Analysis of single-event effects in combinational logic-simulation of the AM2901 bitslice processor Export

@article{citeulike:1821346, abstract = {Using SEUTool (a synthesized VHDL based simulator of single-event fault propagation in combinational circuitry), we have performed a single-event study on a custom-designed CMOS AM2901, a 4-bit bit-slice processor. Analysis shows interesting general trends for single-event upset effects in complex combinational/sequential circuits}, author = {Massengill, L. W. and Baranski, A. E. and Van Nort, D. O. and Meng, J. and Bhuva, B. L.}, booktitle = {Nuclear Science, IEEE Transactions on}, citeulike-article-id = {1821346}, citeulike-linkout-0 = {http://dx.doi.org/10.1109/23.903816}, citeulike-linkout-1 = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=903816}, doi = {10.1109/23.903816}, journal = {Nuclear Science, IEEE Transactions on}, keywords = {combinational-logic, fault-analysis, fault-injection, ser, simulation, trend}, number = {6}, pages = {2609--2615}, posted-at = {2007-10-25 16:30:05}, priority = {2}, title = {Analysis of single-event effects in combinational logic-simulation of the AM2901 bitslice processor}, url = {http://dx.doi.org/10.1109/23.903816}, volume = {47}, year = {2000} }

TY - JOUR ID - citeulike:1821346 L3 - citeulike-article-id:1821346 N2 - Using SEUTool (a synthesized VHDL based simulator of single-event fault propagation in combinational circuitry), we have performed a single-event study on a custom-designed CMOS AM2901, a 4-bit bit-slice processor. Analysis shows interesting general trends for single-event upset effects in complex combinational/sequential circuits IS - 6 JF - Nuclear Science, IEEE Transactions on EP - 2615 TI - Analysis of single-event effects in combinational logic-simulation of the AM2901 bitslice processor VL - 47 T2 - Nuclear Science, IEEE Transactions on SP - 2609 KW - combinational-logic KW - fault-analysis KW - fault-injection KW - ser KW - simulation KW - trend AU - Massengill, LW AU - Baranski, AE AU - Van Nort, DO AU - Meng, J AU - Bhuva, BL PY - 2000/// UR - http://dx.doi.org/10.1109/23.903816 ER -