mrsmond's Maiz:J [5 articles] Export

Recent papers posted to mrsmond's library by the author Maiz:J. You can also see everyone's Maiz:J.

	Radiation-Induced Soft Error Rates of Advanced CMOS Bulk Devices [My Copy] In IEEE International Reliability Physics Symposium Proceedings, 2006 (March 2006), pp. 217-225. by N. Seifert, P. Slankard, M. Kirsch, et al.B. Narasimham, V. Zia, C. Brookreson, A. Vo, S. Mitra, B. Gill, J. Maiz posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:56 as
	Neutron soft error rate measurements in a 90-nm CMOS process and scaling trends in SRAM from 0.25-um to 90-nm generation [My Copy] In Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International (Dec 2003) by P. Hazucha, T. Karnik, J. Maiz, et al.S. Walstra, B. Bloechel, J. Tschanz, G. Dermer, S. Hareland, P. Armstrong, S. Borkar posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:49 as
	Impact of CMOS process scaling and SOI on the soft error rates of logic processes [My Copy] In VLSI Technology, 2001. Digest of Technical Papers. 2001 Symposium on (June 2001), pp. 73-74. by S. Hareland, J. Maiz, M. Alavi, K. Mistry, S. Walsta, Changhong Dai posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:48 as
	Intel Perspective of SER [My Copy] (October 2000) by S. Hareland, C. Dai, S. Walstra, J. Maiz posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:48 as
	Radiation-Induced Soft Error Rates of Advanced CMOS Bulk Devices [My Copy] Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International In Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International (2006), pp. 217-225. by N. Seifert, P. Slankard, M. Kirsch, et al.B. Narasimham, V. Zia, C. Brookreson, A. Vo, S. Mitra, B. Gill, J. Maiz posted to importance--high ser shrinking trend by mrsmond on 2007-03-29 17:48:33 as along with 1 person naoya

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jabref-file-import-09-05-08	272
fault-tolerance	31
ser	18
modeling	17
reliability	17
architecture	16
trend	15
toread	14
soft-errors	12
combinational-logic	12
computer	11
transient-faults	11
review	11
have-paper-copy	10
randd-reading-group	10
engd	10
seu	10
memory	10
fault-analysis	9
fault-injection	9
simulation	9
theory	9
system-level	9
not-related-to-engd	9
variability	9
semiconductor	9
on-chip-communication	8
energy-analysis	8
circuit-level	8
physics	7
importance--high	7
interconnect	7
error-correction	6
cpu	6
fault-detection	6
microarchitecture	6
pers-reading-group	6
management	5
circuit	5
fault-avoidance	5
network-on-chip	5
dynamic-voltage-scaling	5
maths	5
design	5
verification	5
shrinking	5
formal-methods	5
computing-history	5
arm	4
importance--seminal	4
error-detection	4
amba	4
statistics	4
razor	3
interesting-rating--4	3
alpha-particles	3
business	3
computer-science	3
neutron	3
silicon	3
skim-read	3
interesting-rating--1	3
multiprocessor	3
self-checking	2
interesting-rating--3	2
formal-logic	2
have-electronic-copy	2
dependability	2
silicon-on-insulator	2
graph-theory	2
aerospace	2
software	2
for--nafe	2
off-chip-communication	2
fpga	2
experiment	2
security	2
tutorial	2
static	2
design-for-test	2
ibm	2
hardware	1
redundancy	1
nanotech	1
crosstalk	1
servers	1
debug	1
prj--fabric-reliability	1
survey	1
gals	1
benchmarking	1
error	1
interesting-rating--2	1
ageing	1
artificial-intelligence	1
marketing	1
software-level	1
quantum-computing	1
compiler	1
soi	1
electromigration	1
organisation	1
combinatorial-logic	1
super-computing	1
importance-med	1
computer-history	1
government	1
future	1
planning	1
availability	1
evidence--interesting	1
testtag	1
manufacture-process	1
esd	1
ras	1
evidence--important	1
hci	1
intermittent-faults	1
automata-theory	1
automotive	1
innovation	1
testing	1
combinatorics	1
microcontroller	1
proton	1

mrsmond's Maiz:J [5 articles] Export

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