Single event upset in avionics Export

@article{citeulike:1824479, abstract = {Data from military/experimental flights and laboratory testing indicate that typical non-radiation-hardened 64 K and 256 K static random access memories (SRAMs) can experience a significant soft upset rate at aircraft altitudes due to energetic neutrons created by cosmic ray interactions in the atmosphere. It is suggested that error detection and correction circuitry be considered for all avionics designs containing large amounts of semiconductor memory}, author = {Taber, A. and Normand, E.}, booktitle = {Nuclear Science, IEEE Transactions on}, citeulike-article-id = {1824479}, citeulike-linkout-0 = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=212327}, journal = {Nuclear Science, IEEE Transactions on}, keywords = {aerospace, experiment, seu}, number = {2}, pages = {120--126}, posted-at = {2007-10-26 10:59:45}, priority = {2}, title = {Single event upset in avionics}, url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=212327}, volume = {40}, year = {1993} }

TY - JOUR ID - citeulike:1824479 L3 - citeulike-article-id:1824479 N2 - Data from military/experimental flights and laboratory testing indicate that typical non-radiation-hardened 64 K and 256 K static random access memories (SRAMs) can experience a significant soft upset rate at aircraft altitudes due to energetic neutrons created by cosmic ray interactions in the atmosphere. It is suggested that error detection and correction circuitry be considered for all avionics designs containing large amounts of semiconductor memory IS - 2 JF - Nuclear Science, IEEE Transactions on EP - 126 TI - Single event upset in avionics VL - 40 T2 - Nuclear Science, IEEE Transactions on SP - 120 KW - aerospace KW - experiment KW - seu AU - Taber, A AU - Normand, E PY - 1993/// UR - http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=212327 ER -