Search all the public and authenticated articles in CiteULike.
Enter a search phrase. You can also specify

a CiteULike article id (123456),

a DOI (doi:10.1234/12345678)

or a PubMed Id (pmid:12345678).

Click Help for advanced usage.

mrsmond's Slankard:P [2 articles] Export

Recent papers posted to mrsmond's library by the author Slankard:P. You can also see everyone's Slankard:P.

Hide details

Radiation-Induced Soft Error Rates of Advanced CMOS Bulk Devices

In IEEE International Reliability Physics Symposium Proceedings, 2006 (March 2006), pp. 217-225.

by N. Seifert, P. Slankard, M. Kirsch, et al.B. Narasimham, V. Zia, C. Brookreson, A. Vo, S. Mitra, B. Gill, J. Maiz

posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:56 as

Radiation-Induced Soft Error Rates of Advanced CMOS Bulk Devices

Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International In Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International (2006), pp. 217-225.

by N. Seifert, P. Slankard, M. Kirsch, et al.B. Narasimham, V. Zia, C. Brookreson, A. Vo, S. Mitra, B. Gill, J. Maiz

posted to importance--high ser shrinking trend by mrsmond on 2007-03-29 17:48:33 as

along with 1 person naoya

Note: You may cite this page as: http://www.citeulike.org/user/mrsmond/author/Slankard:P

CiteULike organises scholarly (or academic) papers or literature and provides bibliographic (which means it makes bibliographies) for universities and higher education establishments. It helps undergraduates and postgraduates. People studying for PhDs or in postdoctoral (postdoc) positions. The service is similar in scope to EndNote or RefWorks or any other reference manager like BibTeX, but it is a social bookmarking service for scientists and humanities researchers.

jabref-file-import-09-05-08	272
fault-tolerance	31
ser	18
modeling	17
reliability	17
architecture	16
trend	15
toread	14
soft-errors	12
combinational-logic	12
computer	11
transient-faults	11
review	11
have-paper-copy	10
randd-reading-group	10
engd	10
seu	10
memory	10
fault-analysis	9
fault-injection	9
simulation	9
theory	9
system-level	9
not-related-to-engd	9
variability	9
semiconductor	9
on-chip-communication	8
energy-analysis	8
circuit-level	8
physics	7
importance--high	7
interconnect	7
error-correction	6
cpu	6
fault-detection	6
microarchitecture	6
pers-reading-group	6
management	5
circuit	5
fault-avoidance	5
network-on-chip	5
dynamic-voltage-scaling	5
maths	5
design	5
verification	5
shrinking	5
formal-methods	5
computing-history	5
arm	4
importance--seminal	4
error-detection	4
amba	4
statistics	4
razor	3
interesting-rating--4	3
alpha-particles	3
business	3
computer-science	3
neutron	3
silicon	3
skim-read	3
interesting-rating--1	3
multiprocessor	3
self-checking	2
interesting-rating--3	2
formal-logic	2
have-electronic-copy	2
dependability	2
silicon-on-insulator	2
graph-theory	2
aerospace	2
software	2
for--nafe	2
off-chip-communication	2
fpga	2
experiment	2
security	2
tutorial	2
static	2
design-for-test	2
ibm	2
hardware	1
redundancy	1
nanotech	1
crosstalk	1
servers	1
debug	1
prj--fabric-reliability	1
survey	1
gals	1
benchmarking	1
error	1
interesting-rating--2	1
ageing	1
artificial-intelligence	1
marketing	1
software-level	1
quantum-computing	1
compiler	1
soi	1
electromigration	1
organisation	1
combinatorial-logic	1
super-computing	1
importance-med	1
computer-history	1
government	1
future	1
planning	1
availability	1
evidence--interesting	1
testtag	1
manufacture-process	1
esd	1
ras	1
evidence--important	1
hci	1
intermittent-faults	1
automata-theory	1
automotive	1
innovation	1
testing	1
combinatorics	1
microcontroller	1
proton	1

mrsmond's Slankard:P [2 articles] Export

mrsmond's tags