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Journal of Physics: Condensed Matter, Vol. 21, No. 31. (10 Oct 2012), 314013, doi:10.1088/0953-8984/21/31/314013 Key: citeulike:11462176
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We have used energy filtered x-ray photoelectron emission microscopy (XPEEM) and synchrotron radiation to measure the grain orientation dependence of the work function of a sintered niobium doped strontium titanate ceramic. A significant spread in work function values is found. Grain orientation and surface reducing/oxidizing conditions are the main factors in determining the work function. Energy filtered XPEEM looks ideally suited for analysis of other technologically interesting polycrystalline samples.
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