eyliu's library 614 articles Export

	Detailed Balance Limit of Efficiency of p-n Junction Solar Cells [My Copy] Journal of Applied Physics, Vol. 32, No. 3. (1961), pp. 510-519. by William Shockley, Hans J. Queisser posted to solar by eyliu on 2009-10-25 21:44:51 as
	Comparative study of maximum power point tracking algorithms [My Copy] Progress in Photovoltaics: Research and Applications, Vol. 11, No. 1. (2003), pp. 47-62. by D. P. Hohm, M. E. Ropp posted to solar optimization by eyliu on 2009-10-25 16:12:15 as
	Simple maximum power point tracker for photovoltaic arrays [My Copy] Electronics Letters, Vol. 36, No. 11. (09 July 2003), pp. 997-999. by Yan H. Lim, D. C. Hamill posted to solar control-theory by eyliu on 2009-10-25 01:36:58 as
	Fine-tuned profile simulation of holographically exposed photoresist gratings [My Copy] Optics Communications, Vol. 154, No. 1-3. (15 August 1998), pp. 109-118. by C. Zanke posted to lithography by eyliu on 2009-10-24 20:37:32 as
	The optimization of photoresist profile for sub-90nm technology [My Copy] Metrology, Inspection, and Process Control for Microlithography XXI, Vol. 6518, No. 1. (2007), 65184K. by Haengleem Jeon, Cheonman Shim, Jiho Hong, Jaewon Han, Keeho Kim edited by Chas N. Archie posted to lithography by eyliu on 2009-10-24 20:35:18 as
	An Introduction to the Theory of Random Signals and Noise [My Copy] (01 October 1987) by Wilbur B. Davenport, William L. Root posted to noise by eyliu on 2009-10-22 23:54:18 as
	Infrared absorber for pyroelectric detectors [My Copy] Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 25, No. 3. (2007), pp. 437-440. by M. P. Thompson, J. R. Troxell, M. E. Murray, C. M. Thrush, J. V. Mantese posted to infrared detector by eyliu on 2009-10-22 22:27:27 as
	Convergence Properties of the Nelder--Mead Simplex Method in Low Dimensions [My Copy] SIAM Journal on Optimization, Vol. 9, No. 1. (1998), pp. 112-147. by Jeffrey C. Lagarias, James A. Reeds, Margaret H. Wright, Paul E. Wright posted to optimization by eyliu on 2009-10-22 21:05:56 as along with 2 people kdouglass 0pika0
	P. A. M. Dirac: Some strangeness in the proportion [My Copy] American Journal of Physics, Vol. 77, No. 11. (2009), pp. 979-987. by Jeremy Bernstein posted to biography by eyliu on 2009-10-19 17:18:47 as
	Nanoscale magnetic resonance imaging [My Copy] Proceedings of the National Academy of Sciences, Vol. 106, No. 5. (3 February 2009), pp. 1313-1317. by C. L. Degen, M. Poggio, H. J. Mamin, C. T. Rettner, D. Rugar posted to magnetic-resonance by eyliu on 2009-10-19 07:38:07 as along with 7 people and 3 groups kubala pick600 sobolevnrm haisent wmppaul samjlord bobturner Computerized Tomography baker-group moernerlab
	Through-Wall Tracking Using Variance-Based Radio Tomography Networks [My Copy] (1 Oct 2009) by Joey Wilson, Neal Patwari posted to tomography by eyliu on 2009-10-19 06:24:34 as along with 1 person RaphaelWimmer
	Graphic Symbols in Vacuum Technology [My Copy] Journal of Vacuum Science and Technology, Vol. 4, No. 3. (1967), pp. 139-142. posted to vacuum by eyliu on 2009-10-12 19:05:39 as
	Si, SiGe Nanowire Devices by Top–Down Technology and Their Applications [My Copy] Electron Devices, IEEE Transactions on, Vol. 55, No. 11. (07 November 2008), pp. 3107-3118. by N. Singh, K. D. Buddharaju, S. K. Manhas, et al.A. Agarwal, S. C. Rustagi, G. Q. Lo, N. Balasubramanian, D. L. Kwong posted to transistor by eyliu on 2009-10-04 23:27:21 as
	A 45nm Logic Technology with High-k+Metal Gate Transistors, Strained Silicon, 9 Cu Interconnect Layers, 193nm Dry Patterning, and 100% Pb-free Packaging [My Copy] Electron Devices Meeting, 2007. IEDM 2007. IEEE International In Electron Devices Meeting, 2007. IEDM 2007. IEEE International (04 January 2008), pp. 247-250. by K. Mistry, C. Allen, C. Auth, et al.B. Beattie, D. Bergstrom, M. Bost, M. Brazier, M. Buehler, A. Cappellani, R. Chau, C. H. Choi, G. Ding, K. Fischer, T. Ghani, R. Grover, W. Han, D. Hanken, M. Hattendorf, J. He, J. Hicks, R. Huessner, D. Ingerly, P. Jain, R. James, L. Jong, S. Joshi, C. Kenyon, K. Kuhn, K. Lee, H. Liu, J. Maiz, B. Mclntyre, P. Moon, J. Neirynck, S. Pae, C. Parker, D. Parsons, C. Prasad, L. Pipes, M. Prince, P. Ranade, T. Reynolds, J. Sandford, L. Shifren, J. Sebastian, J. Seiple, D. Simon, S. Sivakumar, P. Smith, C. Thomas, T. Troeger, P. Vandervoorn, S. Williams, K. Zawadzki posted to transistor by eyliu on 2009-10-04 23:11:59 as along with 1 person JonD
	Integrated nanoelectronics for the future [My Copy] Nat Mater, Vol. 6, No. 11. (01 November 2007), pp. 810-812. by Robert Chau, Brian Doyle, Suman Datta, Jack Kavalieros, Kevin Zhang posted to transistor by eyliu on 2009-10-04 21:12:49 as
	Turning the world vertical: MOSFETs with current flow perpendicular to the wafer surface [My Copy] Applied Physics A: Materials Science & Processing, Vol. 87, No. 3. (1 June 2007), pp. 531-537. by J. Moers posted to transistor by eyliu on 2009-10-04 21:11:18 as
	$My PDF aly_93_refractive.pdf$ Refractive index of salt water: effect of temperature [My Copy] Optical Materials, Vol. 2, No. 3. (July 1993), pp. 195-199. by K. Aly posted to water optical-properties by eyliu on 2009-10-04 21:00:17 as
	Chaotic Dirac Billiard in Graphene Quantum Dots [My Copy] Science, Vol. 320, No. 5874. (18 April 2008), pp. 356-358. by L. A. Ponomarenko, F. Schedin, M. I. Katsnelson, et al.R. Yang, E. W. Hill, K. S. Novoselov, A. K. Geim posted to transistor graphene by eyliu on 2009-10-04 20:14:36 as along with 2 people Herve akhuettel
	Gold Helix Photonic Metamaterial as Broadband Circular Polarizer [My Copy] Science, Vol. 325, No. 5947. (18 September 2009), pp. 1513-1515. by Justyna K. Gansel, Michael Thiel, Michael S. Rill, et al.Manuel Decker, Klaus Bade, Volker Saile, Georg von Freymann, Stefan Linden, Martin Wegener posted to photonic-crystals by eyliu on 2009-09-22 23:11:36 as along with 1 person MurphysLab
	Convex-concave utility function: Optimal blood-consumption for vampires [My Copy] Applied Mathematical Modelling, Vol. 7, No. 2. (April 1983), pp. 83-88. by R. Hartl posted to vampires population by eyliu on 2009-08-24 22:55:23 as
	Determination of refractive indexes of dielectric films by the use of immersion liquids [My Copy] Kristall und Technik, Vol. 16, No. 4. (1981), pp. 503-512. by B. M. Ayupov, N. P. Sysoeva posted to immersion ellipsometry by eyliu on 2009-08-22 01:20:32 as
	Ellipsometric analysis of inhomogeneous structures on the basis of complex reflection coefficients [My Copy] Surface Science, Vol. 177, No. 3. (02 December 1986), pp. 625-641. by R. Lubinskaya, A. Mardezhov, K. Svitashov, V. Shvets posted to ellipsometry immersion by eyliu on 2009-08-11 06:15:42 as
	Simultaneous and Independent Determination of the Refractive Index and the Thickness of Thin Films by Ellipsometry [My Copy] J. Opt. Soc. Am., Vol. 58, No. 4. (1 April 1968), pp. 526-532. by K. Vedam, R. Rai, F. Lukes, R. Srinivasan posted to ellipsometry immersion by eyliu on 2009-08-11 05:00:09 as
	An Interface Enhanced Spectroscopic Ellipsometry Technique: Application to Si-SiO[sub 2] [My Copy] Journal of The Electrochemical Society, Vol. 139, No. 5. (1992), pp. 1450-1455. by V. A. Yakovlev, E. A. Irene posted to ellipsometry immersion by eyliu on 2009-08-07 00:16:52 as
	Joint reconstruction of Stokes images from polarimetric measurements [My Copy] J. Opt. Soc. Am. A, Vol. 26, No. 4. (1 April 2009), pp. 962-968. by John R. Valenzuela, Jeffrey A. Fessler posted to friends polarimetry by eyliu on 2009-08-06 19:49:09 as
	Correlation between nanosecond X-ray flashes and stick-slip friction in peeling tape [My Copy] Nature, Vol. 455, No. 7216. (23 October 2008), pp. 1089-1092. by Carlos G. Camara, Juan V. Escobar, Jonathan R. Hird, Seth J. Putterman posted to scotch-tape x-rays by eyliu on 2009-08-06 16:28:07 as along with 6 people gi0rgi0ne JonasGroten melting aloks skirnir samjlord
	Peeling adhesive tape emits electromagnetic radiation at terahertz frequencies [My Copy] Opt. Lett., Vol. 34, No. 14. (15 July 2009), pp. 2195-2197. by J. Horvat, R. A. Lewis posted to scotch-tape terahertz by eyliu on 2009-08-06 16:23:34 as
	Time-reversal and model-based imaging in a THz waveguide [My Copy] Opt. Express, Vol. 17, No. 16. (3 August 2009), pp. 13663-13670. by Malakeh A. Musheinesh, Charles J. Divin, Jeffrey A. Fessler, Theodore B. Norris posted to friends terahertz tomography by eyliu on 2009-08-06 16:10:19 as
	Flow improvement caused by agents who ignore traffic rules [My Copy] Physical Review E (Statistical, Nonlinear, and Soft Matter Physics), Vol. 80, No. 1. (2009), 016111. by Seung K. Baek, Petter Minnhagen, Sebastian Bernhardsson, Kweon Choi, Beom J. Kim posted to traffic by eyliu on 2009-07-30 00:10:05 as along with 1 person pak
	Photoelectric Analysis of Polarized Light [My Copy] Appl. Opt., Vol. 1, No. 3. (1 May 1962), pp. 201-205. by Wolfgang Budde posted to ellipsometry by eyliu on 2009-07-07 22:31:50 as
	Regression calibration method for rotating element ellipsometers [My Copy] Thin Solid Films, Vol. 234, No. 1-2. (25 October 1993), pp. 395-398. by B. Johs posted to ellipsometry by eyliu on 2009-07-07 19:57:58 as
	Scanning ellipsometer by rotating polarizer and analyzer [My Copy] Appl. Opt., Vol. 26, No. 24. (15 December 1987), pp. 5221-5228. by L. Y. Chen, David W. Lynch posted to ellipsometry by eyliu on 2009-06-19 08:34:57 as
	Recent developments in instrumentation in ellipsometry [My Copy] Surface Science, Vol. 96, No. 1-3. (June 1980), pp. 108-140. by P. Hauge posted to ellipsometry by eyliu on 2009-06-19 08:20:56 as
	Present status of automatic ellipsometers [My Copy] Surface Science, Vol. 56 (June 1976), pp. 19-36. by R. Muller posted to ellipsometry by eyliu on 2009-06-19 08:18:59 as
	A simple Fourier photopolarimeter with rotating polarizer and analyzer for measuring Jones and Mueller matrices [My Copy] Optics Communications, Vol. 25, No. 2. (May 1978), pp. 137-140. by R. Azzam posted to ellipsometry by eyliu on 2009-06-19 08:13:01 as
	Rotating-compensator multichannel ellipsometry for characterization of the evolution of nonuniformities in diamond thin-film growth [My Copy] Applied Physics Letters, Vol. 72, No. 8. (1998), pp. 900-902. by Joungchel Lee, P. I. Rovira, Ilsin An, R. W. Collins posted to ellipsometry by eyliu on 2009-06-19 07:58:10 as
	Application of the lattice Green's function for calculating the resistance of an infinite network of resistors [My Copy] American Journal of Physics, Vol. 68, No. 10. (2000), pp. 896-906. by Jozsef Cserti posted to electrical-engineering by eyliu on 2009-06-18 18:12:38 as along with 1 person and 1 group maurengo Mauro
	Nanoscale Reversible Mass Transport for Archival Memory [My Copy] Nano Letters, Vol. 9, No. 5. (13 May 2009), pp. 1835-1838. by G. E. Begtrup, W. Gannett, T. D. Yuzvinsky, V. H. Crespi, A. Zettl posted to memory by eyliu on 2009-06-18 02:02:55 as along with 3 people Mandre JingweiZhang haisent
	Ellipsometric liquid immersion method for the determination of all the optical parameters of the system: Nonabsorbing film on an absorbing substrate☆ [My Copy] Surface Science, Vol. 16 (August 1969), pp. 112-125. by F. Lukes, W. Knausenberger, K. Vedam posted to ellipsometry immersion by eyliu on 2009-06-18 01:45:36 as
	Accurate Ellipsometric Measurement of Refractive Index and Thickness of Ultrathin Oxide Film [My Copy] Journal of The Electrochemical Society, Vol. 153, No. 12. (2006), pp. F277-F282. by B. M. Ayupov, V. A. Gritsenko, Hei Wong, C. W. Kim posted to ellipsometry immersion by eyliu on 2009-06-18 01:22:28 as
	Optimizing precision of rotating-analyzer ellipsometers [My Copy] J. Opt. Soc. Am., Vol. 64, No. 5. (1 May 1974), pp. 639-646. by D. E. Aspnes posted to ellipsometry by eyliu on 2009-06-17 22:45:27 as
	Immersion lithography at 157 nm [My Copy] The 45th international conference on electron, ion, and photon beam technology and nanofabrication, Vol. 19, No. 6. (2001), pp. 2353-2356. by M. Switkes, M. Rothschild posted to ellipsometry immersion lithography by eyliu on 2009-06-17 17:44:34 as
	Resolution enhancement of 157 nm lithography by liquid immersion [My Copy] Journal of Microlithography, Microfabrication, and Microsystems, Vol. 1, No. 3. (2002), pp. 225-228. by M. Switkes, M. Rothschild posted to ellipsometry immersion lithography by eyliu on 2009-06-17 17:43:22 as
	Limiting Si/SiO[sub 2] interface roughness resulting from thermal oxidation [My Copy] Journal of Applied Physics, Vol. 86, No. 3. (1999), pp. 1729-1735. by L. Lai, E. A. Irene posted to ellipsometry immersion by eyliu on 2009-06-17 17:42:01 as
	Optical constants of TbFeO3 measured by the immersion ellipsometry method at wavelength 0.63 mu m [My Copy] Journal of Physics D: Applied Physics, Vol. 27, No. 9. (1994), pp. 1964-1967. by V. V. Filippov, I. D. Lomako, N. N. Sender posted to ellipsometry immersion by eyliu on 2009-06-17 17:41:10 as
	Applications of spectroscopic ellipsometry to microelectronics [My Copy] Thin Solid Films, Vol. 233, No. 1-2. (12 October 1993), pp. 96-111. by E. Irene posted to ellipsometry immersion by eyliu on 2009-06-17 17:40:29 as
	Immersion ellipsometry of semiconductor surfaces [My Copy] Surface and Interface Analysis, Vol. 16, No. 1-12. (1990), pp. 46-53. by Ivan Ohlídal, Milan Líbezný posted to ellipsometry immersion by eyliu on 2009-06-17 17:39:51 as
	Measurement of N in nitrided oxides using spectroscopic immersion ellipsometry [My Copy] Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 14, No. 3. (1996), pp. 1697-1701. by E. A. Irene, Q. Liu, W. M. Paulson, P. J. Tobin, R. I. Hegde posted to ellipsometry immersion by eyliu on 2009-06-17 17:39:17 as
	Spectroscopic immersion ellipsometry study of the mechanism of Si/SiO[sub 2] interface annealing [My Copy] Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 10, No. 3. (1992), pp. 427-433. by V. A. Yakovlev, Q. Liu, E. A. Irene posted to ellipsometry immersion by eyliu on 2009-06-17 17:38:39 as
	Si/SiO[sub 2] interface studies by spectroscopic immersion ellipsometry and atomic force microscopy [My Copy] Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 12, No. 5. (1994), pp. 2625-2629. by Q. Liu, J. F. Wall, E. A. Irene posted to ellipsometry immersion by eyliu on 2009-06-17 17:38:14 as

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diffraction	34
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scatterometry	25
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eyliu's library 614 articles Export

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