Three-Dimensional Deformation Measurement from the Combination of In-Plane and Out-Of-Plane Electronic Speckle Pattern Interferometers Export

@article{citeulike:3352859, abstract = {An optical setup that can be switched to produce in-plane and out-of-plane sensitivity interferometers was designed for three-dimensional deformation measuring by electronic speckle pattern interferometry. Divergent illumination is considered in the evaluation of sensitivity vectors to measure both in-plane and out-of-plane displacement components. The combination of these interferometers presents the advantage of greater sensitivity in directions u, v, and w than a typical interferometer with three illumination beams provides. The system and its basic operation are described, and results with an elastic target that is exposed to a mechanical load are reported.}, author = {Mart\'{\i}nez, Amalia and Rayas, Juan A. and Rodr\'{\i}guez-Vera, Ram\'{o}n and Puga, H\'{e}ctor J.}, citeulike-article-id = {3352859}, citeulike-linkout-0 = {http://dx.doi.org/10.1364/AO.43.004652}, citeulike-linkout-1 = {http://www.opticsinfobase.org/abstract.cfm?id=80859}, day = {20}, doi = {10.1364/AO.43.004652}, journal = {Appl. Opt.}, keywords = {3d, offms, speckle}, number = {24}, pages = {4652--4658}, posted-at = {2008-09-29 16:21:31}, priority = {2}, publisher = {OSA}, title = {Three-Dimensional Deformation Measurement from the Combination of In-Plane and Out-Of-Plane Electronic Speckle Pattern Interferometers}, url = {http://dx.doi.org/10.1364/AO.43.004652}, volume = {43}, year = {2004} }

TY - JOUR ID - citeulike:3352859 L3 - citeulike-article-id:3352859 N2 - An optical setup that can be switched to produce in-plane and out-of-plane sensitivity interferometers was designed for three-dimensional deformation measuring by electronic speckle pattern interferometry. Divergent illumination is considered in the evaluation of sensitivity vectors to measure both in-plane and out-of-plane displacement components. The combination of these interferometers presents the advantage of greater sensitivity in directions u, v, and w than a typical interferometer with three illumination beams provides. The system and its basic operation are described, and results with an elastic target that is exposed to a mechanical load are reported. IS - 24 JF - Appl. Opt. EP - 4658 TI - Three-Dimensional Deformation Measurement from the Combination of In-Plane and Out-Of-Plane Electronic Speckle Pattern Interferometers PB - OSA VL - 43 SP - 4652 KW - 3d KW - offms KW - speckle AU - Martínez, Amalia AU - Rayas, Juan AU - Rodríguez-Vera, Ramón AU - Puga, Héctor PY - 2004//20/ UR - http://dx.doi.org/10.1364/AO.43.004652 ER -