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Opt. Express, Vol. 19, No. 18. (29 August 2011), pp. 17226-17231, doi:10.1364/oe.19.017226 Key: citeulike:11593574
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We show that reflectivity measurements enable the determination of the thickness of multilayered graphene on a metal substrate. The developed technique is based on comparison of the substrate reflectance with and without graphene and relies on the strong absorbance of graphene and high refractive index contrast. We demonstrate the technique by measuring the thickness of the CVD graphene film grown on a copper substrate.
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