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mrsmond's Vo:A [2 articles] Export

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Radiation-Induced Soft Error Rates of Advanced CMOS Bulk Devices

In IEEE International Reliability Physics Symposium Proceedings, 2006 (March 2006), pp. 217-225.

by N. Seifert, P. Slankard, M. Kirsch, et al.B. Narasimham, V. Zia, C. Brookreson, A. Vo, S. Mitra, B. Gill, J. Maiz

posted to jabref-file-import-09-05-08 by mrsmond on 2009-05-08 16:55:56 as

Radiation-Induced Soft Error Rates of Advanced CMOS Bulk Devices

Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International In Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International (2006), pp. 217-225.

by N. Seifert, P. Slankard, M. Kirsch, et al.B. Narasimham, V. Zia, C. Brookreson, A. Vo, S. Mitra, B. Gill, J. Maiz

posted to importance--high ser shrinking trend by mrsmond on 2007-03-29 17:48:33 as

along with 1 person naoya

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jabref-file-import-09-05-08	272
fault-tolerance	31
ser	18
modeling	17
reliability	17
architecture	16
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toread	14
soft-errors	12
combinational-logic	12
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transient-faults	11
review	11
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proton	1

mrsmond's Vo:A [2 articles] Export

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