mrsmond's Seifert:N [9 articles] Export

Recent papers posted to mrsmond's library by the author Seifert:N. You can also see everyone's Seifert:N.

	Timing vulnerability factors of sequentials [My Copy] Device and Materials Reliability, IEEE Transactions on, Vol. 4, No. 3. (Sept 2004), pp. 516-522. by N. Seifert, N. Tam posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:56 as
	Radiation-Induced Soft Error Rates of Advanced CMOS Bulk Devices [My Copy] In IEEE International Reliability Physics Symposium Proceedings, 2006 (March 2006), pp. 217-225. by N. Seifert, P. Slankard, M. Kirsch, et al.B. Narasimham, V. Zia, C. Brookreson, A. Vo, S. Mitra, B. Gill, J. Maiz posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:56 as
	Historical trend in alpha-particle induced soft error rates of the Alpha microprocessor [My Copy] In Reliability Physics Symposium, 2001. Proceedings. 39th Annual. 2001 IEEE International (April 2001), pp. 259-265. by N. Seifert, D. Moyer, N. Leland, R. Hokinson posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:56 as
	SER Scaling Trends [My Copy] (April 2006) by N. Seifert posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:56 as
	Chip-level soft error estimation method [My Copy] Device and Materials Reliability, IEEE Transactions on, Vol. 5, No. 3. (Sept 2005), pp. 365-381. by H. T. Nguyen, Y. Yagil, N. Seifert, M. Reitsma posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:54 as
	Logic soft errors: a major barrier to robust platform design [My Copy] In Test Conference, 2005. Proceedings. ITC 2005. IEEE International (Nov 2005) by S. Mitra, Ming Zhang, T. M. Mak, N. Seifert, V. Zia, Kee S. Kim posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:54 as
	Robust system design with built-in soft-error resilience [My Copy] Computer, Vol. 38, No. 2. (Feb 2005), pp. 43-52. by S. Mitra, N. Seifert, M. Zhang, Q. Shi, K. S. Kim posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:54 as
	Node sensitivity analysis for soft errors in CMOS logic [My Copy] In Test Conference, 2005. Proceedings. ITC 2005. IEEE International (Nov 2005) by B. S. Gill, C. Papachristou, F. G. Wolff, N. Seifert posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:48 as
	Radiation-Induced Soft Error Rates of Advanced CMOS Bulk Devices [My Copy] Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International In Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International (2006), pp. 217-225. by N. Seifert, P. Slankard, M. Kirsch, et al.B. Narasimham, V. Zia, C. Brookreson, A. Vo, S. Mitra, B. Gill, J. Maiz posted to importance--high ser shrinking trend by mrsmond on 2007-03-29 17:48:33 as along with 1 person naoya

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jabref-file-import-09-05-08	272
fault-tolerance	31
ser	18
modeling	17
reliability	17
architecture	16
trend	15
toread	14
soft-errors	12
combinational-logic	12
computer	11
transient-faults	11
review	11
have-paper-copy	10
randd-reading-group	10
engd	10
seu	10
memory	10
fault-analysis	9
fault-injection	9
simulation	9
theory	9
system-level	9
not-related-to-engd	9
variability	9
semiconductor	9
on-chip-communication	8
energy-analysis	8
circuit-level	8
physics	7
importance--high	7
interconnect	7
error-correction	6
cpu	6
fault-detection	6
microarchitecture	6
pers-reading-group	6
management	5
circuit	5
fault-avoidance	5
network-on-chip	5
dynamic-voltage-scaling	5
maths	5
design	5
verification	5
shrinking	5
formal-methods	5
computing-history	5
arm	4
importance--seminal	4
error-detection	4
amba	4
statistics	4
razor	3
interesting-rating--4	3
alpha-particles	3
business	3
computer-science	3
neutron	3
silicon	3
skim-read	3
interesting-rating--1	3
multiprocessor	3
self-checking	2
interesting-rating--3	2
formal-logic	2
have-electronic-copy	2
dependability	2
silicon-on-insulator	2
graph-theory	2
aerospace	2
software	2
for--nafe	2
off-chip-communication	2
fpga	2
experiment	2
security	2
tutorial	2
static	2
design-for-test	2
ibm	2
hardware	1
redundancy	1
nanotech	1
crosstalk	1
servers	1
debug	1
prj--fabric-reliability	1
survey	1
gals	1
benchmarking	1
error	1
interesting-rating--2	1
ageing	1
artificial-intelligence	1
marketing	1
software-level	1
quantum-computing	1
compiler	1
soi	1
electromigration	1
organisation	1
combinatorial-logic	1
super-computing	1
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computer-history	1
government	1
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testtag	1
manufacture-process	1
esd	1
ras	1
evidence--important	1
hci	1
intermittent-faults	1
automata-theory	1
automotive	1
innovation	1
testing	1
combinatorics	1
microcontroller	1
proton	1

mrsmond's Seifert:N [9 articles] Export

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