mrsmond's library 417 articles Export

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	Effect of Cosmic Rays on Computer Memories [My Copy] In Science, Vol. 206, No. 4420. (1979), pp. 776-788. by J. F. Ziegler, W. A. Lanford posted to engd evidence--interesting importance--high memory physics semiconductor soft-error by mrsmond on 2009-05-08 16:56:00 as
	Alpha-particle-induced soft errors in dynamic memories [My Copy] Electron Devices, IEEE Transactions on, Vol. 26, No. 1. (Jan 1979), pp. 2-9. by T. C. May, M. H. Woods posted to alpha-particles importance--seminal memory soft-errors by mrsmond on 2009-05-08 16:55:53 as
	Radiation-Induced Soft Error Rates of Advanced CMOS Bulk Devices [My Copy] Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International In Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International (2006), pp. 217-225. by N. Seifert, P. Slankard, M. Kirsch, et al.B. Narasimham, V. Zia, C. Brookreson, A. Vo, S. Mitra, B. Gill, J. Maiz posted to importance--high ser shrinking trend by mrsmond on 2007-03-29 17:48:33 as along with 1 person naoya
	Combating digital noise in high speed ULSI circuits using binary BCH encoding [My Copy] Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on, Vol. 4 (06 August 2002), pp. 13-16 vol.4. by D. Pamunuwa, Li-Rong Zheng, Hannu Tenhunen posted to interconnect error-correction by mrsmond on 2009-09-23 12:14:08 as
	Technology Scaling Trends and Accelerated Testing for Soft Errors in Commercial Silicon Devices [My Copy] IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International, Vol. 0 (2003), 4. by Robert Baumann posted to review shrinking silicon soft-errors testing trend by mrsmond on 2009-06-09 16:32:19 as
	Soft errors in advanced semiconductor devices-part I: the three radiation sources [My Copy] Device and Materials Reliability, IEEE Transactions on In Device and Materials Reliability, IEEE Transactions on, Vol. 1, No. 1. (2001), pp. 17-22. by R. C. Baumann posted to physics review semiconductor soft-errors by mrsmond on 2009-06-09 16:20:11 as
	Developments in the synthesis of reliable organisms from unreliable components [My Copy] Proceedings of Symposia in Pure Mathematics, Vol. 50 (1990), pp. 311-324. by N. Pippenger posted to engd importance-med maths reliability by mrsmond on 2009-05-08 16:55:55 as
	IBM Journal of Research and Development \| Vol. 52, No. 3, 2008 - Soft Errors in Circuits and Systems [My Copy] IBM Journal of Research and Development, Vol. 52, No. 3. (2008) posted to ser toread by mrsmond on 2008-12-15 16:58:14 as
	On the Unusual Effectiveness of Logic in Computer Science [My Copy] (2001) by Joseph Y. Halpern, Robert Harper, Neil Immerman, Phokion G. Kolaitis posted to computer-science formal-logic have-paper-copy not-related-to-engd by mrsmond on 2008-10-01 12:05:01 as
	Dilemmas in a General Theory of Planning [My Copy] Policy Sciences, Vol. 4 (1973), pp. 155-169. by Horst Rittel, Melvin Webber posted to design planning theory by mrsmond on 2008-06-19 11:17:21 as
	Modeling Soft Errors at Device and Logic Level for combinational circuits [My Copy] IEEE Transactions on Dependable and Secure Computing (September 2007) by Rajaraman Ramanarayanan, Vijay S. Degalahal, Ramakrishnan Krishnan, et al.Jungsub Kim, Vijaykrishnan Narayanan, Yuan Xie, Mary J. Irwin, Kenan Unlu posted to combinational-logic modeling ser by mrsmond on 2007-10-25 16:05:42 as
	Reliability modeling techniques for self-repairing computer systems [My Copy] In Proceedings of the 1969 24th national conference (1969), pp. 295-309. by W. G. Bouricius, W. C. Carter, P. R. Schneider posted to modeling reliability by mrsmond on 2007-06-25 12:07:06 as
	The Concept of Coverage and Its Effect on the Reliability Model of a Repairable System [My Copy] Transactions on Computers, Vol. C-22, No. 3. (1973), pp. 251-254. by T. F. Arnold posted to fault-tolerance modeling reliability by mrsmond on 2007-06-25 11:59:50 as
	Alpha-particle-induced soft errors in dynamic memories [My Copy] Electron Devices, IEEE Transactions on, Vol. 26, No. 1. (1979), pp. 2-9. by T. C. May, M. H. Woods posted to importance--high memory ser trend by mrsmond on 2007-03-26 14:55:17 as along with 2 people naoya qed2
	Can programming be liberated from the von Neumann style?: a functional style and its algebra of programs [My Copy] Commun. ACM, Vol. 21, No. 8. (August 1978), pp. 613-641. by John Backus posted to architecture computing-history cpu importance--seminal review by mrsmond on 2007-03-20 11:04:50 as along with 12 people brothers amp269 draganigajic pedagand egh creswick joost spl Guff32 mdekruijf artur bendiken
	Online reconfigurable self-timed links for fault tolerant NoC [My Copy] VLSI Design, Vol. 2007 (2007) by T. Lehtonen, P. Liljeberg, J. Plosila posted to fault-tolerance interconnect network-on-chip reliability by mrsmond on 2009-07-24 15:55:36 as
	Coding for system-on-chip networks: a unified framework [My Copy] Very Large Scale Integration (VLSI) Systems, IEEE Transactions on In Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, Vol. 13, No. 6. (2005), pp. 655-667. by S. R. Sridhara, N. R. Shanbhag posted to interconnect reliability by mrsmond on 2009-07-24 15:45:19 as
	Reflecting human values in the digital age [My Copy] Commun. ACM, Vol. 52, No. 3. (2009), pp. 58-66. by Abigail Sellen, Yvonne Rogers, Richard Harper, Tom Rodden posted to future hci not-related-to-engd by mrsmond on 2009-05-12 15:46:40 as along with 5 people tmar LinaMelo yenching lucybuykx now
	Reliability, Availability, and Serviceability of IBM Computer Systems: A Quarter Century of Progress [My Copy] IBM Journal of Research and Development, Vol. 25, No. 5. (1981), pp. 453-465. by M. Y. B. Hsiao, W. C. Carter, J. W. Thomas, W. R. Stringfellow posted to computer computer-history design engd ibm ras by mrsmond on 2009-05-08 16:55:50 as
	An axiomatic basis for computer programming [My Copy] Commun. ACM, Vol. 12, No. 10. (October 1969), pp. 576-580. by C. A. R. Hoare posted to computer-science theory by mrsmond on 2009-02-18 17:12:06 as along with 20 people and 6 groups thermostat bedieber cyph3r robertjohnsimmons hdeyoung mattmight ddemange michaelbanks jkominek leonardo rwtodd dsilva jff jbrown rgb calvins flavian_vasile _Anne_ bfraser zuleger ConcertRG Crypto GraphTheory pileWorks Foundations-of-Programming TMC
	Design and Evaluation of Hybrid Fault-Detection Systems [My Copy] In ISCA '05: Proceedings of the 32nd annual international symposium on Computer Architecture (2005), pp. 148-159. by George A. Reis, Jonathan Chang, Neil Vachharajani, Ram Rangan, David I. August, Shubhendu S. Mukherjee posted to fault-detection fault-tolerance transient-faults by mrsmond on 2009-01-29 17:28:40 as along with 1 person naoya
	Impact of Technology and Voltage Scaling on the Soft Error Susceptibility in Nanoscale CMOS [My Copy] Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on In Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on (2008), pp. 114-122. by Vikas Chandra, Robert Aitken posted to arm circuit-level modeling ser trend by mrsmond on 2008-11-20 12:35:57 as
	The Influence of Organizational Structure On Software Quality: An Empirical Case Study [My Copy] Microsoft Research Technical Publications (January 2008) by Nachiappan Nagappan, Brendan Murphy, Victor Basili posted to business management software by mrsmond on 2008-09-15 14:18:46 as
	Exploring the Duality between Product and Organizational Architectures: A Test of the Mirroring Hypothesis [My Copy] Harvard Business School Working Papers (March 2008) by Alan D. Maccormack, John Rusnak, Carliss Y. Baldwin posted to business have-electronic-copy management by mrsmond on 2008-09-15 14:11:05 as
	Steps toward artificial intelligence [My Copy] In Computers and Thought, Vol. 49 (1961), pp. 406-450. by Marvin Minsky posted to artificial-intelligence computing-history have-electronic-copy by mrsmond on 2008-09-12 12:51:31 as
	Copper metallization reliability [My Copy] Microelectronics Reliability, Vol. 39, No. 11. (November 1999), pp. 1595-1602. by J. R. Lloyd, J. Clemens, R. Snede posted to electromigration by mrsmond on 2008-08-05 16:22:00 as
	An efficient static algorithm for computing the soft error rates of combinational circuits [My Copy] In DATE '06: Proceedings of the conference on Design, automation and test in Europe (2006), pp. 164-169. by Rajeev R. Rao, Kaviraj Chopra, David Blaauw, Dennis Sylvester posted to combinational-logic modeling ser static by mrsmond on 2007-10-31 17:09:40 as
	Crosstalk- and SEU-Aware Networks on Chips [My Copy] IEEE Design & Test of Computers, Vol. 24, No. 04. (2007), pp. 340-350. by Arthur P. Frantz, Maico Cassel, Fernanda L. Kastensmidt, Érika Cota, Luigi Carro posted to crosstalk network-on-chip reliability seu by mrsmond on 2007-10-23 10:36:52 as
	Globally Asynchronous, Locally Synchronous Circuits: Overview and Outlook [My Copy] IEEE Design & Test of Computers, Vol. 24, No. 05. (2007), pp. 430-441. by Miloš Krsti, Eckhard Grass, Frank K. Gürkaynak, Pascal Vivet posted to gals review by mrsmond on 2007-10-23 10:18:00 as
	Impacts of front-end and middle-end process modifications on terrestrial soft error rate [My Copy] Device and Materials Reliability, IEEE Transactions on In Device and Materials Reliability, IEEE Transactions on, Vol. 5, No. 3. (2005), pp. 382-396. by P. Roche, G. Gasiot posted to manufacture-process neutron ser silicon-on-insulator toread by mrsmond on 2007-10-10 14:50:58 as
	Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration [My Copy] Solid-State Circuits, IEEE Journal of In Solid-State Circuits, IEEE Journal of, Vol. 37, No. 2. (2002), pp. 183-190. by K. A. Bowman, S. G. Duvall, J. D. Meindl posted to circuit have-paper-copy modeling shrinking trend variability by mrsmond on 2007-08-24 13:38:22 as
	Design and reliability challenges in nanometer technologies [My Copy] Design Automation Conference, 2004. Proceedings. 41st In Design Automation Conference, 2004. Proceedings. 41st (2004), pp. 75-75. by S. Borkar, T. Karnik, Vivek De posted to microarchitecture variability by mrsmond on 2007-08-24 12:07:41 as
	Load and logic co-optimization for design of soft-error resistant nanometer CMOS circuits [My Copy] On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International (2005), pp. 35-40. by Y. S. Dhillon, A. U. Diril, A. Chatterjee, C. Metra posted to combinational-logic energy-analysis fault-analysis fault-tolerance toread transient-faults by mrsmond on 2007-07-05 14:35:54 as
	Error correction in arithmetic operations by I/O inversion [My Copy] On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International (2006), 6 pp.. by P. Oikonomakos, P. Fox posted to architecture error-detection toread by mrsmond on 2007-07-05 11:22:15 as
	Soft error rates in deep-submicron CMOS technologies [My Copy] On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International (2006), 1 pp.. by T. Heijmen posted to ser toread trend by mrsmond on 2007-07-05 11:19:01 as along with 1 person Pepijn
	Real time fault injection using a modified debugging infrastructure [My Copy] On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International (2006), 6 pp.. by A. V. Fidalgo, G. R. Alves, J. M. Ferreira posted to debug fault-injection system-level toread by mrsmond on 2007-07-05 11:17:19 as along with 1 person network01
	Fault-robust microcontrollers for automotive applications [My Copy] On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International (2006), 6 pp.. by R. Mariani, P. Fuhrmann, B. Vittorelli posted to automotive fault-tolerance microcontroller system-level toread by mrsmond on 2007-07-05 11:13:00 as
	DMT and DT2: two fault-tolerant architectures developed by CNES for COTS-based spacecraft supercomputers [My Copy] On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International (2006), 10 pp.. by M. Pignol posted to aerospace fault-tolerance super-computing system-level toread by mrsmond on 2007-07-05 11:09:22 as
	Fault tolerant system design method based on self-checking circuits [My Copy] On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International (2006), 2 pp.. by P. Kubalik, P. Fiser, H. Kubatova posted to circuit fault-tolerance fpga self-checking system-level toread by mrsmond on 2007-07-05 11:00:37 as
	On-line fault detection and location for NoC interconnects [My Copy] On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International (2006), 6 pp.. by C. Grecu, A. Ivanov, R. Saleh, E. S. Sogomonyan, Partha P. Pande posted to fault-detection fault-tolerance network-on-chip on-chip-communication system-level toread by mrsmond on 2007-07-05 10:52:22 as
	An improved technique for reducing false alarms due to soft errors [My Copy] On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International (2006), 6 pp.. by S. Kundu, I. Polian posted to fault-tolerance system-level toread by mrsmond on 2007-07-05 10:39:32 as
	Trends and trade-offs in designing highly robust throughput on chip communication network [My Copy] On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International (2006), 1 pp.. by M. Coppola posted to on-chip-communication reliability system-level toread trend by mrsmond on 2007-07-05 10:27:58 as
	Prediction of transient induced by neutron/proton in CMOS combinational logic cells [My Copy] On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International (2006), 9 pp.. by G. Hubert, A. Bougerol, F. Miller, et al.N. Buard, L. Anghel, T. Carriere, F. Wrobel, R. Gaillard posted to combinational-logic fault-analysis neutron proton ser simulation transient-faults by mrsmond on 2007-07-04 14:04:42 as
	The effect of concrete shielding on cosmic ray induced soft fails in electronic systems [My Copy] Electron Devices, IEEE Transactions on, Vol. 28, No. 5. (1981), pp. 560-565. by J. F. Ziegler posted to importance--high ser trend by mrsmond on 2007-03-27 15:18:47 as
	Effect of Cosmic Rays on Computer Memories [My Copy] Science, Vol. 206, No. 4420. (16 November 1979), pp. 776-788. by J. F. Ziegler, W. A. Lanford posted to importance--high memory ser trend by mrsmond on 2007-03-26 15:21:00 as
	Dynamic Voltage Scaling with Links for Power Optimization of Interconnection Networks [My Copy] High-Performance Computer Architecture, International Symposium on In High-Performance Computer Architecture, 2003. HPCA-9 2003. Proceedings. The Ninth International Symposium on, Vol. 0 (2003), pp. 91-102. by Li Shang, Li S. Peh, Niraj K. Jha posted to interconnect energy-analysis dynamic-voltage-scaling by mrsmond on 2009-09-10 12:09:26 as along with 1 person dtsamis
	Modeling and Optimization for Soft-Error Reliability of Sequential Circuits [My Copy] Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on In Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, Vol. 27, No. 5. (2008), pp. 803-816. by N. Miskov-Zivanov, D. Marculescu posted to transient-faults soft-error simulation modeling by mrsmond on 2009-09-10 11:43:04 as
	What it's like to be a POPL referee [My Copy] SIGACT News, Vol. 17, No. 4. (1986), pp. 50-51. by M. N. Wegman posted to not-related-to-engd by mrsmond on 2009-09-10 11:36:08 as
	Scaling and soft errors: Moore of the same for SOI ? [My Copy] SOI Conference, 2008. SOI. IEEE International In SOI Conference, 2008. SOI. IEEE International (2008), pp. 129-130. by M. L. Alles, D. R. Ball, L. W. Massengill, R. D. Schrimpf, R. A. Reed, B. L. Bhuva posted to trend soi soft-error shrinking by mrsmond on 2009-09-10 10:44:58 as
	Toward achieving energy efficiency in presence of deep submicron noise [My Copy] Very Large Scale Integration (VLSI) Systems, IEEE Transactions on In Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, Vol. 8, No. 4. (2000), pp. 379-391. by R. Hegde, N. R. Shanbhag posted to energy-analysis error-correction fault-tolerance interconnect by mrsmond on 2009-07-24 16:01:27 as

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jabref-file-import-09-05-08	272
fault-tolerance	30
ser	18
modeling	17
reliability	17
architecture	16
trend	16
toread	14
combinational-logic	12
computer	11
review	11
engd	10
have-paper-copy	10
memory	10
randd-reading-group	10
seu	10
transient-faults	10
fault-analysis	9
not-related-to-engd	9
semiconductor	9
simulation	9
system-level	9
theory	9
variability	9
circuit-level	8
energy-analysis	8
fault-injection	8
importance--high	8
on-chip-communication	8
interconnect	7
physics	7
cpu	6
error-correction	6
pers-reading-group	6
soft-error	6
circuit	5
computing-history	5
design	5
dynamic-voltage-scaling	5
fault-avoidance	5
fault-detection	5
formal-methods	5
management	5
maths	5
microarchitecture	5
network-on-chip	5
shrinking	5
soft-errors	5
verification	5
amba	4
arm	4
error-detection	4
statistics	4
business	3
computer-science	3
importance--seminal	3
interesting-rating--1	3
interesting-rating--4	3
multiprocessor	3
neutron	3
razor	3
silicon	3
skim-read	3
aerospace	2
alpha-particles	2
dependability	2
design-for-test	2
experiment	2
formal-logic	2
for--nafe	2
fpga	2
graph-theory	2
have-electronic-copy	2
ibm	2
interesting-rating--3	2
off-chip-communication	2
security	2
self-checking	2
silicon-on-insulator	2
software	2
static	2
tutorial	2
ageing	1
artificial-intelligence	1
automata-theory	1
automotive	1
availability	1
benchmarking	1
combinatorial-logic	1
combinatorics	1
compiler	1
computer-history	1
crosstalk	1
debug	1
electromigration	1
error	1
esd	1
evidence--important	1
evidence--interesting	1
future	1
gals	1
government	1
hardware	1
hci	1
importance-med	1
innovation	1
interesting-rating--2	1
intermittent-faults	1
manufacture-process	1
marketing	1
microcontroller	1
nanotech	1
organisation	1
planning	1
prj--fabric-reliability	1
proton	1
quantum-computing	1
ras	1
redundancy	1
servers	1
software-level	1
soi	1
super-computing	1
survey	1
testing	1
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