mrsmond's circuit-level [8 articles] Export

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	Tunable Transient Filters for Soft Error Rate Reduction in Combinational Circuits [My Copy] European Test, 2008 13th In European Test, 2008 13th (2008), pp. 179-184. by Quming Zhou, M. R. Choudhury, K. Mohanram posted to circuit-level fault-avoidance seu by mrsmond on 2009-04-01 12:18:05 as along with 1 person cjhall
	Selective Hardening in Early Design Steps [My Copy] European Test, 2008 13th In European Test, 2008 13th (2008), pp. 185-190. by C. G. Zoellin, H. J. Wunderlich, I. Polian, B. Becker posted to circuit-level fault-avoidance seu by mrsmond on 2009-04-01 12:02:11 as
	Impact of Technology and Voltage Scaling on the Soft Error Susceptibility in Nanoscale CMOS [My Copy] Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on In Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on (2008), pp. 114-122. by Vikas Chandra, Robert Aitken posted to arm circuit-level modeling ser trend by mrsmond on 2008-11-20 12:35:57 as
	Tunable Transient Filters for Soft Error Rate Reduction in Combinational Circuits [My Copy] European Test Symposium, IEEE, Vol. 0 (2008), pp. 179-184. by Quming Zhou, Mihir R. Choudhury, Kartik Mohanram posted to circuit-level combinational-logic fault-avoidance transient-faults interesting-rating--2 by mrsmond on 2008-09-30 12:18:50 as
	Soft Error Mitigation Through Selective Addition of Functionally Redundant Wires [My Copy] Reliability, IEEE Transactions on In Reliability, IEEE Transactions on, Vol. 57, No. 1. (2008), pp. 23-31. by S. Almukhaizim, Y. Makris posted to circuit-level combinational-logic fault-injection ser seu by mrsmond on 2008-04-24 16:59:37 as
	Latch Susceptibility to Transient Faults and New Hardening Approach [My Copy] IEEE Transactions on Computers, Vol. 56, No. 09. (2007), pp. 1255-1268. by Martin Omaña, Daniele Rossi, Cecilia Metra posted to circuit-level fault-detection fault-tolerance transient-faults by mrsmond on 2007-11-01 11:57:16 as
	Parameter variations and impact on circuits and microarchitecture [My Copy] Design Automation Conference, 2003. Proceedings In Design Automation Conference, 2003. Proceedings (2003), pp. 338-342. by S. Borkar, T. Karnik, S. Narendra, J. Tschanz, A. Keshavarzi, V. De posted to circuit-level microarchitecture variability by mrsmond on 2007-08-24 13:34:28 as along with 1 person yushanchou
	On transistor level gate sizing for increased robustness to transient faults [My Copy] On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International (2005), pp. 23-28. by J. M. Cazeaux, D. Rossi, M. Omana, C. Metra, A. Chatterjee posted to circuit-level fault-avoidance transient-faults by mrsmond on 2007-07-05 11:29:06 as

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jabref-file-import-09-05-08	272
fault-tolerance	31
ser	18
modeling	17
reliability	17
architecture	16
trend	15
toread	14
combinational-logic	12
soft-errors	12
computer	11
review	11
transient-faults	11
engd	10
have-paper-copy	10
memory	10
randd-reading-group	10
seu	10
fault-analysis	9
fault-injection	9
not-related-to-engd	9
semiconductor	9
simulation	9
system-level	9
theory	9
variability	9
circuit-level	8
energy-analysis	8
on-chip-communication	8
importance--high	7
interconnect	7
physics	7
cpu	6
error-correction	6
fault-detection	6
microarchitecture	6
pers-reading-group	6
circuit	5
computing-history	5
design	5
dynamic-voltage-scaling	5
fault-avoidance	5
formal-methods	5
management	5
maths	5
network-on-chip	5
shrinking	5
verification	5
amba	4
arm	4
error-detection	4
importance--seminal	4
statistics	4
alpha-particles	3
business	3
computer-science	3
interesting-rating--1	3
interesting-rating--4	3
multiprocessor	3
neutron	3
razor	3
silicon	3
skim-read	3
aerospace	2
dependability	2
design-for-test	2
experiment	2
formal-logic	2
for--nafe	2
fpga	2
graph-theory	2
have-electronic-copy	2
ibm	2
interesting-rating--3	2
off-chip-communication	2
security	2
self-checking	2
silicon-on-insulator	2
software	2
static	2
tutorial	2
ageing	1
artificial-intelligence	1
automata-theory	1
automotive	1
availability	1
benchmarking	1
combinatorial-logic	1
combinatorics	1
compiler	1
computer-history	1
crosstalk	1
debug	1
electromigration	1
error	1
esd	1
evidence--important	1
evidence--interesting	1
future	1
gals	1
government	1
hardware	1
hci	1
importance-med	1
innovation	1
interesting-rating--2	1
intermittent-faults	1
manufacture-process	1
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microcontroller	1
nanotech	1
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proton	1
quantum-computing	1
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mrsmond's circuit-level [8 articles] Export

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