An efficient static algorithm for computing the soft error rates of combinational circuits Export

@inproceedings{citeulike:1847861, address = {3001 Leuven, Belgium, Belgium}, author = {Rao, Rajeev R. and Chopra, Kaviraj and Blaauw, David and Sylvester, Dennis}, booktitle = {DATE '06: Proceedings of the conference on Design, automation and test in Europe}, citeulike-article-id = {1847861}, citeulike-linkout-0 = {http://portal.acm.org/citation.cfm?id=1131481.1131532}, citeulike-linkout-1 = {http://dx.doi.org/10.1109/MDT.2005.69}, citeulike-linkout-2 = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=1438282}, doi = {10.1109/MDT.2005.69}, isbn = {3981080106}, keywords = {combinational-logic, modeling, ser, static}, pages = {164--169}, posted-at = {2007-10-31 17:09:40}, priority = {3}, publisher = {European Design and Automation Association}, title = {An efficient static algorithm for computing the soft error rates of combinational circuits}, url = {http://dx.doi.org/10.1109/MDT.2005.69}, year = {2006} }

TY - CONF ID - citeulike:1847861 L3 - citeulike-article-id:1847861 SN - 3981080106 AD - 3001 Leuven, Belgium, Belgium EP - 169 TI - An efficient static algorithm for computing the soft error rates of combinational circuits PB - European Design and Automation Association T2 - DATE '06: Proceedings of the conference on Design, automation and test in Europe SP - 164 KW - combinational-logic KW - modeling KW - ser KW - static AU - Rao, Rajeev AU - Chopra, Kaviraj AU - Blaauw, David AU - Sylvester, Dennis PY - 2006/// UR - http://dx.doi.org/10.1109/MDT.2005.69 ER -