mrsmond's trend [15 articles] Export

Recent papers added to mrsmond's library classified by the tag trend. You can also see everyone's trend.

	Scaling and soft errors: Moore of the same for SOI ? [My Copy] SOI Conference, 2008. SOI. IEEE International In SOI Conference, 2008. SOI. IEEE International (2008), pp. 129-130. by M. L. Alles, D. R. Ball, L. W. Massengill, R. D. Schrimpf, R. A. Reed, B. L. Bhuva posted to soft-errors trend soi shrinking by mrsmond on 2009-09-10 10:44:58 as
	Technology Scaling Trends and Accelerated Testing for Soft Errors in Commercial Silicon Devices [My Copy] IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International, Vol. 0 (2003), 4. by Robert Baumann posted to review shrinking silicon soft-errors testing trend by mrsmond on 2009-06-09 16:32:19 as
	Impact of Technology and Voltage Scaling on the Soft Error Susceptibility in Nanoscale CMOS [My Copy] Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on In Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on (2008), pp. 114-122. by Vikas Chandra, Robert Aitken posted to arm circuit-level modeling ser trend by mrsmond on 2008-11-20 12:35:57 as
	Challenges and Solutions for Late- and Post-Silicon Design [My Copy] IEEE Design and Test of Computers, Vol. 25, No. 4. (2008), pp. 296-302. by Jan M. Rabaey, Sharad Malik posted to review semiconductor silicon trend by mrsmond on 2008-08-06 12:12:43 as
	Calculation of the soft error rate of submicron CMOS logic circuits [My Copy] Solid-State Circuits, IEEE Journal of In Solid-State Circuits, IEEE Journal of, Vol. 30, No. 7. (1995), pp. 830-834. by T. Juhnke, H. Klar posted to circuit ser simulation trend by mrsmond on 2007-10-25 16:32:42 as
	Analysis of single-event effects in combinational logic-simulation of the AM2901 bitslice processor [My Copy] Nuclear Science, IEEE Transactions on In Nuclear Science, IEEE Transactions on, Vol. 47, No. 6. (2000), pp. 2609-2615. by L. W. Massengill, A. E. Baranski, D. O. Van Nort, J. Meng, B. L. Bhuva posted to combinational-logic fault-analysis fault-injection ser simulation trend by mrsmond on 2007-10-25 16:30:05 as
	Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration [My Copy] Solid-State Circuits, IEEE Journal of In Solid-State Circuits, IEEE Journal of, Vol. 37, No. 2. (2002), pp. 183-190. by K. A. Bowman, S. G. Duvall, J. D. Meindl posted to circuit have-paper-copy modeling shrinking trend variability by mrsmond on 2007-08-24 13:38:22 as
	Analytical semi-empirical model for SER sensitivity estimation of deep-submicron CMOS circuits [My Copy] On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International (2005), pp. 3-8. by T. Heijmen posted to ser simulation theory trend by mrsmond on 2007-07-05 11:24:41 as
	Soft error rates in deep-submicron CMOS technologies [My Copy] On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International (2006), 1 pp.. by T. Heijmen posted to ser toread trend by mrsmond on 2007-07-05 11:19:01 as along with 1 person Pepijn
	Trends and trade-offs in designing highly robust throughput on chip communication network [My Copy] On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International (2006), 1 pp.. by M. Coppola posted to on-chip-communication reliability system-level toread trend by mrsmond on 2007-07-05 10:27:58 as
	Moore's law: past, present and future [My Copy] Spectrum, IEEE, Vol. 34, No. 6. (1997), pp. 52-59. by R. R. Schaller posted to computing-history pers-reading-group trend by mrsmond on 2007-04-13 15:00:28 as
	Radiation-Induced Soft Error Rates of Advanced CMOS Bulk Devices [My Copy] Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International In Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International (2006), pp. 217-225. by N. Seifert, P. Slankard, M. Kirsch, et al.B. Narasimham, V. Zia, C. Brookreson, A. Vo, S. Mitra, B. Gill, J. Maiz posted to importance--high ser shrinking trend by mrsmond on 2007-03-29 17:48:33 as along with 1 person naoya
	The effect of concrete shielding on cosmic ray induced soft fails in electronic systems [My Copy] Electron Devices, IEEE Transactions on, Vol. 28, No. 5. (1981), pp. 560-565. by J. F. Ziegler posted to importance--high ser trend by mrsmond on 2007-03-27 15:18:47 as
	Effect of Cosmic Rays on Computer Memories [My Copy] Science, Vol. 206, No. 4420. (16 November 1979), pp. 776-788. by J. F. Ziegler, W. A. Lanford posted to importance--high memory ser trend by mrsmond on 2007-03-26 15:21:00 as
	Modeling the effect of technology trends on the soft error rate of combinational logic [My Copy] Dependable Systems and Networks, 2002. Proceedings. International Conference on (2002), pp. 389-398. by P. Shivakumar, M. Kistler, S. W. Keckler, D. Burger, L. Alvisi posted to combinational-logic importance--high ser shrinking trend by mrsmond on 2006-10-16 16:15:49 as

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jabref-file-import-09-05-08	272
fault-tolerance	31
ser	18
modeling	17
reliability	17
architecture	16
trend	15
toread	14
combinational-logic	12
soft-errors	12
computer	11
review	11
transient-faults	11
engd	10
have-paper-copy	10
memory	10
randd-reading-group	10
seu	10
fault-analysis	9
fault-injection	9
not-related-to-engd	9
semiconductor	9
simulation	9
system-level	9
theory	9
variability	9
circuit-level	8
energy-analysis	8
on-chip-communication	8
importance--high	7
interconnect	7
physics	7
cpu	6
error-correction	6
fault-detection	6
microarchitecture	6
pers-reading-group	6
circuit	5
computing-history	5
design	5
dynamic-voltage-scaling	5
fault-avoidance	5
formal-methods	5
management	5
maths	5
network-on-chip	5
shrinking	5
verification	5
amba	4
arm	4
error-detection	4
importance--seminal	4
statistics	4
alpha-particles	3
business	3
computer-science	3
interesting-rating--1	3
interesting-rating--4	3
multiprocessor	3
neutron	3
razor	3
silicon	3
skim-read	3
aerospace	2
dependability	2
design-for-test	2
experiment	2
formal-logic	2
for--nafe	2
fpga	2
graph-theory	2
have-electronic-copy	2
ibm	2
interesting-rating--3	2
off-chip-communication	2
security	2
self-checking	2
silicon-on-insulator	2
software	2
static	2
tutorial	2
ageing	1
artificial-intelligence	1
automata-theory	1
automotive	1
availability	1
benchmarking	1
combinatorial-logic	1
combinatorics	1
compiler	1
computer-history	1
crosstalk	1
debug	1
electromigration	1
error	1
esd	1
evidence--important	1
evidence--interesting	1
future	1
gals	1
government	1
hardware	1
hci	1
importance-med	1
innovation	1
interesting-rating--2	1
intermittent-faults	1
manufacture-process	1
marketing	1
microcontroller	1
nanotech	1
organisation	1
planning	1
prj--fabric-reliability	1
proton	1
quantum-computing	1
ras	1
redundancy	1
servers	1
software-level	1
soi	1
super-computing	1
survey	1
testing	1
testtag	1

mrsmond's trend [15 articles] Export

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