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mrsmond's Touba:NA [2 articles] Export Sort

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	Cost-effective approach for reducing soft error failure rate in logic circuits [My Copy] In Test Conference, 2003. Proceedings. ITC 2003. International, Vol. 1 (Sept 2003), pp. 893-901. by K. Mohanram, N. A. Touba posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:54 as
	Reducing power consumption in memory ECC checkers [My Copy] Test Conference, 2004. Proceedings. ITC 2004. International In Test Conference, 2004. Proceedings. ITC 2004. International (2004), pp. 1322-1331. by S. Ghosh, S. Basu, N. A. Touba posted to energy-analysis error-correction memory by mrsmond on 2009-04-07 17:40:53 as