Combating digital noise in high speed ULSI circuits using binary BCH encoding Export

@inproceedings{citeulike:5829012, abstract = {Increased integration in deep submicron (DSM) technologies has caused very high increases in the RLC parasitics which affect the coupling of noise to signals propagating over interconnect. Error free transmission on-chip will no longer be guaranteed, This paper examines the issue of high speed signaling in DSM and proposes the use of particular BCH codes to improve the bit error rate in the face of noise. We conclude from our results that it is possible to achieve a considerable coding gain by choosing the code properly}, author = {Pamunuwa, D. and Zheng, Li-Rong and Tenhunen, Hannu}, citeulike-article-id = {5829012}, citeulike-linkout-0 = {http://dx.doi.org/10.1109/ISCAS.2000.858676}, citeulike-linkout-1 = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=858676}, day = {06}, doi = {10.1109/ISCAS.2000.858676}, journal = {Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on}, keywords = {error-correction, interconnect}, month = {August}, pages = {13--16 vol.4}, posted-at = {2009-09-23 12:14:08}, priority = {4}, title = {Combating digital noise in high speed ULSI circuits using binary BCH encoding}, url = {http://dx.doi.org/10.1109/ISCAS.2000.858676}, volume = {4}, year = {2002} }

TY - CONF ID - citeulike:5829012 L3 - citeulike-article-id:5829012 N2 - Increased integration in deep submicron (DSM) technologies has caused very high increases in the RLC parasitics which affect the coupling of noise to signals propagating over interconnect. Error free transmission on-chip will no longer be guaranteed, This paper examines the issue of high speed signaling in DSM and proposes the use of particular BCH codes to improve the bit error rate in the face of noise. We conclude from our results that it is possible to achieve a considerable coding gain by choosing the code properly JF - Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on EP - 16 vol.4 TI - Combating digital noise in high speed ULSI circuits using binary BCH encoding VL - 4 SP - 13 KW - error-correction KW - interconnect AU - Pamunuwa, D AU - Zheng, Li-Rong AU - Tenhunen, Hannu PY - 2002/08/06/ UR - http://dx.doi.org/10.1109/ISCAS.2000.858676 ER -