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Scaling dielectric data on Rb_1-x(NH_4)_xH_2PO_4 structural glasses and their deuterated isomorphs Export

Physical Review B, Vol. 33, No. 4. (15 February 1986), 2975.

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Temperature- (T) and frequency- (ν) dependent dielectric losses on Rb 1-x (NH 4 ) x H 2 PO 4 single crystals (RADP); and their deuterated isomorphs (D-RADP); can be collapsed to single curves with a scaling variable E(T;ν). This applies for T sufficiently high that equilibrium is established within the sample-thermalization time. If E(T;ν) follows the Vogel-Fulcher law; the scaling will depend only on the freezing temperature T 0 and on the attempt frequency ν 0 . For RADP; values in excellent agreement with a study covering a very broad frequency range are thus obtained; while significantly different values apply to D-RADP.


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