mrsmond's modeling [17 articles] Export

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	Modeling and Optimization for Soft-Error Reliability of Sequential Circuits [My Copy] Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on In Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, Vol. 27, No. 5. (2008), pp. 803-816. by N. Miskov-Zivanov, D. Marculescu posted to soft-errors transient-faults simulation modeling by mrsmond on 2009-09-10 11:43:04 as
	Soft Error Characterization and Modeling Methodologies at TI: Past, Present, and Future [My Copy] (October 2000) by R. Baumann posted to modeling physics semiconductor soft-errors tutorial by mrsmond on 2009-06-09 16:26:44 as
	Modeling diffusion and collection of charge from ionizing radiation in silicon devices [My Copy] Electron Devices, IEEE Transactions on, Vol. 26, No. 11. (Nov 1979), pp. 1742-1753. by S. Kirkpatrick posted to soft-errors modeling physics semiconductor silicon by mrsmond on 2009-05-08 16:55:51 as
	Reliability modeling techniques for self-repairing computer systems [My Copy] In Proceedings of the 1969 24th national conference (1969), pp. 295-309. by W. G. Bouricius, W. C. Carter, P. R. Schneider posted to maths modeling reliability skim-read statistics theory by mrsmond on 2009-05-08 16:55:46 as
	The Concept of Coverage and Its Effect on the Reliability Model of a Repairable System [My Copy] Computers, IEEE Transactions on, Vol. C-22, No. 3. (March 1973), pp. 251-254. by T. F. Arnold posted to maths modeling skim-read theory by mrsmond on 2009-05-08 16:55:43 as
	Impact of Technology and Voltage Scaling on the Soft Error Susceptibility in Nanoscale CMOS [My Copy] Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on In Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on (2008), pp. 114-122. by Vikas Chandra, Robert Aitken posted to arm circuit-level modeling ser trend by mrsmond on 2008-11-20 12:35:57 as
	Verification of AMBA Using a Combination of Model Checking and Theorem Proving [My Copy] In International Workshop on Automated Verification of Critical Systems (2005) by Hasan Amjad posted to amba formal-methods modeling on-chip-communication verification by mrsmond on 2008-02-08 15:04:43 as
	A stimulus-free probabilistic model for single-event-upset sensitivity [My Copy] VLSI Design, 2006. Held jointly with 5th International Conference on Embedded Systems and Design., 19th International Conference on In VLSI Design, 2006. Held jointly with 5th International Conference on Embedded Systems and Design., 19th International Conference on (2006), 8 pp.. by Thara Rejimon, Sanjukta Bhanja posted to modeling ser seu static by mrsmond on 2007-10-31 17:12:37 as
	An efficient static algorithm for computing the soft error rates of combinational circuits [My Copy] In DATE '06: Proceedings of the conference on Design, automation and test in Europe (2006), pp. 164-169. by Rajeev R. Rao, Kaviraj Chopra, David Blaauw, Dennis Sylvester posted to combinational-logic modeling ser static by mrsmond on 2007-10-31 17:09:40 as
	On latching probability of particle induced transients in combinational networks [My Copy] Fault-Tolerant Computing, 1994. FTCS-24. Digest of Papers., Twenty-Fourth International Symposium on In Fault-Tolerant Computing, 1994. FTCS-24. Digest of Papers., Twenty-Fourth International Symposium on (1994), pp. 340-349. by P. Liden, P. Dahlgren, R. Johansson, J. Karlsson posted to combinational-logic modeling seu by mrsmond on 2007-10-25 16:27:21 as
	Modeling Soft Errors at Device and Logic Level for combinational circuits [My Copy] IEEE Transactions on Dependable and Secure Computing (September 2007) by Rajaraman Ramanarayanan, Vijay S. Degalahal, Ramakrishnan Krishnan, et al.Jungsub Kim, Vijaykrishnan Narayanan, Yuan Xie, Mary J. Irwin, Kenan Unlu posted to combinational-logic modeling ser by mrsmond on 2007-10-25 16:05:42 as
	Variability and energy awareness: a microarchitecture-level perspective [My Copy] Design Automation Conference, 2005. Proceedings. 42nd In Design Automation Conference, 2005. Proceedings. 42nd (2005), pp. 11-16. by D. Marculescu, E. Talpes posted to circuit energy-analysis have-paper-copy modeling variability by mrsmond on 2007-08-24 13:47:46 as
	Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration [My Copy] Solid-State Circuits, IEEE Journal of In Solid-State Circuits, IEEE Journal of, Vol. 37, No. 2. (2002), pp. 183-190. by K. A. Bowman, S. G. Duvall, J. D. Meindl posted to circuit have-paper-copy modeling shrinking trend variability by mrsmond on 2007-08-24 13:38:22 as
	A model for transient fault propagation in combinatorial logic [My Copy] On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE (2003), pp. 111-115. by M. Omana, G. Papasso, D. Rossi, C. Metra posted to combinational-logic fault-analysis modeling simulation by mrsmond on 2007-06-27 12:13:07 as
	Reliability modeling techniques for self-repairing computer systems [My Copy] In Proceedings of the 1969 24th national conference (1969), pp. 295-309. by W. G. Bouricius, W. C. Carter, P. R. Schneider posted to modeling reliability by mrsmond on 2007-06-25 12:07:06 as
	The Concept of Coverage and Its Effect on the Reliability Model of a Repairable System [My Copy] Transactions on Computers, Vol. C-22, No. 3. (1973), pp. 251-254. by T. F. Arnold posted to fault-tolerance modeling reliability by mrsmond on 2007-06-25 11:59:50 as
	Probabilistic maximum error modeling for unreliable logic circuits [My Copy] In GLSVLSI '07: Proceedings of the 17th great lakes symposium on Great lakes symposium on VLSI (2007), pp. 223-226. by Karthikeyan Lingasubramanian, Sanjukta Bhanja posted to error modeling reliability by mrsmond on 2007-06-18 17:44:55 as

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jabref-file-import-09-05-08	272
fault-tolerance	31
ser	18
modeling	17
reliability	17
architecture	16
trend	15
toread	14
combinational-logic	12
soft-errors	12
computer	11
review	11
transient-faults	11
engd	10
have-paper-copy	10
memory	10
randd-reading-group	10
seu	10
fault-analysis	9
fault-injection	9
not-related-to-engd	9
semiconductor	9
simulation	9
system-level	9
theory	9
variability	9
circuit-level	8
energy-analysis	8
on-chip-communication	8
importance--high	7
interconnect	7
physics	7
cpu	6
error-correction	6
fault-detection	6
microarchitecture	6
pers-reading-group	6
circuit	5
computing-history	5
design	5
dynamic-voltage-scaling	5
fault-avoidance	5
formal-methods	5
management	5
maths	5
network-on-chip	5
shrinking	5
verification	5
amba	4
arm	4
error-detection	4
importance--seminal	4
statistics	4
alpha-particles	3
business	3
computer-science	3
interesting-rating--1	3
interesting-rating--4	3
multiprocessor	3
neutron	3
razor	3
silicon	3
skim-read	3
aerospace	2
dependability	2
design-for-test	2
experiment	2
formal-logic	2
for--nafe	2
fpga	2
graph-theory	2
have-electronic-copy	2
ibm	2
interesting-rating--3	2
off-chip-communication	2
security	2
self-checking	2
silicon-on-insulator	2
software	2
static	2
tutorial	2
ageing	1
artificial-intelligence	1
automata-theory	1
automotive	1
availability	1
benchmarking	1
combinatorial-logic	1
combinatorics	1
compiler	1
computer-history	1
crosstalk	1
debug	1
electromigration	1
error	1
esd	1
evidence--important	1
evidence--interesting	1
future	1
gals	1
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hardware	1
hci	1
importance-med	1
innovation	1
interesting-rating--2	1
intermittent-faults	1
manufacture-process	1
marketing	1
microcontroller	1
nanotech	1
organisation	1
planning	1
prj--fabric-reliability	1
proton	1
quantum-computing	1
ras	1
redundancy	1
servers	1
software-level	1
soi	1
super-computing	1
survey	1
testing	1
testtag	1

mrsmond's modeling [17 articles] Export

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