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mrsmond's Bhuva:BL [2 articles] Export

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Scaling and soft errors: Moore of the same for SOI ?

SOI Conference, 2008. SOI. IEEE International In SOI Conference, 2008. SOI. IEEE International (2008), pp. 129-130.

by M. L. Alles, D. R. Ball, L. W. Massengill, R. D. Schrimpf, R. A. Reed, B. L. Bhuva

posted to soft-errors trend soi shrinking by mrsmond on 2009-09-10 10:44:58 as

Analysis of single-event effects in combinational logic-simulation of the AM2901 bitslice processor

Nuclear Science, IEEE Transactions on In Nuclear Science, IEEE Transactions on, Vol. 47, No. 6. (2000), pp. 2609-2615.

by L. W. Massengill, A. E. Baranski, D. O. Van Nort, J. Meng, B. L. Bhuva

posted to combinational-logic fault-analysis fault-injection ser simulation trend by mrsmond on 2007-10-25 16:30:05 as

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