mrsmond's library 417 articles Export

	Combating digital noise in high speed ULSI circuits using binary BCH encoding [My Copy] Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on, Vol. 4 (06 August 2002), pp. 13-16 vol.4. by D. Pamunuwa, Li-Rong Zheng, Hannu Tenhunen posted to interconnect error-correction by mrsmond on 2009-09-23 12:14:08 as
	Dynamic Voltage Scaling with Links for Power Optimization of Interconnection Networks [My Copy] High-Performance Computer Architecture, International Symposium on In High-Performance Computer Architecture, 2003. HPCA-9 2003. Proceedings. The Ninth International Symposium on, Vol. 0 (2003), pp. 91-102. by Li Shang, Li S. Peh, Niraj K. Jha posted to interconnect energy-analysis dynamic-voltage-scaling by mrsmond on 2009-09-10 12:09:26 as along with 1 person dtsamis
	Modeling and Optimization for Soft-Error Reliability of Sequential Circuits [My Copy] Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on In Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, Vol. 27, No. 5. (2008), pp. 803-816. by N. Miskov-Zivanov, D. Marculescu posted to transient-faults soft-error simulation modeling by mrsmond on 2009-09-10 11:43:04 as
	What it's like to be a POPL referee [My Copy] SIGACT News, Vol. 17, No. 4. (1986), pp. 50-51. by M. N. Wegman posted to not-related-to-engd by mrsmond on 2009-09-10 11:36:08 as
	Scaling and soft errors: Moore of the same for SOI ? [My Copy] SOI Conference, 2008. SOI. IEEE International In SOI Conference, 2008. SOI. IEEE International (2008), pp. 129-130. by M. L. Alles, D. R. Ball, L. W. Massengill, R. D. Schrimpf, R. A. Reed, B. L. Bhuva posted to trend soi soft-error shrinking by mrsmond on 2009-09-10 10:44:58 as
	Toward achieving energy efficiency in presence of deep submicron noise [My Copy] Very Large Scale Integration (VLSI) Systems, IEEE Transactions on In Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, Vol. 8, No. 4. (2000), pp. 379-391. by R. Hegde, N. R. Shanbhag posted to energy-analysis error-correction fault-tolerance interconnect by mrsmond on 2009-07-24 16:01:27 as
	Online reconfigurable self-timed links for fault tolerant NoC [My Copy] VLSI Design, Vol. 2007 (2007) by T. Lehtonen, P. Liljeberg, J. Plosila posted to fault-tolerance interconnect network-on-chip reliability by mrsmond on 2009-07-24 15:55:36 as
	A fault model notation and error-control scheme for switch-to-switch buses in a network-on-chip [My Copy] In CODES+ISSS '03: Proceedings of the 1st IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis (2003), pp. 188-193. by Heiko Zimmer, Axel Jantsch posted to fault-tolerance interconnect network-on-chip reliability by mrsmond on 2009-07-24 15:52:46 as
	Quality-of-service and error control techniques for mesh-based network-on-chip architectures [My Copy] Integration, the VLSI Journal, Vol. 38, No. 3. (January 2005), pp. 353-382. by P. Vellanki, N. Banerjee, K. Chatha posted to fault-tolerance interconnect reliability transient-faults by mrsmond on 2009-07-24 15:50:56 as
	Coding for system-on-chip networks: a unified framework [My Copy] Very Large Scale Integration (VLSI) Systems, IEEE Transactions on In Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, Vol. 13, No. 6. (2005), pp. 655-667. by S. R. Sridhara, N. R. Shanbhag posted to interconnect reliability by mrsmond on 2009-07-24 15:45:19 as
	IBM S/390 parallel enterprise server G5 fault tolerance: A historical perspective [My Copy] Journal of Research, Vol. 43, No. 5/6. (1999) by L. Spainhower, T. A. Gregg posted to cpu fault-tolerance ibm by mrsmond on 2009-07-24 15:37:08 as
	Designing reliable systems from unreliable components: the challenges of transistor variability and degradation [My Copy] Micro, IEEE In Micro, IEEE, Vol. 25, No. 6. (2005), pp. 10-16. by S. Borkar posted to ageing reliability soft-errors variability by mrsmond on 2009-07-24 15:31:03 as along with 3 people naoya elsantosneto ahgharaibeh
	Raced profiles: efficient selection of competing compiler optimizations [My Copy] In LCTES '09: Proceedings of the 2009 ACM SIGPLAN/SIGBED conference on Languages, compilers, and tools for embedded systems (2009), pp. 50-59. by Hugh Leather, Michael O'Boyle, Bruce Worton posted to benchmarking compiler interesting-rating--4 statistics by mrsmond on 2009-07-20 13:24:22 as
	Technology Scaling Trends and Accelerated Testing for Soft Errors in Commercial Silicon Devices [My Copy] IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International, Vol. 0 (2003), 4. by Robert Baumann posted to review shrinking silicon soft-errors testing trend by mrsmond on 2009-06-09 16:32:19 as
	Soft Error Characterization and Modeling Methodologies at TI: Past, Present, and Future [My Copy] (October 2000) by R. Baumann posted to modeling physics semiconductor soft-errors tutorial by mrsmond on 2009-06-09 16:26:44 as
	Soft errors in advanced semiconductor devices-part I: the three radiation sources [My Copy] Device and Materials Reliability, IEEE Transactions on In Device and Materials Reliability, IEEE Transactions on, Vol. 1, No. 1. (2001), pp. 17-22. by R. C. Baumann posted to physics review semiconductor soft-errors by mrsmond on 2009-06-09 16:20:11 as
	Single event upset at ground level [My Copy] Nuclear Science, IEEE Transactions on In Nuclear Science, IEEE Transactions on, Vol. 43, No. 6. (1996), pp. 2742-2750. by E. Normand posted to engd evidence--important experiment memory neutron seu by mrsmond on 2009-06-09 12:14:31 as along with 1 person naoya
	A defect- and fault-tolerant architecture for nanocomputers [My Copy] Nanotechnology, Vol. 14, No. 2. (2003), pp. 224-230. by Jie Han, Pieter Jonker posted to fault-tolerance nanotech not-related-to-engd by mrsmond on 2009-05-19 14:05:15 as
	Implementing high availability memory with a duplication cache [My Copy] In MICRO '08: Proceedings of the 2008 41st IEEE/ACM International Symposium on Microarchitecture (2008), pp. 71-82. by Nidhi Aggarwal, James E. Smith, Kewal K. Saluja, Norman P. Jouppi, Parthasarathy Ranganathan posted to availability fault-tolerance memory redundancy servers testtag by mrsmond on 2009-05-15 14:42:56 as
	The impact of architectural uncertainty on product introduction in dispersed environments [My Copy] Engineering Management Conference, 2002. IEMC '02. 2002 IEEE International In Engineering Management Conference, 2002. IEMC '02. 2002 IEEE International, Vol. 2 (2002), pp. 617-622 vol.2. by M. E. Schofield, M. Gregory posted to business not-related-to-engd by mrsmond on 2009-05-12 16:15:30 as
	Reflecting human values in the digital age [My Copy] Commun. ACM, Vol. 52, No. 3. (2009), pp. 58-66. by Abigail Sellen, Yvonne Rogers, Richard Harper, Tom Rodden posted to future hci not-related-to-engd by mrsmond on 2009-05-12 15:46:40 as along with 5 people tmar LinaMelo yenching lucybuykx now
	Autonomy, Interdependence, and Social Control: NASA and the Space Shuttle Challenger [My Copy] Administrative Science Quarterly, Vol. 35, No. 2. (1990), pp. 225-257. by Diane Vaughan posted to not-related-to-engd organisation theory by mrsmond on 2009-05-12 11:23:39 as
	SPARC64 V Microprocessor Provides Foundation for PRIMEPOWER Performance and Reliability Leadership [My Copy] (September 2002) posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:56:00 as
	Soft Errors in Electronic Memory - A White Paper [My Copy] (January 2004) posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:56:00 as
	ARM1156T2F-S Technical Reference Manual [My Copy] (2007) posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:56:00 as
	ARM AMBA 3 AXI Specification (available at http://www.arm.com/products/solutions/axi_spec.html) [My Copy] posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:56:00 as
	Dependability: Basic Concepts and Terminology [My Copy] (1992) edited by Laprie, A. Avizienis, H. Kopetz posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:56:00 as
	Accelerated testing for cosmic soft-error rate [My Copy] In IBM Journal of Research and Development, Vol. 40, No. 1. (January 1996), pp. 51-72. by Et posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:56:00 as
	Effect of Cosmic Rays on Computer Memories [My Copy] In Science, Vol. 206, No. 4420. (1979), pp. 776-788. by J. F. Ziegler, W. A. Lanford posted to engd evidence--interesting importance--high memory physics semiconductor soft-error by mrsmond on 2009-05-08 16:56:00 as
	Trends in Electronic Reliability - Effects of Terrestrial Cosmic Rays [My Copy] by J. F. Ziegler posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:56:00 as
	IBM experiments in soft fails in computer electronics (1978-1994) [My Copy] In IBM Journal of Research and Development, Vol. 40, No. 1. (January 1996), pp. 3-18. by J. F. Ziegler, H. W. Curtis, H. P. Muhlfeld, et al.C. J. Montrose, B. Chin, M. Nicewicz, C. A. Russell, W. Y. Wang, L. B. Freeman, P. Hosier, Others posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:56:00 as
	Terrestrial cosmic rays [My Copy] In IBM Journal of Research and Development, Vol. 40, No. 1. (January 1996), pp. 19-39. by J. Ziegler posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:56:00 as
	Terrestrial cosmic ray intensities [My Copy] In IBM Journal of Research and Development, Vol. 42, No. 1. (January 1998), pp. 117-139. by J. Ziegler posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:59 as
	The effects of energy management on reliability in real-time embedded systems [My Copy] In Computer Aided Design, 2004. ICCAD-2004. IEEE/ACM International Conference on (Nov 2004), pp. 35-40. by Dakai Zhu, R. Melhem, D. Mosse posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:59 as
	Cost-effective radiation hardening technique for combinational logic [My Copy] In Computer Aided Design, 2004. ICCAD-2004. IEEE/ACM International Conference on (Nov 2004), pp. 100-106. by Quming Zhou, K. Mohanram posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:59 as
	Artificial innate immune system: An instant defence layer of embryonics [My Copy] Proc. of the Third International Conference on Artificial Immune Systems, Vol. 3239 (2004), pp. 302-315. by X. Zhang, G. Dragffy, A. G. Pipe, Q. M. Zhu posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:59 as
	A soft error rate analysis (SERA) methodology [My Copy] In Computer Aided Design, 2004. ICCAD-2004. IEEE/ACM International Conference on (Nov 2004), pp. 111-118. by Ming Zhang, N. R. Shanbhag posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:59 as
	Finite state machine synthesis with concurrent error detection [My Copy] In Test Conference, 1999. Proceedings. International (Sept 1999), pp. 672-679. by Chaohuang Zeng, N. Saxena, E. J. Mccluskey posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:59 as
	Future trend of microprocessor design [My Copy] In Solid-State Circuits Conference, 2002. ESSCIRC 2002. Proceedings of the 28th European (Sept 2002), pp. 43-46. by R. Yung, S. Rusu, K. Shoemaker posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:59 as
	Exploiting idle cycles for algorithm level re-computing [My Copy] In Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings (March 2002), pp. 842-846. by Kaijie Wu, R. Karri posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:59 as
	CMOS scaling beyond the 100-nm node with silicon-dioxide-based gate dielectrics [My Copy] IBM Journal of Research and Development, Vol. 46, No. 2. (2002), pp. 287-298. by E. Y. Wu, E. J. Nowak, A. Vayshenker, W. L. Lai, D. L. Harmon posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:59 as
	Techniques to Reduce the Soft Error Rate of a High-Performance Microprocessor [My Copy] by C. Weaver, J. Emer, S. Mukherjee, S. Reinhardt posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:59 as
	A fault tolerant approach to microprocessor design [My Copy] In Dependable Systems and Networks, 2001. Proeedings. The International Conference on (July 2001), pp. 411-420. by C. Weaver, T. Austin posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:59 as
	Characterizing Logical Masking Of Transient Faults At The Microarchitectural And Architectural Levels [My Copy] (2003) by N. J. Wang posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:59 as
	Characterizing the effects of transient faults on a high-performance processor pipeline [My Copy] In Dependable Systems and Networks, 2004 International Conference on (June 2004), pp. 61-70. by N. J. Wang, J. Quek, T. M. Rafacz, S. J. Patel posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:59 as
	Transient-fault recovery using simultaneous multithreading [My Copy] In Computer Architecture, 2002. Proceedings. 29th Annual International Symposium on (May 2002), pp. 87-98. by T. N. Vijaykumar, I. Pomeranz, K. Cheng posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:59 as
	Online testable reversible logic circuit design using NAND blocks [My Copy] In Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. 19th IEEE International Symposium on (Oct 2004), pp. 324-331. by D. P. Vasudevan, P. K. Lala, J. P. Parkerson posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:59 as
	Evaluating Fault Tolerant Techniques in Modern Microprocessors [My Copy] (2004) by S. Valia, D. Sachdev posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:59 as
	Impact of Parameter Variations on Circuits and Microarchitecture [My Copy] IEEE Micro, Vol. 26, No. 6. (2006), pp. 30-39. by Osman S. Unsal, James W. Tschanz, Keith Bowman, et al.Vivek De, Xavier Vera, Antonio Gonzalez, Oguz Ergin posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:58 as
	Evolutionary algorithm for the promotion of evolvable hardware [My Copy] In Computers and Digital Techniques, IEE Proceedings-, Vol. 151, No. 4. (July 2004), pp. 267-275. by A. M. Tyrrell, R. A. Krohling, Y. Zhou posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:58 as

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