2 - Transient errors caused by terrestrial radiation pose a major barrier to robust system design. A system's susceptibility to such errors increases in advanced technologies, making the incorporation of effective protection mechanisms into chip designs essential. A new design paradigm reuses design-for-testability and debug resources to eliminate such errors. IS - 2 JF - Computer EP - 52 TI - Robust system design with built-in soft-error resilience VL - 38 T2 - Computer SP - 43 KW - fault-tolerance KW - robustness KW - seu AU - Mitra, S AU - Seifert, N AU - Zhang, M AU - Shi, Q AU - Kim, KS PY - 2005/// UR - http://dx.doi.org/10.1109/MC.2005.70 ER -