mrsmond's shrinking [5 articles] Export

Recent papers added to mrsmond's library classified by the tag shrinking. You can also see everyone's shrinking.

	Scaling and soft errors: Moore of the same for SOI ? [My Copy] SOI Conference, 2008. SOI. IEEE International In SOI Conference, 2008. SOI. IEEE International (2008), pp. 129-130. by M. L. Alles, D. R. Ball, L. W. Massengill, R. D. Schrimpf, R. A. Reed, B. L. Bhuva posted to soft-errors trend soi shrinking by mrsmond on 2009-09-10 10:44:58 as
	Technology Scaling Trends and Accelerated Testing for Soft Errors in Commercial Silicon Devices [My Copy] IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International, Vol. 0 (2003), 4. by Robert Baumann posted to review shrinking silicon soft-errors testing trend by mrsmond on 2009-06-09 16:32:19 as
	Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration [My Copy] Solid-State Circuits, IEEE Journal of In Solid-State Circuits, IEEE Journal of, Vol. 37, No. 2. (2002), pp. 183-190. by K. A. Bowman, S. G. Duvall, J. D. Meindl posted to circuit have-paper-copy modeling shrinking trend variability by mrsmond on 2007-08-24 13:38:22 as
	Radiation-Induced Soft Error Rates of Advanced CMOS Bulk Devices [My Copy] Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International In Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International (2006), pp. 217-225. by N. Seifert, P. Slankard, M. Kirsch, et al.B. Narasimham, V. Zia, C. Brookreson, A. Vo, S. Mitra, B. Gill, J. Maiz posted to importance--high ser shrinking trend by mrsmond on 2007-03-29 17:48:33 as along with 1 person naoya
	Modeling the effect of technology trends on the soft error rate of combinational logic [My Copy] Dependable Systems and Networks, 2002. Proceedings. International Conference on (2002), pp. 389-398. by P. Shivakumar, M. Kistler, S. W. Keckler, D. Burger, L. Alvisi posted to combinational-logic importance--high ser shrinking trend by mrsmond on 2006-10-16 16:15:49 as

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jabref-file-import-09-05-08	272
fault-tolerance	31
ser	18
modeling	17
reliability	17
architecture	16
trend	15
toread	14
soft-errors	12
combinational-logic	12
computer	11
transient-faults	11
review	11
have-paper-copy	10
randd-reading-group	10
engd	10
seu	10
memory	10
fault-analysis	9
fault-injection	9
simulation	9
theory	9
system-level	9
not-related-to-engd	9
variability	9
semiconductor	9
on-chip-communication	8
energy-analysis	8
circuit-level	8
physics	7
importance--high	7
interconnect	7
error-correction	6
cpu	6
fault-detection	6
microarchitecture	6
pers-reading-group	6
management	5
circuit	5
fault-avoidance	5
network-on-chip	5
dynamic-voltage-scaling	5
maths	5
design	5
verification	5
shrinking	5
formal-methods	5
computing-history	5
arm	4
importance--seminal	4
error-detection	4
amba	4
statistics	4
razor	3
interesting-rating--4	3
alpha-particles	3
business	3
computer-science	3
neutron	3
silicon	3
skim-read	3
interesting-rating--1	3
multiprocessor	3
self-checking	2
interesting-rating--3	2
formal-logic	2
have-electronic-copy	2
dependability	2
silicon-on-insulator	2
graph-theory	2
aerospace	2
software	2
for--nafe	2
off-chip-communication	2
fpga	2
experiment	2
security	2
tutorial	2
static	2
design-for-test	2
ibm	2
hardware	1
redundancy	1
nanotech	1
crosstalk	1
servers	1
debug	1
prj--fabric-reliability	1
survey	1
gals	1
benchmarking	1
error	1
interesting-rating--2	1
ageing	1
artificial-intelligence	1
marketing	1
software-level	1
quantum-computing	1
compiler	1
soi	1
electromigration	1
organisation	1
combinatorial-logic	1
super-computing	1
importance-med	1
computer-history	1
government	1
future	1
planning	1
availability	1
evidence--interesting	1
testtag	1
manufacture-process	1
esd	1
ras	1
evidence--important	1
hci	1
intermittent-faults	1
automata-theory	1
automotive	1
innovation	1
testing	1
combinatorics	1
microcontroller	1
proton	1

mrsmond's shrinking [5 articles] Export

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