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mrsmond's Aitken:R [2 articles] Export Sort

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Modeling Soft-Error Susceptibility for IP Blocks

by R. Aitken, B. Hold

posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:43 as

Impact of Technology and Voltage Scaling on the Soft Error Susceptibility in Nanoscale CMOS

Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on In Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on (2008), pp. 114-122.

by Vikas Chandra, Robert Aitken

posted to arm circuit-level modeling ser trend by mrsmond on 2008-11-20 12:35:57 as

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