Epitaxial structure and transport in LaTiO_3+x films on (001) SrTiO_3 Export

@article{citeulike:766160, abstract = {The structure and transport properties of LaTiO\_3+x epitaxial thin films grown on (001) SrTiO\_3 by pulsedlaser deposition is examined. Four-circle X-ray diffraction indicates that the films possess the defect perovskite LaTiO3 structure when deposited in vacuum, with the higher X compounds forming at moderate oxygen pressures. The crystal structure of the LaTiO3 films is tetragonal in the epitaxial films, in contrast to the orthorhombic structure observed in bulk materials. A domain structure is observed in the films, consisting of LaTiO3 oriented either with the [110] or [001] directions perpendicular to the substrate surface. Z-contrast scanning transmission electron microscopy reveals that this domain structure is not present in the first few unit cells of the film, but emerges approximately 2–3 nm from the SrTiO3/LaTiO3 interface. Upon increasing the oxygen pressure during growth, a shift in the lattice d-spacing parallel to the substrate surface is observed, and is consistent with the growth of the La2Ti2O7 phase. However, van der Pauw measurements show that the films with the larger d-spacing remain conductive, albeit with a resistivity that is significantly higher than that for the perovskite LaTiO3 films. The transport behavior suggests that the films grown at higher oxygen pressures are LaTiO3+x with 0.4 < x < 0.5.}, author = {Kim1, K. H. and Norton, D. P. and Budai, J. D. and Chisholm, M. F. and Sales, B. C. and Christen, D. K. and Cantoni, C.}, citeulike-article-id = {766160}, citeulike-linkout-0 = {http://dx.doi.org/10.1002/pssa.200306686}, doi = {10.1002/pssa.200306686}, journal = {physica status solidi}, keywords = {film, latio3, sto}, pages = {346--351}, posted-at = {2006-07-20 07:18:10}, priority = {2}, title = {Epitaxial structure and transport in LaTiO\_3+x films on (001) SrTiO\_3}, url = {http://dx.doi.org/10.1002/pssa.200306686}, volume = {200}, year = {2003} }

TY - JOUR ID - citeulike:766160 L3 - citeulike-article-id:766160 N2 - The structure and transport properties of LaTiO_3+x epitaxial thin films grown on (001) SrTiO_3 by pulsedlaser deposition is examined. Four-circle X-ray diffraction indicates that the films possess the defect perovskite LaTiO3 structure when deposited in vacuum, with the higher X compounds forming at moderate oxygen pressures. The crystal structure of the LaTiO3 films is tetragonal in the epitaxial films, in contrast to the orthorhombic structure observed in bulk materials. A domain structure is observed in the films, consisting of LaTiO3 oriented either with the [110] or [001] directions perpendicular to the substrate surface. Z-contrast scanning transmission electron microscopy reveals that this domain structure is not present in the first few unit cells of the film, but emerges approximately 2–3 nm from the SrTiO3/LaTiO3 interface. Upon increasing the oxygen pressure during growth, a shift in the lattice d-spacing parallel to the substrate surface is observed, and is consistent with the growth of the La2Ti2O7 phase. However, van der Pauw measurements show that the films with the larger d-spacing remain conductive, albeit with a resistivity that is significantly higher than that for the perovskite LaTiO3 films. The transport behavior suggests that the films grown at higher oxygen pressures are LaTiO3+x with 0.4 < x < 0.5. JF - physica status solidi EP - 351 TI - Epitaxial structure and transport in LaTiO_3+x films on (001) SrTiO_3 VL - 200 SP - 346 KW - film KW - latio3 KW - sto AU - Kim1, KH AU - Norton, DP AU - Budai, JD AU - Chisholm, MF AU - Sales, BC AU - Christen, DK AU - Cantoni, C PY - 2003/// UR - http://dx.doi.org/10.1002/pssa.200306686 ER -