Toward achieving energy efficiency in presence of deep submicron noise Export

@article{citeulike:5251420, abstract = {Presented in this paper are: 1) information-theoretic lower bounds on energy consumption of noisy digital gates and 2) the concept of noise tolerance via coding for achieving energy efficiency in the presence of noise. In particular, lower bounds on a) circuit speed f_c and supply voltage V_dd; b) transition activity t in presence of noise; c) dynamic energy dissipation; and d) total (dynamic and static) energy dissipation are derived. A surprising result is that in a scenario where dynamic component of power dissipation dominates, the supply voltage for minimum energy operation (V_{dd, opt}) is greater than the minimum supply voltage (V_{dd, min})for reliable operation. We then propose noise tolerance via coding to approach the lower bounds on energy dissipation. We show that the lower bounds on energy for an off-chip I/O signaling example are a factor of 24\× below present day systems. A very simple Hamming code can reduce the energy consumption by a factor of 3\×, while Reed-Muller (RM) codes give a 4\× reduction in energy dissipation}, author = {Hegde, R. and Shanbhag, N. R.}, booktitle = {Very Large Scale Integration (VLSI) Systems, IEEE Transactions on}, citeulike-article-id = {5251420}, citeulike-linkout-0 = {http://dx.doi.org/10.1109/92.863617}, citeulike-linkout-1 = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=863617}, doi = {10.1109/92.863617}, journal = {Very Large Scale Integration (VLSI) Systems, IEEE Transactions on}, keywords = {energy-analysis, error-correction, fault-tolerance, interconnect}, number = {4}, pages = {379--391}, posted-at = {2009-07-24 16:01:27}, priority = {2}, title = {Toward achieving energy efficiency in presence of deep submicron noise}, url = {http://dx.doi.org/10.1109/92.863617}, volume = {8}, year = {2000} }

TY - JOUR ID - citeulike:5251420 L3 - citeulike-article-id:5251420 N2 - Presented in this paper are: 1) information-theoretic lower bounds on energy consumption of noisy digital gates and 2) the concept of noise tolerance via coding for achieving energy efficiency in the presence of noise. In particular, lower bounds on a) circuit speed f_c and supply voltage V_dd; b) transition activity t in presence of noise; c) dynamic energy dissipation; and d) total (dynamic and static) energy dissipation are derived. A surprising result is that in a scenario where dynamic component of power dissipation dominates, the supply voltage for minimum energy operation (V_{dd, opt}) is greater than the minimum supply voltage (V_{dd, min})for reliable operation. We then propose noise tolerance via coding to approach the lower bounds on energy dissipation. We show that the lower bounds on energy for an off-chip I/O signaling example are a factor of 24× below present day systems. A very simple Hamming code can reduce the energy consumption by a factor of 3×, while Reed-Muller (RM) codes give a 4× reduction in energy dissipation IS - 4 JF - Very Large Scale Integration (VLSI) Systems, IEEE Transactions on EP - 391 TI - Toward achieving energy efficiency in presence of deep submicron noise VL - 8 T2 - Very Large Scale Integration (VLSI) Systems, IEEE Transactions on SP - 379 KW - energy-analysis KW - error-correction KW - fault-tolerance KW - interconnect AU - Hegde, R AU - Shanbhag, NR PY - 2000/// UR - http://dx.doi.org/10.1109/92.863617 ER -