mrsmond's seu [10 articles] Export

Recent papers added to mrsmond's library classified by the tag seu. You can also see everyone's seu.

	Single event upset at ground level [My Copy] Nuclear Science, IEEE Transactions on In Nuclear Science, IEEE Transactions on, Vol. 43, No. 6. (1996), pp. 2742-2750. by E. Normand posted to engd evidence--important experiment memory neutron seu by mrsmond on 2009-06-09 12:14:31 as along with 1 person naoya
	Convolutional Coding for SEU mitigation [My Copy] European Test, 2008 13th In European Test, 2008 13th (2008), pp. 191-196. by L. Frigerio, M. A. Radaelli, F. Salice posted to error-correction memory seu by mrsmond on 2009-04-01 12:24:43 as
	Tunable Transient Filters for Soft Error Rate Reduction in Combinational Circuits [My Copy] European Test, 2008 13th In European Test, 2008 13th (2008), pp. 179-184. by Quming Zhou, M. R. Choudhury, K. Mohanram posted to circuit-level fault-avoidance seu by mrsmond on 2009-04-01 12:18:05 as along with 1 person cjhall
	Selective Hardening in Early Design Steps [My Copy] European Test, 2008 13th In European Test, 2008 13th (2008), pp. 185-190. by C. G. Zoellin, H. J. Wunderlich, I. Polian, B. Becker posted to circuit-level fault-avoidance seu by mrsmond on 2009-04-01 12:02:11 as
	Convolutional Coding for SEU mitigation [My Copy] European Test Symposium, IEEE, Vol. 0 (2008), pp. 191-196. by Laura Frigerio, Matteo A. Radaelli, Fabio Salice posted to error-correction memory seu interesting-rating--1 by mrsmond on 2008-09-30 14:09:48 as
	Soft Error Mitigation Through Selective Addition of Functionally Redundant Wires [My Copy] Reliability, IEEE Transactions on In Reliability, IEEE Transactions on, Vol. 57, No. 1. (2008), pp. 23-31. by S. Almukhaizim, Y. Makris posted to circuit-level combinational-logic fault-injection ser seu by mrsmond on 2008-04-24 16:59:37 as
	A stimulus-free probabilistic model for single-event-upset sensitivity [My Copy] VLSI Design, 2006. Held jointly with 5th International Conference on Embedded Systems and Design., 19th International Conference on In VLSI Design, 2006. Held jointly with 5th International Conference on Embedded Systems and Design., 19th International Conference on (2006), 8 pp.. by Thara Rejimon, Sanjukta Bhanja posted to modeling ser seu static by mrsmond on 2007-10-31 17:12:37 as
	Single event upset in avionics [My Copy] Nuclear Science, IEEE Transactions on In Nuclear Science, IEEE Transactions on, Vol. 40, No. 2. (1993), pp. 120-126. by A. Taber, E. Normand posted to aerospace experiment seu by mrsmond on 2007-10-26 10:59:45 as
	On latching probability of particle induced transients in combinational networks [My Copy] Fault-Tolerant Computing, 1994. FTCS-24. Digest of Papers., Twenty-Fourth International Symposium on In Fault-Tolerant Computing, 1994. FTCS-24. Digest of Papers., Twenty-Fourth International Symposium on (1994), pp. 340-349. by P. Liden, P. Dahlgren, R. Johansson, J. Karlsson posted to combinational-logic modeling seu by mrsmond on 2007-10-25 16:27:21 as
	Crosstalk- and SEU-Aware Networks on Chips [My Copy] IEEE Design & Test of Computers, Vol. 24, No. 04. (2007), pp. 340-350. by Arthur P. Frantz, Maico Cassel, Fernanda L. Kastensmidt, Érika Cota, Luigi Carro posted to crosstalk network-on-chip reliability seu by mrsmond on 2007-10-23 10:36:52 as

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jabref-file-import-09-05-08	272
fault-tolerance	31
ser	18
modeling	17
reliability	17
architecture	16
trend	15
toread	14
combinational-logic	12
soft-errors	12
computer	11
review	11
transient-faults	11
engd	10
have-paper-copy	10
memory	10
randd-reading-group	10
seu	10
fault-analysis	9
fault-injection	9
not-related-to-engd	9
semiconductor	9
simulation	9
system-level	9
theory	9
variability	9
circuit-level	8
energy-analysis	8
on-chip-communication	8
importance--high	7
interconnect	7
physics	7
cpu	6
error-correction	6
fault-detection	6
microarchitecture	6
pers-reading-group	6
circuit	5
computing-history	5
design	5
dynamic-voltage-scaling	5
fault-avoidance	5
formal-methods	5
management	5
maths	5
network-on-chip	5
shrinking	5
verification	5
amba	4
arm	4
error-detection	4
importance--seminal	4
statistics	4
alpha-particles	3
business	3
computer-science	3
interesting-rating--1	3
interesting-rating--4	3
multiprocessor	3
neutron	3
razor	3
silicon	3
skim-read	3
aerospace	2
dependability	2
design-for-test	2
experiment	2
formal-logic	2
for--nafe	2
fpga	2
graph-theory	2
have-electronic-copy	2
ibm	2
interesting-rating--3	2
off-chip-communication	2
security	2
self-checking	2
silicon-on-insulator	2
software	2
static	2
tutorial	2
ageing	1
artificial-intelligence	1
automata-theory	1
automotive	1
availability	1
benchmarking	1
combinatorial-logic	1
combinatorics	1
compiler	1
computer-history	1
crosstalk	1
debug	1
electromigration	1
error	1
esd	1
evidence--important	1
evidence--interesting	1
future	1
gals	1
government	1
hardware	1
hci	1
importance-med	1
innovation	1
interesting-rating--2	1
intermittent-faults	1
manufacture-process	1
marketing	1
microcontroller	1
nanotech	1
organisation	1
planning	1
prj--fabric-reliability	1
proton	1
quantum-computing	1
ras	1
redundancy	1
servers	1
software-level	1
soi	1
super-computing	1
survey	1
testing	1
testtag	1

mrsmond's seu [10 articles] Export

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