Register | Log in | FAQ      [?] 
Recent | Unread | Search | Authors | Tags | Export

kewms's library [262 articles]

Recent papers added to kewms's library.
  • Large area electronics using printing methods
    Proceedings of the IEEE, Vol. 93, No. 7. (2005), pp. 1321-1329.
  • Printed organic semiconducting devices
    Proceedings of the IEEE, Vol. 93, No. 7. (2005), pp. 1348-1356.
  • Reel to real: prospects for flexible displays
    Proceedings of the IEEE, Vol. 93, No. 8. (2005), pp. 1394-1399.
    by KJ Allen
  • Polymer electronics systems - polytronics
    Proceedings of the IEEE, Vol. 93, No. 8. (2005), pp. 1400-1406.
    by K Bock
  • The electronic circuit composition and structure of thread for a novel braid electronics-systems by kumihimo structure
    Proceedings of the IEEE, Vol. 93, No. 8. (2005), pp. 1407-1411.
  • Flexible conjugated polymer-based plastic solar cells: from basics to applications
    Proceedings of the IEEE, Vol. 93, No. 8. (2005), pp. 1429-1439.
  • Vacuum web coating - state of the art and potential for electronics
    Proceedings of the IEEE, Vol. 93, No. 8. (2005), pp. 1483-1490.
  • Flexible electronics and displays: high-resolution, roll-to-roll, projection lithography and photoablation processing technologies for high-throughput production
    Proceedings of the IEEE, Vol. 93, No. 8. (2005), pp. 1500-1510.
  • Printing methods and materials for large-area electronic devices
    Proceedings of the IEEE, Vol. 93, No. 8. (2005), pp. 1491-1499.
    by ML Chabinyc, WS Wong, AC Arias, S Ready, RA Lujan, JH Daniel, B Krusor, RB Apte, A Salleo, RA Street
  • Macroelectronics
    Materials Research Society Bulletin, Vol. 31, No. 6. (June 2006)
    by Robert H Reuss, Darrel G Hopper, Jae-Geun Park
  • The path to ubiquitous and low-cost organic electronic appliances on plastic
    Nature, Vol. 428, No. 6986. (29 April 2004), pp. 911-918.
    by Stephen R Forrest
  • Mechanics of thin-film transistors and solar cells on flexible substrates
    Solar Energy, Vol. 80, No. 6. (June 2006), pp. 687-693.
    by Helena Gleskova, I-Chun Cheng, Sigurd Wagner, James C Sturm, Zhigang Suo
  • Jet printing flexible displays
    Materials Today, Vol. 9, No. 4. (April 2006), pp. 32-37.
    by RA Street, WS Wong, SE Ready, ML Chabinyc, AC Arias, S Limb, A Salleo, R Lujan
  • Future Outlook of NAND Flash Technology for 40nm Node and Beyond
    Non-Volatile Semiconductor Memory Workshop, 2006. IEEE NVSMW 2006. 21st (2006), pp. 9-11.
    by Kinam Kim, Jungdal Choi
    posted to memory flash by kewms on 2007-02-04 23:05:08 as **
  • EUV source collector
    Emerging Lithographic Technologies X, Vol. 6151, No. 1. (2006)
    by Norbert R Bowering, Alex I Ershov, William F Marx, Oleh V Khodykin, Bjorn AM Hansson, Ernesto, Juan A Chavez, Igor V Fomenkov, David W Myers, David C Brandt
    edited by Michael J Lercel
    posted to euv lithography by kewms on 2006-12-02 23:23:54 as **
  • EUV source system development update: advancing along the path to HVM
    Emerging Lithographic Technologies IX, Vol. 5751, No. 1. (2005), pp. 248-259.
    by DW Myers, IV Fomenkov, BAM Hansson, BC Klene, DC Brandt
    edited by Scott R Mackay
    posted to euv lithography by kewms on 2006-12-02 23:20:22 as **
  • Evaluation of 193-nm immersion resist without topcoat
    Journal of Microlithography, Microfabrication, and Microsystems, Vol. 5, No. 3. (2006)
    by Yayi Wei, Nickolay Stepanenko, Antje Laessig, Lars Voelkel, Michael Sebald
    posted to immersion lithography photoresist by kewms on 2006-11-28 20:42:08 as **
  • High-RI resist polymers for 193 nm immersion lithography
    Advances in Resist Technology and Processing XXII, Vol. 5753, No. 1. (2005), pp. 827-835.
    by Andrew K Whittaker, Idriss Blakey, Heping Liu, David JT Hill, Graeme A George, Will Conley, Paul Zimmerman
    edited by John L Sturtevant
    posted to immersion lithography photoresist by kewms on 2006-11-28 17:33:19 as ** along with 1 person zamberdine
  • LPP EUV source development for HVM
    Emerging Lithographic Technologies X, Vol. 6151, No. 1. (2006)
    by Bjorn AM Hansson, Igor V Fomenkov, Norbert R Bowering, Alex I Ershov, William N Partlo, David W Myers, Oleh V Khodykin, Alexander N Bykanov, Curtis L Rettig, Jerzy R Hoffman, Ernesto, Rod D Simmons, Juan A Chavez, William F Marx, David C Brandt
    edited by Michael J Lercel
    posted to euv lithography by kewms on 2006-11-28 17:31:34 as **
  • High-index materials for 193 nm immersion lithography
    Optical Microlithography XVIII, Vol. 5754, No. 1. (2004), pp. 611-621.
    by John H Burnett, Simon G Kaplan, Eric L Shirley, Paul J Tompkins, James E Webb
    edited by Bruce W Smith
    posted to immersion lithography by kewms on 2006-11-28 17:28:11 as **
  • Toward Manufacturing Low-Cost, Large-Area Electronics
    MRS Bulletin, Vol. 31, No. 6. (June 2006), pp. 471-475.
    by Marc Chason, Daniel R Gamota, Paul W Brazis, Krishna Kalyanasundaram, Jie Zhang, Keryn K Lian, Robert Croswell
    posted to electronics printable by kewms on 2006-11-16 18:15:17 as read
  • Multiscale modeling of [theta]′ precipitation in Al-Cu binary alloys
    Acta Materialia, Vol. 52, No. 10. (7 June 2004), pp. 2973-2987.
    posted to models multiscale by kewms on 2006-10-27 23:19:01 as ** along with 1 person saswata
  • COMPUTATIONAL MATERIALS SCIENCE: Predicting Properties from Scratch
    Science, Vol. 280 (15 May 1998), pp. 1099-1100.
    by Gerbrand Ceder
    posted to computational materials science by kewms on 2006-10-27 23:16:03 as **
  • TranSIESTA: A Spice for Molecular Electronics
    Ann NY Acad Sci, Vol. 1006, No. 1. (1 December 2003), pp. 212-226.
    by Kurt Stokbro, Jeremy Taylor, Mads Brandbyge, Pablo Ordejon
    posted to electronics models molecular by kewms on 2006-10-27 23:10:28 as **
  • Molecular Electronics III
    Vol. 1006
    posted to electronics molecular by kewms on 2006-10-27 23:08:35 as **
  • High-pressure phases of CaCO3: Crystal structure prediction and experiment
    Earth and Planetary Science Letters, Vol. 241, No. 1-2. (15 January 2006), pp. 95-103.
    by Artem R Oganov, Colin W Glass, Shigeaki Ono
    posted to crystal models structure by kewms on 2006-10-27 23:04:37 as **
  • Symmetry-general least-squares extraction of elastic coefficients from ab initio total energy calculations
    Physical Review B, Vol. 63, No. 17. (29 March 2001), 174103.
    by Y Le Page, Paul Saxe
    posted to coefficients elastic models by kewms on 2006-10-27 22:59:25 as **
  • Ab initio calculations of elastic and magnetic properties of Fe, Co, Ni, and Cr crystals under isotropic deformation
    Physical Review B (Condensed Matter and Materials Physics), Vol. 67, No. 3. (2003)
    by M Cerny, J Pokluda, M Sob, M Friak, P Sandera
    posted to electronic models structure by kewms on 2006-10-27 22:58:22 as **
  • Ab initio theory of perpendicular magnetotransport in metallic multilayers
    Physical Review B, Vol. 62, No. 22. (1 December 2000), 15084.
    posted to magnetotransport models by kewms on 2006-10-27 22:57:06 as **
  • Electronic structure of II[sup B]-VI semiconductors in the GW approximation
    Physical Review B (Condensed Matter and Materials Physics), Vol. 71, No. 4. (2005)
    by A Fleszar, W Hanke
    posted to ii-vi models semiconductor by kewms on 2006-10-27 22:56:20 as **
  • Optimized nonorthogonal localized orbitals for linear scaling quantum Monte Carlo calculations
    Physical Review B (Condensed Matter and Materials Physics), Vol. 71, No. 12. (2005)
    by Fernando A Reboredo, Andrew J Williamson
    posted to carlo models monte by kewms on 2006-10-27 22:55:23 as **
  • Two-Dimensional Self-Assembly of Supramolecular Clusters and Chains
    Physical Review Letters, Vol. 83, No. 2. (12 July 1999), 324.
    by Matthias Bã¶hringer, Karina Morgenstern, Wolf-Dieter Schneider, Richard Berndt, Francesco Mauri, Alessandro De Vita, Roberto Car
    posted to models self-assembly supramolecular by kewms on 2006-10-27 22:54:14 as **
  • “Learn on the Fly”: A Hybrid Classical and Quantum-Mechanical Molecular Dynamics Simulation
    Physical Review Letters, Vol. 93, No. 17. (2004)
    by Gabor Csanyi, T Albaret, MC Payne, A De Vita
    posted to dynamics molecular by kewms on 2006-10-27 22:53:23 as ** along with 1 person loison
  • Molecular Geometry Optimization with a Genetic Algorithm
    Physical Review Letters, Vol. 75, No. 2. (10 July 1995), 288.
    by DM Deaven, KM Ho
    posted to algorithms c60 dft genetic by kewms on 2006-10-27 22:51:56 as **
  • Technology for sub-50nm DRAM and NAND flash manufacturing
    Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International (2005), pp. 323-326.
    by Kinam Kim
    posted to flash memory by kewms on 2006-09-27 21:34:46 as read
  • Non-volatile memory technologies for beyond 2010
    VLSI Circuits, 2005. Digest of Technical Papers. 2005 Symposium on (2005), pp. 156-159.
    by Yunseung Shin
    posted to flash memory by kewms on 2006-09-27 21:33:08 as **
  • A single-sided PHINES SONOS memory featuring high-speed and low-power applications
    Electron Device Letters, IEEE, Vol. 27, No. 2. (2006), pp. 127-129.
    by Jau-Yi Wu, Ming-Hsiu Lee, Tzu-Hsuan Hsu, Hsiang-Lan Lung, Rich Liu, Chih-Yuan Lu
    posted to flash memory by kewms on 2006-09-27 21:29:27 as **
  • Impact of metal work function on memory properties of charge-trap flash memory devices using fowler-nordheim P/E mode
    Electron Device Letters, IEEE, Vol. 27, No. 6. (2006), pp. 486-488.
    by Sanghun Jeon, Jeong H Han, Junghoon Lee, Sangmoo Choi, Hyunsang Hwang, Chungwoo Kim
    posted to charge-trap flash memory by kewms on 2006-09-26 21:59:06 as **
  • High work-function metal gate and high-/spl kappa/ dielectrics for charge trap flash memory device applications
    Electron Devices, IEEE Transactions on, Vol. 52, No. 12. (2005), pp. 2654-2659.
    by Sanghun Jeon, Jeong H Han, Jung H Lee, Sangmoo Choi, Hyunsang Hwang, Chungwoo Kim
    posted to charge-trap flash memory by kewms on 2006-09-26 21:58:21 as ***
  • Sb-Se-based phase-change memory device with lower power and higher speed operations
    Electron Device Letters, IEEE, Vol. 27, No. 6. (2006), pp. 445-447.
    by Sung-Min Yoon, Nam-Yeal Lee, Sang-Ouk Ryu, Kyu-Jeong Choi, YS Park, Seung-Yun Lee, Byoung-Gon Yu, Myung-Jin Kang, Se-Young Choi, M Wuttig
    posted to memory phase-change power by kewms on 2006-09-26 21:34:28 as **
  • A nonvolatile memory based on reversible phase changes between fcc and hcp
    Electron Device Letters, IEEE, Vol. 26, No. 5. (2005), pp. 286-288.
    by Dong-Ho Ahn, Dae-Hwan Kang, Byung-Ki Cheong, Hyuk-Soon Kwon, Min-Ho Kwon, Tae-Yeon Lee, Jeung-Hyun Jeong, Taek S Lee, In H Kim, Ki-Bum Kim
    posted to memory phase-change by kewms on 2006-09-26 20:33:12 as **
  • Reliability study of phase-change nonvolatile memories
    Device and Materials Reliability, IEEE Transactions on, Vol. 4, No. 3. (2004), pp. 422-427.
    posted to memory phase-change reliability by kewms on 2006-09-26 20:31:09 as **
  • Electronic switching effect and phase-change transition in chalcogenide materials
    Electron Device Letters, IEEE, Vol. 25, No. 10. (2004), pp. 684-686.
    posted to memory phase-change by kewms on 2006-09-26 20:30:14 as **
  • Analysis of phase distribution in phase-change nonvolatile memories
    Electron Device Letters, IEEE, Vol. 25, No. 7. (2004), pp. 507-509.
    posted to memory phase-change by kewms on 2006-09-26 20:28:47 as **
  • Low-field amorphous state resistance and threshold voltage drift in chalcogenide materials
    Electron Devices, IEEE Transactions on, Vol. 51, No. 5. (2004), pp. 714-719.
    posted to memory phase-change by kewms on 2006-09-26 20:27:47 as **
  • Electronic switching in phase-change memories
    Electron Devices, IEEE Transactions on, Vol. 51, No. 3. (2004), pp. 452-459.
    posted to memory phase-change by kewms on 2006-09-26 20:26:20 as ***
  • Critical area based yield prediction using in-line defect classification information [DRAMs]
    Advanced Semiconductor Manufacturing Conference and Workshop, 2000 IEEE/SEMI (2000), pp. 83-88.
    by J Segal, A Sagatelian, B Hodgkins, Ben Chu, T Singh, H Berman
    posted to semiconductors yield by kewms on 2006-09-11 02:18:07 as **
  • Burn-in failures and local region yield: an integrated field-reliability model
    VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001 (2001), pp. 326-332.
    by TS Barnett, AD Singh, VP Nelson
    posted to reliability semiconductors yield by kewms on 2006-09-10 23:24:57 as **
  • Estimating burn-in fall-out for redundant memory
    Test Conference, 2001. Proceedings. International (2001), pp. 340-347.
    by TS Barnett, AD Singh, VP Nelson
    posted to memory reliability yield by kewms on 2006-09-10 23:24:03 as **
  • Microprocessor reliability performance as a function of die location for a 0.25 μ, five layer metal CMOS logic process
    Reliability Physics Symposium Proceedings, 1999. 37th Annual. 1999 IEEE International (1999), pp. 1-11.
    by WC Riordan, R Miller, JM Sherman, J Hicks
    posted to reliability semiconductors yield by kewms on 2006-09-10 23:01:22 as **
  • Note: You may cite this page as: http://www.citeulike.org/user/kewms

    Result page: 1 2 3 4 5 6 Next RIS BibTeX RSS
    CiteULike organises scholarly (or academic) papers or literature and provides bibliographic (which means it makes bibliographies) for universities and higher education establishments. It helps undergraduates and postgraduates. People studying for PhDs or in postdoctoral (postdoc) positions. The service is similar in scope to EndNote or RefWorks or any other reference manager like BibTeX, but it is a social bookmarking service for scientists and humanities researchers.