mrsmond's variability [9 articles] Export

Recent papers added to mrsmond's library classified by the tag variability. You can also see everyone's variability.

	Designing reliable systems from unreliable components: the challenges of transistor variability and degradation [My Copy] Micro, IEEE In Micro, IEEE, Vol. 25, No. 6. (2005), pp. 10-16. by S. Borkar posted to ageing reliability soft-errors variability by mrsmond on 2009-07-24 15:31:03 as along with 3 people naoya elsantosneto ahgharaibeh
	A robust self-calibrating transmission scheme for on-chip networks [My Copy] Very Large Scale Integration (VLSI) Systems, IEEE Transactions on In Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, Vol. 13, No. 1. (2005), pp. 126-139. by F. Worm, P. Ienne, P. Thiran, G. De Micheli posted to dynamic-voltage-scaling energy-analysis on-chip-communication self-checking variability by mrsmond on 2008-04-04 14:38:03 as
	Making typical silicon matter with Razor [My Copy] Computer In Computer, Vol. 37, No. 3. (2004), pp. 57-65. by T. Austin, D. Blaauw, T. Mudge, K. Flautner posted to dynamic-voltage-scaling energy-analysis error-detection have-paper-copy razor variability by mrsmond on 2008-04-04 14:31:54 as
	DVS for on-chip bus designs based on timing error correction [My Copy] Design, Automation and Test in Europe, 2005. Proceedings In Design, Automation and Test in Europe, 2005. Proceedings (2005), pp. 80-85 Vol. 1. by H. Kaul, D. Sylvester, D. Blaauw, T. Mudge, T. Austin posted to dynamic-voltage-scaling have-paper-copy on-chip-communication razor variability by mrsmond on 2008-04-04 14:29:30 as
	Variability and energy awareness: a microarchitecture-level perspective [My Copy] Design Automation Conference, 2005. Proceedings. 42nd In Design Automation Conference, 2005. Proceedings. 42nd (2005), pp. 11-16. by D. Marculescu, E. Talpes posted to circuit energy-analysis have-paper-copy modeling variability by mrsmond on 2007-08-24 13:47:46 as
	Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration [My Copy] Solid-State Circuits, IEEE Journal of In Solid-State Circuits, IEEE Journal of, Vol. 37, No. 2. (2002), pp. 183-190. by K. A. Bowman, S. G. Duvall, J. D. Meindl posted to circuit have-paper-copy modeling shrinking trend variability by mrsmond on 2007-08-24 13:38:22 as
	Parameter variations and impact on circuits and microarchitecture [My Copy] Design Automation Conference, 2003. Proceedings In Design Automation Conference, 2003. Proceedings (2003), pp. 338-342. by S. Borkar, T. Karnik, S. Narendra, J. Tschanz, A. Keshavarzi, V. De posted to circuit-level microarchitecture variability by mrsmond on 2007-08-24 13:34:28 as along with 1 person yushanchou
	Design and reliability challenges in nanometer technologies [My Copy] Design Automation Conference, 2004. Proceedings. 41st In Design Automation Conference, 2004. Proceedings. 41st (2004), pp. 75-75. by S. Borkar, T. Karnik, Vivek De posted to microarchitecture variability by mrsmond on 2007-08-24 12:07:41 as
	Impact of Parameter Variations on Circuits and Microarchitecture [My Copy] IEEE Micro, Vol. 26, No. 6. (2006), pp. 30-39. by Osman S. Unsal, James W. Tschanz, Keith Bowman, et al.Vivek De, Xavier Vera, Antonio Gonzalez, Oguz Ergin posted to architecture circuit randd-reading-group survey variability by mrsmond on 2007-03-12 15:55:43 as

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jabref-file-import-09-05-08	272
fault-tolerance	31
ser	18
modeling	17
reliability	17
architecture	16
trend	15
toread	14
combinational-logic	12
soft-errors	12
computer	11
review	11
transient-faults	11
engd	10
have-paper-copy	10
memory	10
randd-reading-group	10
seu	10
fault-analysis	9
fault-injection	9
not-related-to-engd	9
semiconductor	9
simulation	9
system-level	9
theory	9
variability	9
circuit-level	8
energy-analysis	8
on-chip-communication	8
importance--high	7
interconnect	7
physics	7
cpu	6
error-correction	6
fault-detection	6
microarchitecture	6
pers-reading-group	6
circuit	5
computing-history	5
design	5
dynamic-voltage-scaling	5
fault-avoidance	5
formal-methods	5
management	5
maths	5
network-on-chip	5
shrinking	5
verification	5
amba	4
arm	4
error-detection	4
importance--seminal	4
statistics	4
alpha-particles	3
business	3
computer-science	3
interesting-rating--1	3
interesting-rating--4	3
multiprocessor	3
neutron	3
razor	3
silicon	3
skim-read	3
aerospace	2
dependability	2
design-for-test	2
experiment	2
formal-logic	2
for--nafe	2
fpga	2
graph-theory	2
have-electronic-copy	2
ibm	2
interesting-rating--3	2
off-chip-communication	2
security	2
self-checking	2
silicon-on-insulator	2
software	2
static	2
tutorial	2
ageing	1
artificial-intelligence	1
automata-theory	1
automotive	1
availability	1
benchmarking	1
combinatorial-logic	1
combinatorics	1
compiler	1
computer-history	1
crosstalk	1
debug	1
electromigration	1
error	1
esd	1
evidence--important	1
evidence--interesting	1
future	1
gals	1
government	1
hardware	1
hci	1
importance-med	1
innovation	1
interesting-rating--2	1
intermittent-faults	1
manufacture-process	1
marketing	1
microcontroller	1
nanotech	1
organisation	1
planning	1
prj--fabric-reliability	1
proton	1
quantum-computing	1
ras	1
redundancy	1
servers	1
software-level	1
soi	1
super-computing	1
survey	1
testing	1
testtag	1

mrsmond's variability [9 articles] Export

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